/ A. S. Parshin [et al.]> // Tech. Phys. - 2011. -
Vol. 56,
Is. 5. - P. 656-661,
DOI 10.1134/S1063784211050264. - Cited References: 14. - This work was supported by the analytical target program "Development of Scientific Potential of Higher School" (project no. 2.1.1.3656); integration project at the Siberian and Far East Branches, Russian Academy of Sciences; program "Spintronics," Department of Physical Sciences, Russian Academy of Sciences; and federal target program "Scientific and Scientific-Pedagogical Personnel of Innovative Russia 2009-2013."
. - ISSN 1063-7842
РУБ Physics, Applied
Аннотация: The feasibility of determining the elemental composition, chemical state, and element distribution across the depth in a subsurface region using the computer simulation of the electron inelastic scattering cross section is demonstrated with iron layers on silicon substrates. Analysis is carried out based on the dielectric theory and on the experimental determination of the product of the electron inelastic mean free path by the inelastic scattering cross section from reflected electron energy loss spectra.
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Держатели документа: [Parshin, A. S.
Kushchenkov, S. A.
Aleksandrova, G. A.] Reshetnev Siberian State Aerosp Univ, Krasnoyarsk 660014, Russia
[Parshin, A. S.
Ovchinnikov, S. G.] Russian Acad Sci, Kirenskii Inst Phys, Siberian Branch, Krasnoyarsk 660036, Russia
ИФ СО РАН
Reshetnev Siberian State Aerospace University, pr. im. Gazety Krasnoyarskii Rabochii 31, Krasnoyarsk, 660014, Russian Federation
Kirenskii Institute of Physics, Siberian Branch, Russian Academy of Sciences, Akademgorodok, Krasnoyarsk, 660036, Russian Federation
Доп.точки доступа: Parshin, A. S.; Kushchenkov, S. A.; Aleksandrova, G. A.;
Александрова,
Галина Алексеевна; Ovchinnikov, S. G.; Овчинников, Сергей Геннадьевич