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1.


   
    A magnetometer of weak quasi-stationary and high-frequency fields on resonator microstrip transducers with thin magnetic fields / A. N. Babitskii [et al.] // Instrum. Exp. Tech. - 2016. - Vol. 59, Is. 3. - P. 425-432, DOI 10.1134/S0020441216030131. - Cited References: 23. - This study was performed within the framework of the State Job of the Ministry of Education and Science of the Russian Federation for the research at the Siberian Federal University in 2014 (project no. 3.528.2014K). . - ISSN 0020-4412
РУБ Engineering, Multidisciplinary + Instruments & Instrumentation
Рубрики:
Ferromagnetic-resonance
   Films

   Susceptibility

   Anisotropy

   Sensors

   Trends

Аннотация: A high-sensitivity magnetometer for simultaneous measurements of three components of a weak quasi-stationary or high-frequency magnetic-field vector was developed and investigated. Microstrip structures that are based on irregular resonators serve as the magnetometer transducers. An anisotropic thin-film magnetic structure is used as the sensing element. This structure consists of two thin magnetic films that are prepared by magnetron sputtering of a Ni75Fe25 permalloy target and separated by a silicon monoxide layer. It is demonstrated that the transducer exhibits the maximum sensitivity, when the easy magnetization axis of the film structure is orthogonal to the polarization direction of the pumping microwave magnetic field in the microstrip resonator and at an optimal value of a constant magnetic bias field and its optimal deflection from the pumping-field polarization direction which is parallel to it. The magnetometer is characterized by a wide dynamic range of measured magnetic fields, 10–10–10–4 Т, and a wide frequency range, 10–1–105 Hz. © 2016, Pleiades Publishing, Inc.

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Публикация на русском языке Магнитометр слабых квазистационарных и высокочастотных полей на резонансных микрополосковых преобразователях с тонкими магнитными пленками [Текст] / А. Н. Бабицкий [и др.] // Приборы и техн. эксперим. : Наука, 2016. - № 3. - С. 96-104

Держатели документа:
Kirensky Institite of Physics, Siberian Branch, Russian Academy of Sciences, Akademgorodok 50, str. 38, Krasnoyarsk, Russian Federation
Siberian Federal University, pr. Svobodnyi 79, Krasnoyarsk, Russian Federation
Reshetnev Siberian State Aerospace University, pr. Im. Gazety Krasnoyarskii rabochii 31, Krasnoyarsk, Russian Federation
OAO NPP Radiosvyaz’, Krasnoyarsk, Russian Federation

Доп.точки доступа:
Babitskii, A. N.; Belyaev, B. A.; Беляев, Борис Афанасьевич; Boev, N. M.; Боев, Никита Михайлович; Skomorokhov, G. V.; Скоморохов, Георгий Витальевич; Izotov, A. V.; Изотов, Андрей Викторович; Galeev, R. G.
}
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2.


   
    A study of the hysteresis property of the current voltage characteristic in high-temperature superconductors / М. И. Петров [et al.] // Solid State Commun. - 1992. - Vol. 82, Is. 6. - P. 453-456, DOI 10.1016/0038-1098(92)90748-X. - Cited References: 21 . - ISSN 0038-1098
РУБ Physics, Condensed Matter
Рубрики:
HIGH-TC SUPERCONDUCTORS
   YBA2CU3O7-X

   FILMS

Аннотация: Temperature measurements of current-voltage characteristics (CVC) of the (Y, Lu)1Ba2Cu3O7-delta high-temperature superconductor have been performed. Analysis of the data shows that CVC of HTSC is mainly formed by two mechanisms: the creep of the Abrikosov vortices inside the crystallites and the Andreev reflection of the carriers within the metal character boundary between the crystallites.

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Держатели документа:
Институт физики им. Л.В. Киренского СО РАН

Доп.точки доступа:
Петров, Михаил Иванович; Petrov, M. I.; Krivomazov, S. N.; Khrustalev, B. P.; Хрусталев, Борис Петрович; Aleksandrov, K. S.; Александров, Кирилл Сергеевич
}
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3.


   
    A weak-field magnetometer based on a resonator microstrip transducer with thin magnetic films / A. N. Babitskii [et al.] // Tech. Phys. Lett. - 2015. - Vol. 41, Is. 4. - P. 324-327, DOI 10.1134/S1063785015040021. - Cited References:12. - This study was supported by the Ministry of Education and Science of the Russian Federation, state order for Siberian Federal University in 2014, task no. 3.528.2014K. . - ISSN 1063. - ISSN 1090-6533. -
РУБ Physics, Applied

Аннотация: A high-sensitivity magnetometer of weak quasi-stationary magnetic fields is developed and investigated. The magnetometer transducer is a microstrip resonator with an active medium from thin magnetic films prepared by magnetron sputtering of a Ni75Fe25 permalloy target. It is demonstrated that the transducer exhibits the maximum sensitivity not only in the optimal dc magnetic field, but also at the optimal deviation of this field from the rf pump field polarization direction. The magnetometer operates in a wide dynamic range of measured magnetic fields from 10−4 to 10−2 μT at frequencies of 10−1–105 Hz.

