Поисковый запрос: (<.>A=CHZHAN, A. V.$<.>) |
Общее количество найденных документов : 70
Показаны документы с 1 по 10 |
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1.
| About the nature of induced anisotropy in amotphous Co-P films/G. S. Patrin [et al.] // Workshop "Trends in Nanomechanics and Nanoengineering", 2009.-С.30
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2.
| Allotropic modifications of cobalt upon chemical deposition/A. V. Chzhan, S. A. Podorozhnyak, V. K. Mal’tsev [et al.] // Physics of the Solid State, 2021. т.Vol. 63,N Is. 1.-С.42-46
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3.
| Coercivity and exchange bias in magnetic sandwich structure prepared by chemical deposition/A. V. Chzhan [et al.] // Solid State Phenomena. -Stafa-Zurich:Trans Tech Publications, 2012. т.Vol. 190:Magnetism and Magnetic Materials V : Selected, Peer Reviewed Papers.-С.463-465
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4.
| Chzhan A. V. Coercivity of amorphous Co-P single-layer and trilayer films fabricated by chemical deposition/A. V. Chzhan, S. Y. Kiparisov, G. S. Patrin // Solid State Phenomena:Trans Tech Publications, 2014. т.Vol. 215:Trends in Magnetism: Nanomagnetism (EASTMAG-2013).-С.150-153
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5.
| Chzhan A. V. Coercivity of amorphous Co-P single-layer and trilayer films fabricated by chemical deposition/A. V. Chzhan, S. Ya. Kiparisov, G. S. Patrin // V Euro-Asian simposium "Trend in MAGnetism": Nanomagnetism. -Vladivostok:FEFU, 2013.-С.168
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6.
| Chzhan A. V. Deaccommodation of the initial permeability in FeBO3 at low temperatures/A. V. Chzhan // PHYSICS OF THE SOLID STATE:MAIK NAUKA/INTERPERIODICA/SPRINGER, 2006. т.Vol. 48,N Is. 9.-С.1730-1731
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7.
| Dependence of coercive force on thickness in three layer films/A. V. Chzhan [et al.] // Euro-asian symposium "Trends in magnetism" (EASTMAG-2019), 2019,N Vol. 2.- Ст.J.P39.-С.256-257
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8.
| DOMAIN-STRUCTURE IN FILMS OF MAGNETIC CDCR2SE4 SEMICONDUCTOR/A. V. CHZHAN [и др.] // FIZIKA TVERDOGO TELA:MEZHDUNARODNAYA KNIGA, 1984. т.Vol. 26,N Is. 4.-С.1177-1179
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9.
| DOMAIN-WALL STABILIZATION IN CDCR2SE4 MAGNETIC SEMICONDUCTOR-FILMS/I. A. TURPANOV [и др.] // FIZIKA TVERDOGO TELA:MEZHDUNARODNAYA KNIGA, 1982. т.Vol. 24,N Is. 6.-С.1858-1860
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10.
| Effect of alkali reagents on the crystal structure of chemically deposited CoP films/A. V. Chzhan [et al.] // Bulletin of the Russian Academy of Sciences: Physics:Allerton Press, 2016. т.Vol. 80,N Is. 6.-С.692-694
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