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Altunin, R. R.
Structural phase transformations during a solid-state reaction in a bilayer Al/Fe thin-film nanosystem / R. R. Altunin, E. T. Moiseenko, S. M. Zharkov // Phys. Solid State. - 2020. - Vol. 62, Is. 1. - P. 200-205, DOI 10.1134/S1063783420010059. - Cited References: 36. - This study was supported by the Russian Foundation for Basic Research, project no. 18-03-01173a . - ISSN 1063-7834
Кл.слова (ненормированные):
thin films -- Al/Fe -- solid-state reaction -- phase formation -- electron diffraction
Аннотация: The processes of phase formation during a solid-state reaction between Fe and Al nanolayers have been investigated by the in situ electron diffraction method. It is established that the solid-state reaction at the interface between iron and aluminum nanolayers begins at ≈100°C with the formation of a disordered Al solid solution in α-Fe. It is shown that intermetallic phases (FeAl6 and/or Fe2Al5, FeAl, and Fe3Al) are successively formed upon further heating.

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Публикация на русском языке Алтунин Р. Р. Структурные фазовые превращения при твердофазной реакции в двухслойной тонкопленочной наносистеме Al/Fe [Текст] / Р. Р. Алтунин, Е. Т. Моисеенко, С. М. Жарков // Физ. тверд. тела. - 2020. - Т. 62 Вып. 1. - С. 158-163

Держатели документа:
Siberian Federal University, Krasnoyarsk, 660041, Russian Federation
Kirensky Institute of Physics, Federal Research Center Krasnoyarsk Science Center, Siberian Branch, Russian Academy of Sciences, Krasnoyarsk, 660036, Russian Federation

Доп.точки доступа:
Moiseenko, E. T.; Zharkov, S. M.; Жарков, Сергей Михайлович
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Amorphous and Crystalline Nickel Oxide Films Obtained by the Extraction-Pyrolysis Method for Electrochromic Cells / A. L. Belousov, T. N. Patrusheva, A. A. Karacharov [et al.] // Theor. Found. Chem. Eng. - 2020. - Vol. 54, Is. 4. - P. 699-705, DOI 10.1134/S0040579520040041. - Cited References: 8. - This work was performed as part of the program "Research and Development for the Priority Areas of the Russian Science-and-Technology Sector for 2014-2020"; Grant Agreement no. 075-15-2019-1843; the Project Unique Identifier RFMEFI60719X0307 . - ISSN 0040-5795. - ISSN 1608-3431

РУБ Engineering, Chemical
Рубрики:
NIO THIN-FILMS
Кл.слова (ненормированные):
nickel extract -- extraction-pyrolysis technology -- thin film -- annealing -- electrochromic cell
Аннотация: This paper reports studies of thin films of nickel oxide obtained by the extraction–pyrolysis method on glass and quartz substrates at temperatures of 380–600°C. The films have been characterized by atomic force microscopy and X-ray diffraction. It is shown that amorphous and crystalline nickel oxide films are formed on the glass. The grain size depends on the annealing temperature, while increased annealing temperatures lead to recrystallization and a decrease in the grain size in NiO films from 130 to 35 nm.

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Публикация на русском языке Пленки аморфного и кристаллического оксида никеля, полученные экстракционно-пиролитическим методом для электрохромных ячеек [Текст] / А. Л. Белоусов [и др.] // Хим. технол. - 2019. - Т. 20 № 5. - С. 215-221

Держатели документа:
Siberian Fed Univ, Krasnoyarsk 660041, Russia.
Baltic State Tech Univ VOENMEX, St Petersburg 190005, Russia.
Russian Acad Sci, Siberian Branch, Inst Chem & Chem Technol, Krasnoyarsk 660036, Russia.
Russian Acad Sci, Kirensky Inst Phys, Siberian Branch, Krasnoyarsk 660036, Russia.
Russian Acad Sci, Kurnakov Inst Gen & Inorgan Chem, Moscow 119991, Russia.