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Публикация на русском языке Магнитометр слабых полей на резонаторном микрополосковом преобразователе с тонкими магнитными пленками [Текст] / А. Н. Бабицкий [и др.] // Письма в Журнал технической физики. - Санкт-Петербург : Наука, 2015. - Т. 41 Вып. 7. - С. 36-44

Держатели документа:
Russian Acad Sci, Kirensky Inst Phys, Siberian Branch, Krasnoyarsk 660036, Russia
Siberian Fed Univ, Krasnoyarsk 660041, Russia
Siberian State Aerosp Univ, Krasnoyarsk 660014, Russia
OAO NPP Radiosvyaz, Krasnoyarsk 660021, Russia

Доп.точки доступа:
Babitskii, A. N.; Бабицкий, Александр Николаевич; Belyaev, B. A.; Беляев, Борис Афанасьевич; Skomorokhov, G. V.; Скоморохов, Георгий Витальевич; Izotov, A. V.; Изотов, Андрей Викторович; Galeev, R. G.; Ministry of Education and Science of the Russian Federation, state order for Siberian Federal University [3.528.2014K]
}
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4.


   
    Ab initio LC-DFT study of graphene, multilayer graphenes and graphite / P. V. Avramov [et al.] // Chem. Phys. Lett. - 2011. - Vol. 508, Is. 1-3. - P. 86-89, DOI 10.1016/j.cplett.2011.04.016. - Cited References: 32. - This work was supported by JAEA Research fellowship (P.V.A.). P.V.A. also acknowledges JAEA ASRC and Molecular Spintronics Group for hospitality and fruitful collaboration. . - ISSN 0009-2614
РУБ Chemistry, Physical + Physics, Atomic, Molecular & Chemical
Рубрики:
DENSITY
   NANORIBBONS

   PERFORMANCE

   FUNCTIONALS

   FULLERENE

   COBALT

   FILMS

Аннотация: Atomic structure of graphene, bi-, tri-, tetralayer graphenes and graphite as well was studied using ab initio HSE, LDA and PBE DFT approaches in periodic boundary conditions. Based on comparison of theoretical results with experimental data the performance of the methods was estimated. It was found that long-range corrected HSE potential is the most reliable DFT approximation to reproduce the atomic structure of weakly bound multilayer graphenes and graphite as well. (C) 2011 Elsevier B. V. All rights reserved.

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Держатели документа:
[Avramov, Pavel V.
Sakai, Seiji
Entani, Shiro
Matsumoto, Yoshihiro
Naramoto, Hiroshi] Japan Atom Energy Agcy, Adv Sci Res Ctr, Naka, Ibaraki 3191195, Japan
[Avramov, Pavel V.] LV Kirenskii Inst Phys, SB RAS, Krasnoyarsk 660036, Russia
[Avramov, Pavel V.] Siberian Fed Univ, Krasnoyarsk 660041, Russia

Доп.точки доступа:
Avramov, P. V.; Аврамов, Павел Вениаминович; Sakai, S.; Entani, S.; Matsumoto, Y.; Naramoto, Hiroshi
}
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5.


   
    About the nature of induced anisotropy in amotphous Co-P films / G. S. Patrin [et al.] // Workshop "Trends in Nanomechanics and Nanoengineering" : book of abstracts / предс. сем. K. S. Aleksandrov ; зам. предс. сем.: G. S. Patrin, S. G. Ovchinnikov ; чл. лок. ком.: N. N. Kosyrev, A. S. Fedorov [et al]. - 2009. - P. 30

Материалы семинара

Доп.точки доступа:
Aleksandrov, K. S. \предс. сем.\; Александров, Кирилл Сергеевич; Patrin, G. S. \зам. предс. сем.\; Патрин, Геннадий Семёнович; Ovchinnikov, S. G. \зам. предс. сем.\; Овчинников, Сергей Геннадьевич; Kosyrev, N. N. \чл. лок. ком.\; Косырев, Николай Николаевич; Fedorov, A. S. \чл. лок. ком.\; Федоров, Александр Семенович; Patrin, G. S.; Chzhan, A. V.; Чжан, Анатолий Владимирович; Kiparisov, S. Ya.; Кипарисов, Семен Яковлевич; Seredkin, V. A.; Середкин, Виталий Александрович; Palchik, M. G.; Пальчик, Марина Геннадьевна; "Trends in Nanomechanics and Nanoengineering", workshop(2009 ; Aug. ; 24-28 ; Krasnoyarsk); Сибирский федеральный университет; Институт физики им. Л.В. Киренского Сибирского отделения РАН
}
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6.


