Поисковый запрос: (<.>K=Interface<.>) |
Общее количество найденных документов : 89
Показаны документы с 1 по 10 |
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1.
| Formation of nonmagnetic phases in Fe/Si interface/S. N. Varnakov [et al.] // Workshop "Trends in Nanomechanics and Nanoengineering" , 2009.-С.21
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| Spectral dependences of transmittance and polarizing ability of stretched PDLC films with homogeneous and inhomogeneous interface anchoring/M. N. Krakhalev [et al.] // EuroDisplay 2019, 2019.- Ст.O-9.-С.25
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3.
| Magnetoimpedance Effect in a SOI-Based Structure/D. A. Smolyakov [et al.] // Semiconductors, 2019. т.Vol. 53,N Is. 14.-С.98-100
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| Chiral optical Tamm states at the interface between an all-dielectric polarization-preserving anisotropic mirror and a cholesteric liquid crystal/N. V. Rudakova [et al.] // Crystals, 2019. т.Vol. 9,N Is. 10.- Ст.502
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| Probing proximity effects in the ferromagnetic semiconductor EuO/D. V. Averyanov, A. M. Tokmachev, O. E. Parfenov [et al.] // Applied Surface Science, 2019. т.Vol. 488.-С.107-114
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| Polar anchoring energy and tilt angle measured by magneto-optical technique in nematic doped with ionic surfactant/A. M. Parshin, V. S. Sutormin, V. Y. Zyryanov, V. F. Shabanov // Liquid Crystals, 2020. т.Vol. 47,N Is. 12.-С.1825-1831
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| Tarasov I. A. α-FeSi2 as a buffer layer for β-FeSi2 growth: analysis of orientation relationships in silicide/Silicon, silicide/silicide heterointerfaces/I. A. Tarasov, I. A. Bondarev, A. I. Romanenko // Journal of Surface Investigation, 2020. т.Vol. 14,N Is. 4.-С.851-861
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| Growth of α-FeSi2 nanocrystals on silicon surface: the impact of gold and the Si/Fe flux ratio, the origin and the prediction of α/Si orientation relationships and interface structures/Ivan Tarasov, Maxim Visotin, Sergey Varnakov and Sergey Ovchinnikov // An International Online Workshop on the properties of Functional MAX-materials (1st FunMAX Workshop 2020), 2020.-С.11
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| Chiral optical Tamm states at the interface between a Dye-doped cholesteric liquid crystal and an anisotropic mirror/A. Yu. Avdeeva, S. Ya. Vetrov, R. G. Bikbaev [et al.] // MATERIALS, 2020. т.Vol. 13,N Is. 15.- Ст.3255
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10.
| Altunin R. R. Effect of the structural properties on the electrical resistivity of the Al/Ag thin films during the solid-state reaction/R. R. Altunin, E. T. Moiseenko, S. M. Zharkov // Physics of the Solid State, 2020. т.Vol. 62,N Is. 4.-С.708-713
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