Доп.точки доступа:
Belousov, A. L.; Patrusheva, T. N.; Karacharov, A. A.; Ivanenko, A. A.; Иваненко, Александр Анатольевич; Kirik, S. D.; Khol'kin, A. I.; program "Research and Development for the Priority Areas of the Russian Science-and-Technology Sector for 2014-2020" [075-15-2019-1843]; [RFMEFI60719X0307]
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Analysis of interaction of laser-radiation pulses with metal magnetostrictive film / G. P. Berman [et al.] // Solid State Commun. - 1988. - Vol. 67, Is. 12. - P. 1203-1207, DOI 10.1016/0038-1098(88)91084-8. - Cited References: 12 . - ISSN 0038-1098

РУБ Physics, Condensed Matter

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Держатели документа:
Kirensky Institute of Physics, Krasnoyarsk, 660036, Russian Federation
ИФ СО РАН
Доп.точки доступа:
Berman, G. P.; Frolov, G. I.; Фролов, Георгий Иванович; Seredkin, V. A.; Середкин, Виталий Александрович; Yakovchuk, V. Yu.; Яковчук, Виктор Юрьевич
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Anisotropic magnetization of an NbN film / D. M. Gokhfeld, N. E. Savitskaya, S. I. Popkov [et al.] // J. Exp. Theor. Phys. - 2022. - Vol. 134, Is. 6. - P. 707-712, DOI 10.1134/S1063776122060097. - Cited References: 31. - We are grateful to I.V. Nemtsev for measurements on the scanning electron microscope, S.A. Skorobogatov for his help in magnetic measurements (scanning electron microscopy and magnetic measurements have been performed at the Krasnoyarsk Regional Collective Usage Center of the Federal Research Center “Krasnoyarsk Scientific Center, Siberian Branch, Russian Academy of Sciences”) . - ISSN 1063-7761
Кл.слова (ненормированные):
Critical currents -- Magnetization -- Niobium compounds -- Nitrogen compounds -- Reactive sputtering -- Scanning electron microscopy -- Superfluid helium -- Anisotropic magnetization -- Columnar structures -- Field orientation -- Film magnetization -- Film surfaces -- Liquid helium temperature -- Magnetization loops -- Niobium nitride films -- Quartz substrate -- Structural and magnetic properties -- Current density
Аннотация: The structural and magnetic properties of a niobium nitride (NbN) film prepared by reactive sputtering onto a quartz substrate are investigated. It is shown using scanning electron microscopy that the film has a columnar structure with a diameter of crystallite columns of about 50 nm. The film magnetization loops are measured for the field orientation parallel and perpendicular to its surface. Based on the experimental data, the critical current densities of the film are estimated in both cases. For the field parallel to the film surface, the estimate is 6.5 × 104 A/cm2 at the liquid helium temperature. For the field perpendicular to the surface, the critical current density is close to the depairing current density (107 A/cm2). Analysis of the results based on different models of magnetic vortex pinning in superconductors shows that in the former case, pinning occurs at the boundaries of columns in the bulk of the sample, while in the latter case, it is determined by the influence of the surface barrier.

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Публикация на русском языке Анизотропная намагниченность пленки NbN [Текст] / Д. М. Гохфельд, Н. Е. Савицкая, С. И. Попков [и др.] // Журн. эксперим. и теор. физ. - 2022. - Т. 161 Вып. 6. - С. 833-839

Держатели документа:
Kirensky Institute of Physics, Krasnoyarsk Scientific Center, Siberian Branch, Russian Academy of Sciences, Krasnoyarsk, 660036, Russian Federation
Siberian Federal University, Krasnoyarsk, 660041, Russian Federation
Konstantinov Petersburg Nuclear Physics Institute, Nation Research Center “Kurchatov Institute”, Leningrad oblast, Gatchina, 188300, Russian Federation
Krasnoyarsk Electric Railway-Carriage Repair Works, Krasnoyarsk, 660021, Russian Federation
Mordovia State University, Saransk, 430000, Russian Federation