   
    Advanced characterization of FeNi-based films for the development of magnetic field sensors with tailored functional parameters / S. V. Komogortsev, I. G. Vazhenina, S. A. Kleshnina [et al.] // Sensors. - 2022. - Vol. 22, Is. 9. - Ст. 3324, DOI 10.3390/s22093324. - Cited References: 35. - This research was funded by the Russian Science Foundation (RSF), project no. 22-29-00980, https://rscf.ru/en/project/22-29-00980/ (accessed on 20 March 2022) . - ISSN 1424-8220
Кл.слова (ненормированные):
magnetic field sensors -- thin films -- multilayered structures -- magnetic anisotropy -- anisotropy distribution -- ferromagnetic resonance -- magnetoimpedance -- high frequency applications
Аннотация: Magnetometry and ferromagnetic resonance are used to quantitatively study magnetic anisotropy with an easy axis both in the film plane and perpendicular to it. In the study of single-layer and multilayer permalloy films, it is demonstrated that these methods make it possible not only to investigate the average field of perpendicular and in-plane anisotropy, but also to characterize their inhomogeneity. It is shown that the quantitative data from direct integral and local measurements of magnetic anisotropy are consistent with the direct and indirect estimates based on processing of the magnetization curves. The possibility of estimating the perpendicular magnetic anisotropy constant from the width of stripe domains in a film in the transcritical state is demonstrated. The average in-plane magnetic anisotropy field of permalloy films prepared by magnetron sputtering onto a Corning glass is almost unchanged with the thickness of a single-layer film. The inhomogeneity of the perpendicular anisotropy field for a 500 nm film is greater than that for a 100 nm film, and for a multilayer film with a total permalloy thickness of 500 nm, it is greater than that for a homogeneous film of the same thickness.

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Держатели документа:
Kirensky Institute of Physics, Federal Research Center KSC SB RAS, Krasnoyarsk, 660036, Russian Federation
Institute of Physics, Siberian Federal University, Krasnoyarsk, 660041, Russian Federation
Department of Magnetism of Solid State, Institute of Natural Sciences and Mathematics, Ural Federal University, Ekaterinburg, 620002, Russian Federation
Laboratory of Advanced Magnetic Materials, Institute of Metal Physics UD RAS, Ekaterinburg, 620108, Russian Federation

Доп.точки доступа:
Komogortsev, S. V.; Комогорцев, Сергей Викторович; Vazhenina, I. G.; Важенина, Ирина Георгиевна; Kleshnina, S. A.; Клешнина, Софья Андреевна; Iskhakov, R. S.; Исхаков, Рауф Садыкович; Lepalovskij, V. N.; Pasynkova, A. A.; Svalov, A. V.
}
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7.


   
    Aligning effect of magnetic field on PDLC films during the phase separation [Text] / A. M. Parshin [et al.] // Proceedings of SPIE - The International Society for Optical EngineeringXV INTERNATIONAL SYMPOSIUM ON ADVANCED DISPLAY TECHNOLOGIES / sponsors: SPIE Russia Chapter, P.N. Lebedev Physical Institute, Russia, Russian Foundation of Basic Research, Society for Information Display, Russia, European Office of Aerospace Research and Development ; XV International Symposium on Advanced Display Technologies (2006 ; 03.10 - 05.10 ; Moscow). - 2007. - 6637. - С. 66370B, DOI 10.1117/12.742662 . - ISBN 0819467847

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Доп.точки доступа:
sponsors: SPIE Russia Chapter, P.N. Lebedev Physical Institute, Russia, Russian Foundation of Basic Research, Society for Information Display, Russia, European Office of Aerospace Research and Development; Parshin, A. M.; Паршин, Александр Михайлович; Zyryanov, V. Ya.; Зырянов, Виктор Яковлевич; Shabanov, V. F.; Шабанов, Василий Филиппович; Nazarov, V. G.; Lapanik, V. I.; Bezborodov, V. S.; XV International Symposium on Advanced Display Technologies(2006 ; 03.10 - 05.10 ; Moscow)
Нет сведений об экземплярах (Источник в БД не найден)
}
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8.


   
    All-optically transformable broad-band transparency and amplification in negative-index films [Текст] / A. K. Popov, S. A. Myslivets // arXiv. - 2008. - Ст. 0808.3130

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Доп.точки доступа:
Popov, A.K.; Myslivets, S.A.
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9.


   
    Allotropic modifications of cobalt upon chemical deposition / A. V. Chzhan, S. A. Podorozhnyak, V. K. Mal’tsev [et al.] // Phys. Solid State. - 2021. - Vol. 63, Is. 1. - P. 42-46, DOI 10.1134/S1063783421010054. - Cited References: 17. - This study was supported in part by the Russian Foundation for Basic Research, project no. 18-02-00161-a . - ISSN 1063-7834
Кл.слова (ненормированные):
Co–P thin magnetic films -- chemical deposition -- nuclear magnetic resonance -- allotropic modifications of Co
Аннотация: The effect of the solution acidity on the crystal structure of cobalt during its chemical deposition is reported. It has been shown using the structural and magnetic examination and nuclear magnetic resonance study that the change in the working solution acidity leads to deposition of cobalt with different allotropic modifications in the nearest environment: the hcp type in the small (up to ~8.5) pH region and the fcc type in the large (over ~8.5) pH region. The formation of these cobalt modifications is attributed to the size effects caused by a decrease in the particle size with increasing pH.

