Поисковый запрос: (<.>K=Bias<.>) |
Общее количество найденных документов : 47
Показаны документы с 1 по 10 |
|
1.
| Belyaev B. A. Micromagnetic modeling of static and dynamic properties of ferromagnetic/antiferromagnetic bilayer/B. A. Belyaev, A. V. Zotov, P. N. Solovev // International Siberian Conference on Control and Communications (SIBCON-2013):IEEE, 2013.-С.Cт. 6693573
|
2.
| Bias-current and optically driven transport properties of the hybrid Fe/Si02/p-Si structures/N. V. Volkov, E. V., Eremin, A. S. Tarasov [et al.] // Moscow International Symposium on Magnetism (MISM-2011), 2011.- Ст.22PO-I-10.-С.109
|
3.
| Bias-current and optically driven transport properties of the hybrid Fe/SiO 2/p-Si structures/N. V. Volkov [et al.] // Diffusion and Defect Data Pt.B: Solid State Phenomena, 2012. т.Vol. 190.-С.526-529
|
4.
| Bias-voltage-controlled ac and dc magnetotransport phenomena in hybrid structures/N. V. Volkov [et al.] // Journal of Magnetism and Magnetic Materials:Elsevier Science, 2015. т.Vol. 383.-С.69-72
|
5.
| Bias-voltage-controlled AC and DC magnetotransport phenomena in hybrid structures/N. V. Volkov [et al.] // Moscow International Symposium on Magnetism (MISM-2014), 2014.- Ст.1RP-A-10.-С.315
|
6.
| Calculation of thermostable directions and the influence of bias electricfield on the propagation of the Lamb and SH waves in langasite single crystalplates/S. I. Burkov [et al.] // Proceedings - IEEE Ultrasonics Symposium, 2010.- Ст.5935458.-С.1853-1856
|
7.
| Coercivity and exchange bias in magnetic sandwich structure prepared by chemical deposition/A. V. Chzhan [et al.] // Solid State Phenomena. -Stafa-Zurich:Trans Tech Publications, 2012. т.Vol. 190:Magnetism and Magnetic Materials V : Selected, Peer Reviewed Papers.-С.463-465
|
8.
| Complex study of magnetization reversal mechanisms of FeNi/FeMn bilayers depending on growth conditions/C. Gritsenko, V. Lepalovskij, M. Volochaev [et al.] // Nanomaterials, 2022. т.Vol. 12,N Is. 7.- Ст.1178
|
9.
| Effect of the nonmagnetic layer in a Co/Cu/CoO trilayer structure on the exchange coupling in it/P. D. Kim [et al.] // JOURNAL OF EXPERIMENTAL AND THEORETICAL PHYSICS:MAIK NAUKA/INTERPERIODICA/SPRINGER, 2011. т.Vol. 112,N Is. 4.-С.612-616
|
10.
| Effect of the Semiconductor Spacer on Positive Exchange Bias in the CoNi/Si/FeNi Three-Layer Structure/G. S. Patrin [et al.] // JETP Letters, 2019. т.Vol. 109,N Is. 5.-С.320-324
|
|
|
|
Главная
Каталог книг и брошюр библиотеки ИФ СО РАН
Стандартный
Центральная Научная Библиотека КНЦ СО РАН