Перевод заглавия: Numerical analysis of temperature data from film thermistors of electronic boards
Кл.слова (ненормированные):
радиоэлектронная плата -- пленочный терморезистор -- физико-математическая модель -- численный алгоритм -- electronic boards -- film thermistors -- physical-mathematical model -- numerical algorithms
Аннотация: Предложен алгоритм определения участков перегрева печатной платы с радио-электронными элементами и температуры перегрева. В основе алгоритма лежат физико-математическая модель процесса нагрева и дополнительные качественные характеристики исследуемых состояний печатной платы. Приводятся результаты вычислительных экспериментов, иллюстрирующих работоспособность алгоритма.
In this paper, the printed circuit board with electronic components is considered as a geometric structure consisted of rectangular cells coated by thin film thermistors whose local resistance essentially depends on the local temperature of the cell. Resistance measurement of long conductors is not carried out locally but rather on the horizontal and vertical segments. Therefore, the amount of these data on the resistance of the conductors is considerably less than the number of local resistances of all cells. However, using physical and qualitative considerations in some cases, it is possible to obtain the numerical solution. In particular, during functioning of the board, an overheating of individual elements may occur, resulting in temperature rise of the respective cells with corresponding increase of resistance of some circuit segments. In the paper, the problem for identifying such cells with overheating as well as their temperature using two additional physical considerations is set. Firstly, while overheating an element, the temperature of any cell cannot reduce. Secondly, the temperature gradient is mitigated by the heat transfer between the elements and cells. The mathematical formulation of these considerations leads to a non-singular system of linear equations for the determining of the overheating cells and their approximate temperature. The presented algorithms and computational experiments demonstrate the applicability of this approach.
РИНЦ
Держатели документа:
Институт вычислительного моделирования СО РАН
Институт космических и информационных технологий СФУ
Доп.точки доступа:
Корнеева, Анна Анатольевна; Korneeva Anna Anatolievna; Шайдуров, Владимир Владимирович; Shaydurov Vladimir Vladimirovich