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Публикация на русском языке Аллотропные модификации кобальта при химическом осаждении [Текст] / А. В. Чжан, С. А. Подорожняк, В. К. Мальцев [и др.] // Физ. тверд. тела. - 2021. - Т. 63 Вып. 1. - С. 43-47

Держатели документа:
Siberian Federal University, Krasnoyarsk, 660041, Russian Federation
Krasnoyarsk State Agrarian University, Krasnoyarsk, 660049, Russian Federation
Kirensky Institute of Physics, Krasnoyarsk Scientific Center, Siberian Branch, Russian Academy of Sciences, Krasnoyarsk, 660036, Russian Federation

Доп.точки доступа:
Chzhan, A. V.; Podorozhnyak, S. A.; Mal'tsev, V. K.; Мальцев, Вадим Константинович; Krayukhin, I. N.; Patrin, G. S.; Патрин, Геннадий Семёнович
}
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10.


    Altunin, R. R.
    Effect of the structural properties on the electrical resistivity of the Al/Ag thin films during the solid-state reaction / R. R. Altunin, E. T. Moiseenko, S. M. Zharkov // Phys. Solid State. - 2020. - Vol. 62, Is. 4. - P. 708-713, DOI 10.1134/S1063783420040034. - Cited References: 43. - This study was supported by the Russian Science Foundation, project no. 18-13-00080. . - ISSN 1063-7834. - ISSN 1090-6460
РУБ Physics, Condensed Matter
Рубрики:
LIGHT-EMITTING-DIODES
   PHASE-FORMATION

   AG

   AL

   DIFFUSION

   SUPPRESSION

   INTERFACE

   SURFACE

   GROWTH

   HEAT

Кл.слова (ненормированные):
thin films -- phase formation -- Al/Ag -- solid-state reaction; -- electron diffraction -- resistivity
Аннотация: Based on the results of in situ electron diffraction study of the solid-state reaction and electrical resistivity measurements on the Al/Ag thin films with an atomic ratio of Al : Ag = 1 : 3, the temperature of the reaction onset has been established and a model of the structural phase transitions has been proposed. The solid-state reaction begins at 70°C with the formation of the Al–Ag solid solution at the interface between the aluminum and silver nanolayers. It has been found that, in the course of the reaction, the intermetallic compounds γ-Ag2Al → μ-Ag3Al are successively formed. It is shown that the possibility of the formation of the μ‑Ag3Al phase during the solid-state reaction in the Al/Ag thin films depends on the aluminum-to-silver ratio, while the formation of the μ-Ag3Al phase begins only after all fcc aluminum has reacted.

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Публикация на русском языке Алтунин Р. Р. Влияние структурных свойств на электросопротивление тонких пленок Al/Ag в процессе твердофазной реакции [Текст] / Р. Р. Алтунин, Е. Т. Моисеенко, С. М. Жарков // Физ. тверд. тела. - 2020. - Т. 62 Вып. 4. - С. 621-626

Держатели документа:
Siberian Fed Univ, Krasnoyarsk 660041, Russia.
Russian Acad Sci, Kirensky Inst Phys, Siberian Branch, Krasnoyarsk Sci Ctr, Krasnoyarsk 660036, Russia.

Доп.точки доступа:
Moiseenko, E. T.; Zharkov, S. M.; Жарков, Сергей Михайлович; Russian Science FoundationRussian Science Foundation (RSF) [18-13-00080]
}
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11.


    Altunin, R. R.
    In situ electron microscopy investigations of solid-state synthesis in Al/Au thin bilayer films / R. R. Altunin, S. M. Zharkov // Bull. Russ. Acad. Sci.: Phys. - 2013. - Vol. 77, Is. 8. - P. 1004-1007DOI 10.3103/S1062873813080042
Аннотация: In situ transmission electron microscopy investigations of solid-state synthesis in Al/Au thin bilayer films are conducted. The samples are heated in the column of a transmission electron microscope. The heating temperature is changed from room temperature to 300°C with a heating rate of up to 120°C min−1. It is found that solid-phase synthesis starts at ≈100°C. At 140 ± 5°C, two crystal phases, Al2Au (Fm3m) and AlAu2 (I4/mmm), are simultaneously observed, while at 235 ± 5°C and higher (up to 300°C) only Al2Au phase is detected.

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Электронно-микроскопические in situ исследования процессов твердофазного синтеза в тонких двухслойных пленках Al/Au. - [S. l. : s. n.]


Доп.точки доступа:
Zharkov, S. M.; Жарков, Сергей Михайлович; Алтунин, Роман Русланович
}
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12.


