Поисковый запрос: (<.>K=Silicides<.>) |
Общее количество найденных документов : 37
Показаны документы с 1 по 10 |
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1.
| A way for targeted synthesis of higher manganese silicides: a new Mn17Si30 phase and its distinctive features/I. A. Tarasov [et al.] // Nanostructures: physics and technology, 2018.-С.209-210
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2.
| A way for targeted synthesis of higher manganese silicides: a new Mn17Si3O phase and its distinctive features/I. A. Tarasov [et al.] // International school/workshop on actual problems of condensed matter physics. -Norilsk, 2018.-С.14-15
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| Analysis of optical and magnetooptical spectra of Fe5Si3 and Fe3Si magnetic silicides using spectral magnetoellipsometry/S. A. Lyashchenko [et al.] // Journal of Experimental and Theoretical Physics:MAIK Nauka-Interperiodica / Springer, 2015. т.Vol. 120,N Is. 5.-С.886-893
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| Approach to form planar structures based on epitaxial Fe1 − xSix films grown on Si(111)/A. S. Tarasov [et al.] // Thin Solid Films:Elsevier, 2017. т.Vol. 642.-С.20-24
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| CEMS analysis of phase formation in nanostructured films (Fe/Si) 3/S. N. Varnakov [et al.] // Solid State Phenomena, 2011. т.Vol. 168-169.-С.277-280
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| Characterization and magnetic properties of the iron silicides/S. G. Ovchinnikov, S. N. Varnakov, A. S. Fedorov [et al.] // Proceedings Asian School-Conference on Physics and Technology of Nanostructured Materials (ASCO-NANOMAT 2011), 2011
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| Characterization of manganese and iron silicides by in situ spectral generalized magneto-optical ellipsometry/N. N. Kosyrev [et al.] // 7th Workshop on Ellipsometry, 2012
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| Current channel switching in the manganite-based multilayer structure/N. V. Volkov [et al.] // International Conference on Magnetism, ICM 2009 (26 July 2009 through 31 July 2009, Karlsruhe, 2010. т.Vol. 200,N Is. SECTION 5
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| Current-driven channel switching and colossal positive magnetoresistance in the manganite-based structure/N. V. Volkov [et al.] // Journal of Physics D - Applied Physics, 2009. т.Vol. 42,N Is. 6.- Ст.65005
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| Determination of structural parameters of the Fe-Si-system by spectral ellipsometry method/S. A. Lyashchenko [et al.] // Physics Procedia, 2012. т.Vol. 23.-С.49-52
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