Доп.точки доступа:
Gokhfeld, D. M.; Гохфельд, Денис Михайлович; Savitskaya, N. E.; Popkov, S. I.; Kuzmichev, N. D.; Vasyutin, M. A.; Balaev, D. A.; Балаев, Дмитрий Александрович
}
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Anomalous hall effect in an epitaxial Mn5Ge3 thin film on Si(111) / M. V. Rautskii, I. A. Yakovlev, S. N. Varnakov, A. S. Tarasov // VIII Euro-Asian symposium "Trends in magnetism" (EASTMAG-2022) : Book of abstracts / program com. S. G. Ovchinnikov [et al.]. - 2022. - Vol. 1, Sect. : Spintronics and magnetic nanostructures. - Ст. A.P34. - P. 163-164. - Cited References: 5. - Support by Russian Foundation for Basic Research, the Government of the Krasnoyarsk Territory . - ISBN 978-5-94469-051-7

Материалы симпозиума, ,
Держатели документа:
Kirensky Institute of Physics, Federal Research Center KSC SB RAS, Krasnoyarsk, Russia

Доп.точки доступа:
Ovchinnikov, S. G. \program com.\; Овчинников, Сергей Геннадьевич; Rautskii, M. V.; Рауцкий, Михаил Владимирович; Yakovlev, I. A.; Яковлев, Иван Александрович; Varnakov, S. N.; Варнаков, Сергей Николаевич; Tarasov, A. S.; Тарасов, Антон Сергеевич; Российская академия наук; Физико-технический институт им. Е.К. Завойского ФИЦ Казанского научного центра РАН; Казанский (Приволжский) федеральный университет; Euro-Asian Symposium "Trends in MAGnetism"(8 ; 2022 ; Aug. ; 22-26 ; Kazan); "Trends in MAGnetism", Euro-Asian Symposium(8 ; 2022 ; Aug. ; 22-26 ; Kazan)
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    Atomic layer deposition ZnO on porous Al2O3 nanofibers film / A. S. Voronin, A. N. Masiygin, M. S. Molokeev, S. V. Khartov // J. Phys. Conf. Ser. - 2020. - Vol. 1679, Is. 2. - Ст. 022072DOI 10.1088/1742-6596/1679/2/022072. - Cited References: 10. - Studies by scanning electron microscopy and X-ray powder diffraction were performed on the equipment of Krasnoyarsk Regional Center of Research Equipment of Federal Research Center «Krasnoyarsk Science Center SB RAS». The transmission electron microscopy investigations were conducted in the SFU Joint Scientific Center supported by the State assignment (#FSRZ-2020-0011) of the Ministry of Science and Higher Education of the Russian Federation
   Перевод заглавия: Нанесение атомного слоя ZnO на пленку из пористых нановолокон Al2O3
Кл.слова (ненормированные):
Alumina -- Aluminum oxide -- Atomic layer deposition -- Atoms -- Composite structures -- High resolution transmission electron microscopy -- II-VI semiconductors -- Nanofibers -- Oxide minerals -- Scanning electron microscopy
Аннотация: The paper presents the results of the formation and study of the morphological and structural characteristics of the mesoporous ZnO / Al2O3 nanofibers film (ZANF). The deposition of a ZnO layer on Al2O3 nanofibers film (ANF) ~ 1 µm thick was carried out by the method of atomic layer deposition. The morphology of the mesoporous composite layer ZnO / Al2O3 (ZANF) has been studied by scanning and transmission electron microscopy. It is shown that in the process of atomic layer deposition, the ZnO layer grows according to the Stranski-Krastanov mechanism. A ZnO layer less than 5 nm thick gives an island structure in which Al2O3 nanofibers are uniformly coated with ZnO particles, an increase in the ZnO layer thickness to 15 nm demonstrates a continuous coating of Al2O3 nanofibers. The system has a core-shell structure. The resulting composite structures are promising for applications in photocatalysis and gas sensing.

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Держатели документа:
Federal Research Center Krasnoyarsk Scientific Center, Siberian Branch, Russian Academy of Sciences (KSC SB RAS), Krasnoyarsk, 660036, Russian Federation
Siberian Federal University, Krasnoyarsk, 660041, Russian Federation
Reshetnev Siberian State University Science and Technology, Krasnoyarsk, 660037, Russian Federation
Kirensky Institute of Physics (FRC KSC SB RAS), Krasnoyarsk, 660036, Russian Federation