    Altunin, R. R.
    Kinetics of diffusion and phase formation in a solid-state reaction in Al/Au thin films / R. R. Altunin, E. T. Moiseenko, S. M. Zharkov // J. Alloys Compd. - 2024. - Vol. 1002. - Ст. 175500, DOI 10.1016/j.jallcom.2024.175500. - Cited References: 83. - This work was supported by the Russian Science Foundation (grant # 22-13-00313) . - ISSN 0925-8388. - ISSN 1873-4669
Кл.слова (ненормированные):
Thin films -- Solid-state reaction -- Al-Au intermetallic compounds -- In situ electron diffraction -- Phase transformation -- Kinetics
Аннотация: The kinetics of diffusion and formation of Al-Au intermetallic compounds in a solid-state reaction between layers of aluminum and gold has been studied by the method of in situ electron diffraction. The phase sequence in the solid-state reaction in Al/Au thin films is found to depend on the atomic ratio of aluminum and gold at the initial state. Specifically, with the atomic ratio being Al:Au=2:1, one observes the formation sequence: Al3Au8→AlAu2→Al2Au, while with the ratio Al:Au=1:4, the sequence is Al3Au8→AlAu4. The observed change in the sequence is explained using the theoretical model of EHF (Effective Heat of Formation). The kinetic parameters of the diffusion of gold through the layer of reaction products in the Al/Au thin films have been determined, including the apparent activation energy of the diffusion Ea=1.17 eV and pre-exponential factor D0=120 cm2/s. Based on the data obtained by in situ electron diffraction, the kinetic parameters of the phase formation have been estimated by the Kissinger-Akahira-Sunose method. In addition, the kinetic parameters of the formation of the Al-Au intermetallic compounds have been determined (apparent activation energy Ea, pre-exponential factor A) in the solid-state reaction in the Al/Au thin films, namely, Ea = 0.77 eV, log(A, s−1) = 9 for Al3Au8; Ea = 1.08 eV, log(A, s−1) = 13 for AlAu2; Ea = 1.13 eV, log(A, s−1) = 13 for Al2Au; and Ea = 1.35 eV, log(A, s−1) = 16 for the phase AlAu4. The kinetic parameters of the formation of the AlAu4 phase have been estimated for the first time.

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Держатели документа:
Siberian Federal University, 79 Svobodny pr., Krasnoyarsk 660041, Russian Federation
Kirensky Institute of Physics, Federal Research Center KSC SB RAS, Akademgorodok 50/38, Krasnoyarsk 660036, Russian Federation

Доп.точки доступа:
Moiseenko, E. T.; Zharkov, S. M.; Жарков, Сергей Михайлович
}
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13.


    Altunin, R. R.
    Structural phase transformations during a solid-state reaction in a bilayer Al/Fe thin-film nanosystem / R. R. Altunin, E. T. Moiseenko, S. M. Zharkov // Phys. Solid State. - 2020. - Vol. 62, Is. 1. - P. 200-205, DOI 10.1134/S1063783420010059. - Cited References: 36. - This study was supported by the Russian Foundation for Basic Research, project no. 18-03-01173a . - ISSN 1063-7834
Кл.слова (ненормированные):
thin films -- Al/Fe -- solid-state reaction -- phase formation -- electron diffraction
Аннотация: The processes of phase formation during a solid-state reaction between Fe and Al nanolayers have been investigated by the in situ electron diffraction method. It is established that the solid-state reaction at the interface between iron and aluminum nanolayers begins at ≈100°C with the formation of a disordered Al solid solution in α-Fe. It is shown that intermetallic phases (FeAl6 and/or Fe2Al5, FeAl, and Fe3Al) are successively formed upon further heating.

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Публикация на русском языке Алтунин Р. Р. Структурные фазовые превращения при твердофазной реакции в двухслойной тонкопленочной наносистеме Al/Fe [Текст] / Р. Р. Алтунин, Е. Т. Моисеенко, С. М. Жарков // Физ. тверд. тела. - 2020. - Т. 62 Вып. 1. - С. 158-163

Держатели документа:
Siberian Federal University, Krasnoyarsk, 660041, Russian Federation
Kirensky Institute of Physics, Federal Research Center Krasnoyarsk Science Center, Siberian Branch, Russian Academy of Sciences, Krasnoyarsk, 660036, Russian Federation

Доп.точки доступа:
Moiseenko, E. T.; Zharkov, S. M.; Жарков, Сергей Михайлович
}
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14.


    Altunin, R. R.
    Structural phase transformations in Al/Pt bilayer thin films during the solid-state reaction / R. R. Altunin, E. T. Moiseenko, S. M. Zharkov // Phys. Solid State. - 2018. - Vol. 60, Is. 7. - P. 1413-1418, DOI 10.1134/S106378341807003X. - Cited References: 26. - This study was supported by the Russian Foundation for Basic Research, project no. 16-33-00475 mol_a. . - ISSN 1063-7834. - ISSN 1090-6460
РУБ Physics, Condensed Matter
Рубрики:
AL
   SYSTEM

   MULTILAYERS

   ALUMINUM

   HEAT

Аннотация: A sequence of phases forming during the solid-phase reaction in Al/Pt bilayer thin films has been investigated by in situ electron diffraction. It is shown that the amorphous PtAl2 phase forms first during the solid-phase reaction initiated by heating. Upon further heating, PtAl2, Pt2Al3, PtAl, and Pt3Al crystalline phases sequentially form, which is qualitatively consistent with an effective formation heat model. The content of phases forming during the reaction has been quantitatively analyzed and the structural phase transformations have been examined.

