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 1-20    21-40   41-49 
1.

Absolute calibration of X-ray semiconductor detectors in the 0.3−1.5 keV photon energy range on synchrotron radiation from VEPP-2M storage ring/A. N. Subbotin [et al.] // Nuclear Instruments and Methods in Physics Research. Sec. A, 2001. - Vol. 470, Is. 1-2:Proceedings of the 13th National Synchrotron Radiation Conference (SR2000), Novosibirsk, 17-21 July 2000.-С.452-458
2.

Measurement of time and spectral characteristics of semiconductor detector with synchrotron radiation from the VEPP-2M storage ring in the photon energy range of (0.25 + 1.25) keV/V. V. Garanov [et al.] // The 4th Asian Forum on Synchrotron Radiation, Hiroshima University, Japan, 14-16 January 2001. -Hiroshima, 2001.-С.22-1
3.

Double-mirror monochromator of ultrasoft X-ray band using multilayer mirrors for the VEPP-2M metrology station/N. G. Gavrilov, A. G. Legkodymov, A. D. Nikolenko [et al.] // Surface Investigation X-Ray, Synchrotron and Neutron Techniques, 2001. - Vol. 16, Is. 1.-С.205-210
4.

Calibration of the apparatus of the space solar patrol/S. V. Avakyan [et al.] // Digest reports of the XV International Synchrotron Radiation Conference : SR-2004, Novosibirsk, Russia, 19-23 Jily 2004. -Novosibirsk:BINP SB RAS, 2004.-С.168
5.

Study of SR beam focusing with X-ray compound refractive lenses at the VEPP-3 storage ring/V. A. Chernov [et al.] // Nuclear Instruments and Methods in Physics Research. Sec. A, 2005. - Vol. 543, Is. 1:Proceedings of the XV International Synchrotron Radiation Conference SR 2004, Novosibirsk, Russia, 19–23 July 2004.-С.326-332
6.

VUV and soft X-ray metrology stations at the International Siberian Synchrotron Radiation centre/V. I. Buhtiyarov [et al.] // NEWRAD 2005 : proceedings of the 9th International conference on New Developments and Applications in Optical Radiometry, 17-19 October, 2005, Davos, Switzerland. -Davos:Physikalisch-Meteorologisches Observatorium Davos, Weltstrahlungszentrum, 2005.-С.33
7.

Characterization of spatial homogeneity of sensitivity and radiation resistance of semiconductor detectors in the soft X-ray range/P. N. Aruev [et al.] // Digest reports of the XVII International Synchrotron Radiation Conference : SR-2008, Novosibirsk, Russia, 15-20 June 2008. -Novosibirsk:BINP SB RAS, 2008.-С.1-23
8.

Characterization of spatial homogeneity of sensitivity and radiation resistance of semiconductor detectors in the soft X-ray range/P. N. Aruev [et al.] // Nuclear Instruments and Methods in Physics Research. Sec. A, 2009. - Vol. 603, Is. 1/2:Proceedings of the XVII International Synchrotron Radiation conference : SR-2008, Novosibirsk, Russia, June 15-20, 2008.-С.58-61
9.

Tests of model of absolute measuring instrument of synchrotron radiation power/I. A. Khrebtov [et al.] // The 9th International Symposium on Measurement Technology and Intelligent Instruments, 29 June-2 July, 2009, Saint-Petersburg, Russia : ISTC Special Session. -Saint-Petersburg:D. S. Rozhdestvensky Optical Soc., 2009.-С.12-16
10.

Preliminary characterization of semiconductor detectors in the soft X-ray range using synchrotron radiation from the VEPP-4 storage ring/P. N. Aruev [et al.] // Journal of Surface Investigation, 2010. - Vol. 4, Is. 1.-С.99-103
11.

Tests of model of absolute measuring instrument of synchrotron radiation power/I. A. Khrebtov [et al.] // Key Engineering Materials, 2010. - Vol. 437:9th International Symposium on Measurement Technology and Intelligent Instruments :ISMTII-2009; Saint-Petersburg; Russian Federation; 29 June - 2 July 2009.-С.636-640
12.

Absolute calibration of X-ray optical elements and detectors at a wavelength of 46.9 nm/O. N. Gilev [et al.] // Instruments and Experimental Techniques, 2010. - Vol. 53, Is. 6.-С.873-876
13.

Fundamental and applied investigations in Siberian Synchrotron and Terahertz Radiation Center/A. Ancharov [et al.] // 5th International Workshop "Nanotechnology applications in the automobile industry and mechanical engineering. High-quality research and advanced Research Infrastructures (RI) in Russia and EU", Rome, Italy, 1-4 October 2012. -Rome:MISIS, 2012.-С.77-78
14.

Kosmos station: Application of synchrotron radiation from the VEPP-4M storage ring for metrological measurements in the VUV and soft X-ray ranges/A. D. Nikolenko [et al.] // Journal of Surface Investigation, 2012. - Vol. 6, Is. 3.-С.388-393
15.

Comparative certification of secondary-electron multipliers within the ultrasoft X-ray range/A. A. Legkodymov [et al.] // Journal of Surface Investigation, 2012. - Vol. 6, Is. 3.-С.404-407
16.

Optical and X-ray imaging analysis of chemical elements associated with microbial communities/A. A. Legkodymov [et al.] // Bulletin of the Russian Academy of Sciences: Physics, 2013. - Vol. 77, Is. 9:Proceedings of the 19th National Conference on the Application of Synchrotron Radiation "SR-2012" and National Youth Conference "Application of Synchrotron Radiation", 25-28 June 2012, Novosibirsk.-С.1185-1189
17.

Trace element composition of common sea buckthorn (Hippophae rhamnoides L.) tissues/G. M. Skuridin [et al.] // Bulletin of the Russian Academy of Sciences: Physics, 2013. - Vol. 77, Is. 2.-С.207-210
18.

Trace element composition of Seabuckthorn (Hippophae rhamnoides L.) parts/G. M. Scuridin [et al.] // Seabuckthorn. Research for a promising crop: Selected articles from ISA 2013 congress proceedings, 14-17 October 2013, Potsdam, Germany. -Norderstedt:Books on Demand, 2014.-С.67-68
19.

Applying Hard X-rays to determination of the minimum detection levels of rare earth element by the XRFA-SR method/A. A. Legkodymov [et al.] // Bulletin of the Russian Academy of Sciences: Physics, 2015. - Vol. 79, Is. 1:Proceedings of the 20th National Conference on the use of synchrotron radiation "SR-2014" and the National Youth Conference "Using synchrotron radiation" (Novosibirsk, 7-10 July 2014).-С.103-108
20.

Cytopathic Effects of X-ray Irradiation and MnO Nanoparticles on Human Glioblastoma (U87)/K. E. Kuper [et al.] // Physics Procedia, 2016. - Vol. 84:Proceedings of the International Conference "Synchrotron and Free electron laser Radiation: generation and application" (SFR-2016), July 4 - 7, 2016, Novosibirsk, Russia.-С.252-255
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