Доп.точки доступа:
Voronin, A. S.; Masiygin, A. N.; Molokeev, M. S.; Молокеев, Максим Сергеевич; Khartov, S. V.; International Scientific Conference on Applied Physics, Information Technologies and Engineering(2nd ; 25 September - 4 October 2020 ; Krasnoyarsk, Russian Federation)
}
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Auger electron spectroscopy of the air-exposed (Cr0.5Mn0.5)2GaC MAX film surface / T. A. Andryushchenko, S. A. Lyashchenko, A. V. Lukyanenko [et al.] // Tech. Phys. Lett. - 2023. - Vol. 49, Is. 7. - P. 59-64, DOI 10.61011/TPL.2023.07.56448.19430. - Cited References: 16. - This study was supported by a grant from the Russian Science Foundation, project № 21-12-00226 (http://rscf.ru/project/21-12-00226/) . - ISSN 1063-7850. - ISSN 1090-6533
Кл.слова (ненормированные):
MAX phases -- Auger electron spectroscopy -- epitaxial films -- ion etching
Аннотация: We have analyzed chemical bonding of atmospheric oxygen with chromium and manganese on the epitaxial MAX-phase (Cr0.5Mn0.5)2GaC surface using Auger electron spectroscopy combined with ion etching. It was found that the system has a specific anisotropic oxidation where oxygen atoms bind to chromium and manganese ones more actively at the faces of layered MAX phase crystallites in contrast to the (0001) basal plane. At the same time, the dominance of the Mn–O chemical bonding over Cr–O is observed on the latter.

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Публикация на русском языке Оже-электронная спектроскопия поверхности MAX-пленок (Cr0.5Mn0.5)2GaC, окисленной в результате хранения на воздухе [Текст] / Т. А. Андрющенко, С. А. Лященко, А. В. Лукьяненко [и др.] // Письма в ЖТФ. - 2023. - Т. 49 Вып. 14. - С. 22-27

Держатели документа:
Kirensky Institute of Physics, Federal Research Center KSC SB, Russian Academy of Sciences, Krasnoyarsk, Russia
Siberian State University, Krasnoyarsk, Russia

Доп.точки доступа:
Andryushchenko, T. A.; Андрющенко, Татьяна Александровна; Lyashchenko, S. A.; Лященко, Сергей Александрович; Lukyanenko, A. V.; Лукьяненко, Анна Витальевна; Varnakov, S. N.; Варнаков, Сергей Николаевич; Ovchinnikov, S. G.; Овчинников, Сергей Геннадьевич
}
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Automated measuring unit for analysis of thin magnetic film ferroresonance spectrum / A. V. Burmitskikh [et al.] // International Siberian Conference on Control and Communications, SIBCON 2019 : Proceedings : IEEE, 2019. - Ст. 8729594, DOI 10.1109/SIBCON.2019.8729594. - Cited References: 6
Кл.слова (ненормированные):
Ferroresonance -- Magnetic films -- Magnetic sensors -- Magnetometers -- Permeability measurement
Аннотация: This paper considers hardware and software for automated analysis of thin magnetic film ferroresonance spectrum to determine the rate of growth and decrease in ferroresonance spectrum (conversion factor parameter). The measuring element of automated system is the strip line which is short-circuited. The measuring unit is used to study Ni 80 Fe 20 permalloy films, with thickness of more than 300 Å. Conversion factor, magnetic permeability μ, uniaxial magnetic anisotropy, ferromagnetic spectrum resonance line width, saturation magnetization are analyzed from 50 MHz to 2 GHz frequency range. The magnetic films are used to design frequency selective filters, phase shifters and weak-field magnetic sensors. The thin magnetic film sensors are high sensitive magnetometers, with wide frequency range, low dimensions and weight [1]. © 2019 IEEE.

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Держатели документа:
Laboratory of Electrodynamics and Microwave Electronics, Kirensky Institute of Physics, Krasnoyarsk, Russian Federation
Institute of Engineering Physics and Radio Electronics, Siberian Federal University, Krasnoyarsk, Russian Federation

Доп.точки доступа:
Burmitskikh, A. V.; Бурмитских, Антон Владимирович; Boev, N. M.; Боев, Никита Михайлович; Izotov, A. V.; Andyuseva, V. G.; International Siberian Conference on Control and Communications(14 ; 2019 ; April 18-20 ; Tomsk)
}
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Aver'yanov, E. M.
Effective refractive index of a quasi-two-dimensional polydomain film of a conjugated polymer / E. M. Aver’yanov // Phys. Solid State. - 2016. - Vol. 58, Is. 1. - P. 160-163, DOI 10.1134/S1063783416010042. - Cited References: 20 . - ISSN 1063-7834