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Публикация на русском языке Алтунин, Роман Русланович. Структурные фазовые превращения при твердофазной реакции в тонких двухслойных пленках Al/Pt [Текст] / Р. Р. Алтунин, Е. Т. Моисеенко, С. М. Жарков // Физ. тверд. тела. - 2018. - Т. 60 Вып. 7. - С. 1397–1402

Держатели документа:
Siberian Fed Univ, Krasnoyarsk 660041, Russia.
Russian Acad Sci, Krasnoyarsk Sci Ctr, Kirensky Inst Phys, Siberian Branch, Krasnoyarsk 660036, Russia.

Доп.точки доступа:
Moiseenko, E. T.; Zharkov, S. M.; Жарков, Сергей Михайлович; Russian Foundation for Basic Research [16-33-00475 mol_a]
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15.


   
    Amorphous and Crystalline Nickel Oxide Films Obtained by the Extraction-Pyrolysis Method for Electrochromic Cells / A. L. Belousov, T. N. Patrusheva, A. A. Karacharov [et al.] // Theor. Found. Chem. Eng. - 2020. - Vol. 54, Is. 4. - P. 699-705, DOI 10.1134/S0040579520040041. - Cited References: 8. - This work was performed as part of the program "Research and Development for the Priority Areas of the Russian Science-and-Technology Sector for 2014-2020"; Grant Agreement no. 075-15-2019-1843; the Project Unique Identifier RFMEFI60719X0307 . - ISSN 0040-5795. - ISSN 1608-3431
РУБ Engineering, Chemical
Рубрики:
NIO THIN-FILMS
Кл.слова (ненормированные):
nickel extract -- extraction-pyrolysis technology -- thin film -- annealing -- electrochromic cell
Аннотация: This paper reports studies of thin films of nickel oxide obtained by the extraction–pyrolysis method on glass and quartz substrates at temperatures of 380–600°C. The films have been characterized by atomic force microscopy and X-ray diffraction. It is shown that amorphous and crystalline nickel oxide films are formed on the glass. The grain size depends on the annealing temperature, while increased annealing temperatures lead to recrystallization and a decrease in the grain size in NiO films from 130 to 35 nm.

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Публикация на русском языке Пленки аморфного и кристаллического оксида никеля, полученные экстракционно-пиролитическим методом для электрохромных ячеек [Текст] / А. Л. Белоусов [и др.] // Хим. технол. - 2019. - Т. 20 № 5. - С. 215-221

Держатели документа:
Siberian Fed Univ, Krasnoyarsk 660041, Russia.
Baltic State Tech Univ VOENMEX, St Petersburg 190005, Russia.
Russian Acad Sci, Siberian Branch, Inst Chem & Chem Technol, Krasnoyarsk 660036, Russia.
Russian Acad Sci, Kirensky Inst Phys, Siberian Branch, Krasnoyarsk 660036, Russia.
Russian Acad Sci, Kurnakov Inst Gen & Inorgan Chem, Moscow 119991, Russia.

Доп.точки доступа:
Belousov, A. L.; Patrusheva, T. N.; Karacharov, A. A.; Ivanenko, A. A.; Иваненко, Александр Анатольевич; Kirik, S. D.; Khol'kin, A. I.; program "Research and Development for the Priority Areas of the Russian Science-and-Technology Sector for 2014-2020" [075-15-2019-1843]; [RFMEFI60719X0307]
}
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16.


   
    An analysis of the mechanism of Kerr effect enhancement in Mn/Dy/Bi / S. G. Ovchinnikov [et al.] // Phys. Solid State. - 1999. - Vol. 41, Is. 1. - P. 80-86, DOI 10.1134/1.1130733. - Cited References: 35 . - ISSN 1063-7834
РУБ Physics, Condensed Matter
Рубрики:
ELECTRONIC-STRUCTURE
   THIN-FILMS

   MAGNETIC-PROPERTIES

   RARE-EARTH

   MAGNETOOPTICAL PROPERTIES

   MNBI FILMS

   STABILITY

   GD

Аннотация: A study is reported of the structural, magnetic, and magneto-optic properties of Mn/Dy/Bi films obtained by multilayer technology. The maximum Kerr rotation angle in such films is shown to be theta(k) = 2.25 degrees. Possible reasons for such a large Kerr effect enhancement are considered, namely, an increase in the 6p - 3d transition probability caused by symmetry distortion, polarization of the Bi6p band, and a change in the density of states near the Fermi level. The latter reason has been analyzed by simulating the electronic structure of Mn/Dy/Bi through superposition of Dy levels on the MnBi band structure. This approach has revealed possible additional transitions which may be induced by the presence of a Dy buffer and could contribute to the Kerr magneto-optic effect. (C) 1999 American Institute of Physics. [S1063=7834(99)02001-8].

