Рубрики:
FERROMAGNETIC-RESONANCE
ANISOTROPIES
ROUGHNESS
SUBSTRATE
Кл.слова (ненормированные):
magnetic anisotropy -- ferromagnetic resonance -- nanocrystalline film -- soft magnetic film -- thin film edges
FERROMAGNETIC-RESONANCE
ANISOTROPIES
ROUGHNESS
SUBSTRATE
Кл.слова (ненормированные):
magnetic anisotropy -- ferromagnetic resonance -- nanocrystalline film -- soft magnetic film -- thin film edges
Аннотация: Magnetic characteristics and their spatial distribution of magnetron sputtered nanocrystalline NiFe thin films of various compositions were investigated by ferromagnetic resonance (FMR) and magneto-optical Kerr effect microscopy. A sharp increase in the FMR line width and a strong deviation of the uniaxial magnetic anisotropy field were observed near the film edges. It was shown that the observed magnetic anisotropy behavior can be explained by assuming that besides the field-induced uniaxial magnetic anisotropy an additional source of the uniaxial anisotropy near the film edges exists, with the easy axis parallel to the edges. The possible origins of this additional contribution were discussed.
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Держатели документа:
Fed Res Ctr KSC SB RAS, Kirensky Inst Phys, 50-38 Akademgorodok, Krasnoyarsk 660036, Russia.
Siberian Fed Univ, 79 Svobodny Pr, Krasnoyarsk 66041, Russia.
Доп.точки доступа:
Belyaev, B. A.; Беляев, Борис Афанасьевич; Izotov, A. V.; Изотов, Андрей Викторович; Skomorokhov, G. V.; Скоморохов, Георгий Витальевич; Solovev, P. N.; Соловьев, Платон Николаевич; RFBRRussian Foundation for Basic Research (RFBR) [18-32-00086]; Ministry of Science and Higher Education of the Russian Federation [3.1031.2017/PCh]