РУБ Physics, Condensed Matter
Рубрики:
THIN POLYFLUORENE FILMS
   OPTICAL-CONSTANTS
   LOCAL-FIELD
   ANISOTROPY
   ORDER
Аннотация: The relation between the effective ordinary refractive index n* = (n o n e )1/2 of a quasi-two-dimensional polydomain uniaxial film of a conjugated polymer F8BT in the visible transparency region and the refractive indices (n o,e ) of uniaxial domains with the optical axes randomly oriented in the plane of the film has been confirmed experimentally. The permissible interval of variations in n* has been established and a strong spectral dispersion of this interval near the long-wavelength electronic absorption band of the film has been demonstrated.

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Публикация на русском языке Аверьянов, Евгений Михайлович. Эффективный показатель преломления квазидвумерной полидоменной пленки сопряженного полимера [Текст] / Е. М. Аверьянов // Физ. тверд. тела : Физико-технический институт им. А. Ф. Иоффе РАН, 2016. - Т. 58 Вып. 1. - С. 154-157

Доп.точки доступа:
Аверьянов, Евгений Михайлович
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10.

Aver'yanov, E. M.
Influence of the dimension of a polycrystalline film and the optical anisotropy of crystallites on the effective dielectric constant of the film / E. M. Aver’yanov // Phys. Solid State. - 2016. - Vol. 58, Is. 8. - P. 1634-1641, DOI 10.1134/S1063783416080035. - Cited References: 41 . - ISSN 1063-7834

РУБ Physics, Condensed Matter
Рубрики:
EFFECTIVE REFRACTIVE-INDEX
   CONJUGATED POLYMER
   POLY(P-PHENYLENE VINYLENE)
   SPECTROSCOPIC ELLIPSOMETRY
   ELECTRICAL-CONDUCTIVITY
   LOCAL-FIELD
   THIN-FILMS
   DISPERSION
   POLYFLUORENE
   DEVICES
Аннотация: The dimension D of a polycrystalline film and the optical anisotropy m = εz/εx of uniaxial crystallites with the principal components εx = εy and εz of the tensor of the dielectric constant have been shown to produce a strong influence on the effective dielectric constant εD* and the effective refractive index nD* = (εD*)1/2 of the film in the optical transparency region, as well as on the boundaries of the intervals BDl ≤ εD* ≤ BDu. The intervals Δ2(m) = B2l–B2u and Δ3(m) = B3l–B3u are separated by a gap for m in the range 1 m 2, whereas the theoretical dependence ε2*(m) is separated by a gap from the interval Δ3(m) for m in the range 1 m 4. This is confirmed by a comparison of the experimental (noP) and theoretical (nD*) ordinary refractive indices for uniaxial polycrystalline films of the conjugated polymer poly(p-phenylene vinylene) (PPV) with uniaxial crystallites and appropriate values of m. In the visible transparency region of the PPV films with a change in m(λ) in the range 2 m(λ) 3 due to the dependence of the components εx,z(λ) on the light wavelength λ, the refractive indices noP2(λ) 3 near the electronic absorption band of the crystallites, the values of εoP(λ) lie in the region of the overlap of the intervals Δ2(m) and Δ3(m). The boundaries mc of the range 1 m mc are determined, for which the interval Δ2(m) is separated by a gap from the dependences ε3*(m) corresponding to the effective medium theory with spherical crystallites and hierarchical models of a polycrystal, as well as from the proposed new dependence ε3*(m).

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Публикация на русском языке Аверьянов, Евгений Михайлович. Влияние размерности поликристаллической пленки и оптической анизотропии кристаллитов на эффективную диэлектрическую проницаемость пленки [Текст] / Е. М. Аверьянов // Физ. тверд. тела : Физико-технический институт им. А. Ф. Иоффе РАН, 2016. - Т. 58 Вып. 8. - С. 1580–1586

Доп.точки доступа:
Аверьянов, Евгений Михайлович
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