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Вид документа : Статья из журнала Шифр издания :
Автор(ы) : Greben'kova Y. E., Edelman I. S., Chernichenko A. V., Velikanov D. A., Zharkov S. M., Turpanov I. A.
Заглавие : Morphology and structure of the interface layers in Ni/Ge thin films
Коллективы : Euro-Asian Symposium "Trends in MAGnetism": Nanomagnetism
Место публикации : Solid State Phenom.: Selected, peer reviewed papers/ ed.: S. G. Ovchinnikov, A. Samardak: Trans Tech Publications, 2014. - Vol. 215: Trends in Magnetism: Nanomagnetism (EASTMAG-2013). - P.259-263. - ISSN 978-303835054-5, DOI 10.4028/www.scientific.net/SSP.215.259. - ISSN 1662-9779 Примечания : Cited References: 17
Ключевые слова (''Своб.индексиров.''): exchange interaction--interface structure--magnetic properties--magneto - hard layer--magneto - soft layer--ni/ge layer structures Аннотация: Morphology and structure of the interface in Ni/Ge thin films being due to the mutual diffusion of these elements are investigated with the help of atomic force microscope, high resolution electron microscope and micro-diffraction. Strong effect of interface in magnetic behavior of Ni layers is demonstrated and explained by formation of magnetic order in the interface and rough boundaries between layers. © (2014) Trans Tech Publications, Switzerland.
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