Труды сотрудников ИЛ им. В.Н. Сукачева СО РАН

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    Small fluctuations in cell wall thickness in pine and spruce xylem: Signal from cambium?
/ E. A. Vaganov, E. A. Babushkina, L. V. Belokopytova, D. F. Zhirnova // PLoS One. - 2020. - Vol. 15, Is. 5. - Ст. e0233106, DOI 10.1371/journal.pone.0233106. - Cited References:65. - This work was supported by the statutory activity of the Siberian Federal University and by the Russian Foundation for Basic Research (project no. 19-04-00274 A). The funders had no role in study design, data collection and analysis, decision to publish, or preparation of the manuscript. There was no additional external funding received for this study. . - ISSN 1932-6203
РУБ Multidisciplinary Sciences

Аннотация: In the conifer tree rings, each tracheid goes through three phases of differentiation before becoming an element of the stem water-conducting structure: division, extension, and cell wall thickening. These phases are long-lasting and separated temporally, especially cell wall thickening. Despite the numerous lines of evidence that external conditions affect the rate of growth processes and the final anatomical dimensions during the respective phases of tracheid differentiation, the influence of the environment on anatomical dimensions during the cell division phase (cambial activity) has not yet been experimentally confirmed. In this communication, we provide indirect evidence of such an effect through observations of the small fluctuations in the latewood cell wall thickness of rapidly growing tree rings, which exhibit a high cell production rate (more than 0.4 cells per day on average). Such small fluctuations in the cell wall thickness cannot be driven by variations in external factors during the secondary wall deposition phase, since this phase overlaps for several tens of latewood cells in the rings of fast-growing trees due to its long duration.

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Держатели документа:
Siberian Fed Univ, Krasnoyarsk, Russia.
Russian Acad Sci, Siberian Branch, Sukachev Inst Forest, Krasnoyarsk, Russia.
Siberian Fed Univ, Khakass Tech Inst, Abakan, Russia.

Доп.точки доступа:
Vaganov, Eugene A.; Babushkina, Elena A.; Belokopytova, Liliana V.; Zhirnova, Dina F.; Siberian Federal University; Russian Foundation for Basic ResearchRussian Foundation for Basic Research (RFBR) [19-04-00274 A]