Поисковый запрос: (<.>A=Legkodymov, A. A.$<.>) |
Общее количество найденных документов : 30
Показаны документы с 1 по 10 |
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>1.
| Calibration of the apparatus of the space solar patrol/S. V. Avakyan [et al.] // Digest reports of the XV International Synchrotron Radiation Conference : SR-2004, Novosibirsk, Russia, 19-23 Jily 2004. -Novosibirsk:BINP SB RAS, 2004.-С.168
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>2.
| VUV and soft X-ray metrology stations at the International Siberian Synchrotron Radiation centre/V. I. Buhtiyarov [et al.] // NEWRAD 2005 : proceedings of the 9th International conference on New Developments and Applications in Optical Radiometry, 17-19 October, 2005, Davos, Switzerland. -Davos:Physikalisch-Meteorologisches Observatorium Davos, Weltstrahlungszentrum, 2005.-С.33
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>3.
| Study of SR beam focusing with X-ray compound refractive lenses at the VEPP-3 storage ring/V. A. Chernov [et al.] // Nuclear Instruments and Methods in Physics Research. Sec. A, 2005. - Vol. 543, Is. 1:Proceedings of the XV International Synchrotron Radiation Conference SR 2004, Novosibirsk, Russia, 19–23 July 2004.-С.326-332
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| Characterization of spatial homogeneity of sensitivity and radiation resistance of semiconductor detectors in the soft X-ray range/P. N. Aruev [et al.] // Digest reports of the XVII International Synchrotron Radiation Conference : SR-2008, Novosibirsk, Russia, 15-20 June 2008. -Novosibirsk:BINP SB RAS, 2008.-С.1-23
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>5.
| Characterization of spatial homogeneity of sensitivity and radiation resistance of semiconductor detectors in the soft X-ray range/P. N. Aruev [et al.] // Nuclear Instruments and Methods in Physics Research. Sec. A, 2009. - Vol. 603, Is. 1/2:Proceedings of the XVII International Synchrotron Radiation conference : SR-2008, Novosibirsk, Russia, June 15-20, 2008.-С.58-61
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>6.
| Tests of model of absolute measuring instrument of synchrotron radiation power/I. A. Khrebtov [et al.] // The 9th International Symposium on Measurement Technology and Intelligent Instruments, 29 June-2 July, 2009, Saint-Petersburg, Russia : ISTC Special Session. -Saint-Petersburg:D. S. Rozhdestvensky Optical Soc., 2009.-С.12-16
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>7.
| Absolute calibration of X-ray optical elements and detectors at a wavelength of 46.9 nm/O. N. Gilev [et al.] // Instruments and Experimental Techniques, 2010. - Vol. 53, Is. 6.-С.873-876
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>8.
| Preliminary characterization of semiconductor detectors in the soft X-ray range using synchrotron radiation from the VEPP-4 storage ring/P. N. Aruev [et al.] // Journal of Surface Investigation, 2010. - Vol. 4, Is. 1.-С.99-103
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>9.
| Tests of model of absolute measuring instrument of synchrotron radiation power/I. A. Khrebtov [et al.] // Key Engineering Materials, 2010. - Vol. 437:9th International Symposium on Measurement Technology and Intelligent Instruments :ISMTII-2009; Saint-Petersburg; Russian Federation; 29 June - 2 July 2009.-С.636-640
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>10.
| Comparative certification of secondary-electron multipliers within the ultrasoft X-ray range/A. A. Legkodymov [et al.] // Journal of Surface Investigation, 2012. - Vol. 6, Is. 3.-С.404-407
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