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Публикация на русском языке Анализ механизма увеличения эффекта Керра в Mn/Dy/Bi [Текст] / С. Г. Овчинников [и др.] // Физ. тверд. тела. - С.-Петербург, 1999. - Т. 41 Вып. 1. - С. 91-97

Держатели документа:
Russian Acad Sci, LV Kirenskii Inst Phys, Siberian Branch, Krasnoyarsk 660036, Russia
ИФ СО РАН

Доп.точки доступа:
Ovchinnikov, S. G.; Овчинников, Сергей Геннадьевич; Burkova, L. V.; Буркова, Людмила Викторовна; Seredkin, V. A.; Середкин, Виталий Александрович; Yakovchuk, V. Y.
}
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17.


   
    Analysis of optical and magnetooptical spectra of Fe5Si3 and Fe3Si magnetic silicides using spectral magnetoellipsometry / S. A. Lyashchenko [et al.] // J. Exp. Theor. Phys. - 2015. - Vol. 120, Is. 5. - P. 886-893, DOI 10.1134/S1063776115050155. - Cited References:31. - This study was financially supported by the Ministry of Education and Science of the Russian Federation (state assignment no. 16.663.2014K, agreement no. 14.604.21.0002 (RFMEFI60414X0002), and contract no. 02.G25.31.0043), the Program is Support of Leading Scientific Schools (project no. NSh-2886.2014.2), and the Russian Foundation for Basic Research (project nos. 13-02-01265 and 14-02-31309). . - ISSN 1063. - ISSN 1090-6509. -
РУБ Physics, Multidisciplinary
Рубрики:
INITIO MOLECULAR-DYNAMICS
   AUGMENTED-WAVE METHOD

   FILMS

   ELLIPSOMETRY

Аннотация: The optical, magnetooptical, and magnetic properties of polycrystalline (Fe5Si3/SiO2/Si(100)) and epitaxial Fe3Si/Si(111) films are investigated by spectral magnetoellipsometry. The dispersion of the complex refractive index of Fe5Si3 is measured using multiangle spectral ellipsometry in the range of 250–1000 nm. The dispersion of complex Voigt magnetooptical parameters Q is determined for Fe5Si3 and Fe3Si in the range of 1.6–4.9 eV. The spectral dependence of magnetic circular dichroism for both silicides has revealed a series of resonance peaks. The energies of the detected peaks correspond to interband electron transitions for spin-polarized densities of electron states (DOS) calculated from first principles for bulk Fe5Si3 and Fe3Si crystals.

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Публикация на русском языке Исследование оптических и магнитооптических спектров магнитных силицидов Fe5Si3 и Fe3Si методом спектральной магнитоэллипсометрии [Текст] / С. А. Лященко [и др.] // Журн. эксперим. и теор. физ. : Наука, 2015. - Т. 147 Вып. 5. - С. 1023–1031

Держатели документа:
Reshetnikov Siberian State Aerosp Univ, Krasnoyarsk 660014, Russia.
Russian Acad Sci, Kirensky Inst Phys, Siberian Branch, Krasnoyarsk 660036, Russia.
Siberian Fed Univ, Krasnoyarsk 660041, Russia.
Russian Acad Sci, Rzhanov Inst Semicond Phys, Siberian Branch, Novosibirsk 630090, Russia.
Russian Acad Sci, Inst Automat & Control Proc, Far East Branch, Vladivostok 690041, Russia.
Far Eastern State Transport Univ, Khabarovsk 680021, Russia.

Доп.точки доступа:
Lyashchenko, S. A.; Лященко, Сергей Александрович; Popov, Z. I.; Попов, Захар Иванович; Varnakov, S. N.; Варнаков, Сергей Николаевич; Popov, E. A.; Molokeev, M. S.; Молокеев, Максим Сергеевич; Yakovlev, I. A.; Яковлев, Иван Александрович; Kuzubov, A. A.; Кузубов, Александр Александрович; Ovchinnikov, S. G.; Овчинников, Сергей Геннадьевич; Shamirzaev, T. S.; Latyshev, A. V.; Saranin, A. A.; Ministry of Education and Science of the Russian Federation [16.663.2014K, 14.604.21.0002 (RFMEFI60414X0002), 02.G25.31.0043]; Russian Foundation for Basic Research [13-02-01265, 14-02-31309]
}
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18.


