Поисковый запрос: (<.>A=Moiseenko, E. T.$<.>) |
Общее количество найденных документов : 30
Показаны документы с 1 по 10 |
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1.
| Altunin R. R. Kinetics of diffusion and phase formation in a solid-state reaction in Al/Au thin films/R. R. Altunin, E. T. Moiseenko, S. M. Zharkov // Journal of Alloys and Compounds, 2024. т.Vol. 1002.- Ст.175500
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| Thermokinetic study of intermetallic phase formation in an Al/Cu multilayer thin film system/E. T. Moiseenko, V. V. Yumashev, R. R. Altunin [et al.] // Materialia, 2023. т.Vol. 28.- Ст.101747
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| Thermokinetic study of aluminum-induced crystallization of a-Si: The effect of Al layer thickness/S. M. Zharkov, V. V. Yumashev, E. T. Moiseenko [et al.] // Nanomaterials, 2023. т.Vol. 13,N Is. 22.- Ст.2925
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| Жарков С. М. Кинетика фазообразования при твердофазной реакции в многослойных тонкопленочных наносистемах Al/Cu/С. М. Жарков, Р. Р. Алтунин, Е. Т. Моисеенко, В. В. Юмашев // XXIX Российская конференция по электронной микроскопии (РКЭМ-2022), 2022.-С.279
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| Solid-state reaction in Cu/a-Si nanolayers: A comparative study of STA and electron diffraction data/E. T. Moiseenko, V. V. Yumashev, R. R. Altunin [и др.] // Materials, 2022. т.Vol. 15,N Is. 23.- Ст.8457
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| Correction to: Peculiarities of intermetallic phase formation in the process of a solid state reaction in (Al/Cu)n multilayer thin films (vol 73, pg 580, 2021)/E. T. Moiseenko, S. M. Zharkov, R. R. Altunin [et al.] // JOM, 2021. т.Vol. 73,N Is. 6.-С.1988
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| Peculiarities of Intermetallic Phase Formation in the Process of a Solid State Reaction in (Al/Cu)n Multilayer Thin Films/E. T. Moiseenko, S. M. Zharkov, R. R. Altunin [et al.] // JOM, 2021. т.Vol. 73,N Is. 2.-С.580-588
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| Kinetic study of a solid-state reaction in Ag/Al multilayer thin films by in situ electron diffraction and simultaneous thermal analysis/S. M. Zharkov, R. R. Altunin, V. V. Yumashev [et al.] // Journal of Alloys and Compounds, 2021. т.Vol. 871.- Ст.159474
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| Moiseenko E. T. In situ electron diffraction and resistivity characterization of solid state reaction process in Cu/Al bilayer thin films/E. T. Moiseenko, R. R. Altunin, S. M. Zharkov // Metallurgical and Materials Transactions A: Physical Metallurgy and Materials Science, 2020. т.Vol. 51,N Is. 3.-С.1428-1436
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| Altunin R. R. Effect of the structural properties on the electrical resistivity of the Al/Ag thin films during the solid-state reaction/R. R. Altunin, E. T. Moiseenko, S. M. Zharkov // Physics of the Solid State, 2020. т.Vol. 62,N Is. 4.-С.708-713
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