Аннотация: The surface morphology and local structure of layers in the Ni-Ge and Ge-Ni-Ge-Ni-Ge films have been investigated. It has been shown that the surface of the films follows the roughnesses of the substrate surface, which have characteristic dimensions of 2–4 nm in height and ∼100 nm in plane. It has been found that an interface with the depth ranging from 9 to 18 nm is formed at the boundaries between the Ni and Ge layers. The data obtained have been used to explain the specific features of the magnetic properties of the studied films, such as the asymmetry of hysteresis loops at low temperatures and the difference between the temperature dependences of the magnetization of the samples for two cooling modes: in a magnetic field and without a magnetic field.
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Greben'kova, Yu.E.; Гребенькова, Юлия Эрнестовна; Chernichenko, A. V.; Черниченко, Ангелина Виталиевна; Velikanov, D. A.; Великанов, Дмитрий Анатольевич; Turpanov, I. A.; Турпанов, Игорь Александрович; Mukhamedzhanov, E. Kh.; Мухамеджанов Э.Х.; Zubavichus, Y. V.; Зубавичус Я.В.; Cherkov, A. K.; Черков А.К.; Patrin, G. S.; Патрин, Геннадий Семёнович