   
    Angular dependence of the magnetoresistance in Y3/4Lu1/4Ba2Cu3O7-CuO composites at 77 K / D. A. Balaev [et al.] // Tech. Phys. Lett. - 2006. - Vol. 32, Is. 8. - P. 677-679, DOI 10.1134/S1063785006080128. - Cited References: 16 . - ISSN 1063-7850
РУБ Physics, Applied
Рубрики:
CERAMIC SUPERCONDUCTORS
   MAGNETIC-FIELD

   MICROSTRUCTURE

   BOUNDARIES

   TRANSPORT

   MOTION

   FILMS

Аннотация: The angular dependence of the magnetoresistance of polycrystalline Y3/4Lu1/4Ba2Cu3O7-CuO composites has been studied. These composites represent a system of Josephson junctions and exhibit a large magnetoresistance at 77 K. In addition to the isotropic component, there is the angle-dependent component proportional to sin(2)theta, where theta is the angle between the directions of current and magnetic field. This behavior is unambiguous evidence for the process of flux flow in the Josephson medium realized in the composites.

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Держатели документа:
Russian Acad Sci, LV Kirensky Phys Inst, Siberian Div, Krasnoyarsk, Russia
ИФ СО РАН
Kirensky Institute of Physics, Siberian Division, Russian Academy of Sciences, Krasnoyarsk, Russian Federation

Доп.точки доступа:
Balaev, D. A.; Балаев, Дмитрий Александрович; Prus, A. G.; Shaikhutdinov, K. A.; Шайхутдинов, Кирилл Александрович; Petrov, M. I.; Петров, Михаил Иванович
}
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19.


   
    Anisotropic magnetization of an NbN film / D. M. Gokhfeld, N. E. Savitskaya, S. I. Popkov [et al.] // J. Exp. Theor. Phys. - 2022. - Vol. 134, Is. 6. - P. 707-712, DOI 10.1134/S1063776122060097. - Cited References: 31. - We are grateful to I.V. Nemtsev for measurements on the scanning electron microscope, S.A. Skorobogatov for his help in magnetic measurements (scanning electron microscopy and magnetic measurements have been performed at the Krasnoyarsk Regional Collective Usage Center of the Federal Research Center “Krasnoyarsk Scientific Center, Siberian Branch, Russian Academy of Sciences”) . - ISSN 1063-7761
Кл.слова (ненормированные):
Critical currents -- Magnetization -- Niobium compounds -- Nitrogen compounds -- Reactive sputtering -- Scanning electron microscopy -- Superfluid helium -- Anisotropic magnetization -- Columnar structures -- Field orientation -- Film magnetization -- Film surfaces -- Liquid helium temperature -- Magnetization loops -- Niobium nitride films -- Quartz substrate -- Structural and magnetic properties -- Current density
Аннотация: The structural and magnetic properties of a niobium nitride (NbN) film prepared by reactive sputtering onto a quartz substrate are investigated. It is shown using scanning electron microscopy that the film has a columnar structure with a diameter of crystallite columns of about 50 nm. The film magnetization loops are measured for the field orientation parallel and perpendicular to its surface. Based on the experimental data, the critical current densities of the film are estimated in both cases. For the field parallel to the film surface, the estimate is 6.5 × 104 A/cm2 at the liquid helium temperature. For the field perpendicular to the surface, the critical current density is close to the depairing current density (107 A/cm2). Analysis of the results based on different models of magnetic vortex pinning in superconductors shows that in the former case, pinning occurs at the boundaries of columns in the bulk of the sample, while in the latter case, it is determined by the influence of the surface barrier.

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Публикация на русском языке Анизотропная намагниченность пленки NbN [Текст] / Д. М. Гохфельд, Н. Е. Савицкая, С. И. Попков [и др.] // Журн. эксперим. и теор. физ. - 2022. - Т. 161 Вып. 6. - С. 833-839

Держатели документа:
Kirensky Institute of Physics, Krasnoyarsk Scientific Center, Siberian Branch, Russian Academy of Sciences, Krasnoyarsk, 660036, Russian Federation
Siberian Federal University, Krasnoyarsk, 660041, Russian Federation
Konstantinov Petersburg Nuclear Physics Institute, Nation Research Center “Kurchatov Institute”, Leningrad oblast, Gatchina, 188300, Russian Federation
Krasnoyarsk Electric Railway-Carriage Repair Works, Krasnoyarsk, 660021, Russian Federation
Mordovia State University, Saransk, 430000, Russian Federation

Доп.точки доступа:
Gokhfeld, D. M.; Гохфельд, Денис Михайлович; Savitskaya, N. E.; Popkov, S. I.; Kuzmichev, N. D.; Vasyutin, M. A.; Balaev, D. A.; Балаев, Дмитрий Александрович
}
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20.


   
    Anomalous light diffraction by cholesterics encapsulated in films / V. F. Shabanov, S. Ya. Vetrov, G. M. Zharkova, V. M. Khachaturyan // Journal of Molecular Electronics. - 1990. - Vol. 6, Is. 3. - P. 141-144

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Доп.точки доступа:
Shabanov, V. F.; Шабанов, Василий Филиппович; Vetrov, S. Ya.; Ветров, Степан Яковлевич; Zharkova, G. M.; Khachaturyan, V. M.
}
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