Библиотека института физики им. Л.В. Киренского СО РАН

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Вид документа : Статья из сборника (выпуск продолж. издания)
Шифр издания :
Автор(ы) : leskova J., Muzalevskiy K. V., Ruzicka Z.
Заглавие : Arctic lakes thickness measurement in the Lena river delta based on the Sentinel-1 observations
Коллективы : Regional Problems of Earth Remote Sensing, "Региональные проблемы дистанционного зондирования Земли", международная конференция, Сибирский федеральный университет
Место публикации : E3S Web Conf. - 2021. - Vol. 333: Regional Problems of Earth Remote Sensing (RPERS 2021). - Ст.01007. - , DOI 10.1051/e3sconf/202133301007
Примечания : Cited References: 5
Аннотация: In this paper, we investigate the possibilities of ice thickness remote sensing on freshwater lakes based on Sentinel-1 observations. Fr. was selected as a test site. Kurungnakh Island, located in the Lena River delta, was selected as a test site, where 10 lakes with floating and grounded ice were selected. For the test lakes, the time series of backscatting coefficients measured by Sentinel-1 at horizontal-horizontal polarization (EW mode) and at an angle of 18-20 from September 2015 to June 2017 were analyzed. The average lakes ice thickness was estimated based on the Lebedev’s model and air temperature according to the European Center for Medium-Range Weather Forecasts (ECMWF ERA5). It is shown that, the dependence between backscattering coefficient and ice thickness (120-140 cm) can be described a linear function (with a standard deviation of 13.5-25.3 cm and a determination coefficient of 0.70-0.79). The preliminary studies shows that the Sentinel-1 radar data is promising for remote sensing of ice thickness on freshwater arctic lakes.
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Вид документа : Статья из сборника (однотомник)
Шифр издания :
Автор(ы) : Pynko V. G., Pocheluiko A. A., Komalov A. S.
Заглавие : Dependence of coercive force Fe, Ni, Co epitaxial films on thickness temperature and deformation
Коллективы : Академия наук СССР, Научный совет по комплексной проблеме "Физика твердого тела" АН СССР, Институт физики им. Л.В. Киренского Сибирского отделения РАН, Иркутский государственный педагогический институт, International colloquium on physics of magnetic films, Международный коллоквиум по физике магнитных пленок
Место публикации : International colloquium on physics of magnetic films: [program and abstracts]/ chairman L. V. Kirensky ; vice-chaiman: V. A. Buravikhin, R. V. Telesnin ; progr. and publ. com. N. M. Salansky ; progr. com.: V. A. Ignatchenko, Yu. V. Zakharov [et al]. - Irkutsk, 1968. - Session Domain structure. - Ст.4-B.3. - P.52 (Шифр В37/H99-248389966)
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Вид документа : Статья из сборника (однотомник)
Шифр издания :
Автор(ы) : Chzhan A. V., Podorozhnyak S. A., Shahov A. N., Velikanov D. A.
Заглавие : Dependence of coercive force on thickness in three layer films
Коллективы : Российская академия наук, Уральское отделение РАН, Институт физики металлов им. М. Н. Михеева Уральского отделения РАН, Уральский федеральный университет им. первого Президента России Б.Н. Ельцина, Российский фонд фундаментальных исследований, Euro-Asian Symposium "Trends in MAGnetism", "Trends in MAGnetism", Euro-Asian Symposium
Место публикации : Euro-asian symposium "Trends in magnetism" (EASTMAG-2019): Book of abstracts/ чл. конс. ком.: S. G. Ovchinnikov, N. V. Volkov [et al.] ; чл. прогр. ком. D. M. Dzebisashvili [et al.]. - 2019. - Vol. 2. - Ст.J.P39. - P.256-257. - ISBN 978-5-9500855-7-4 (Шифр В33/E12-125657784)
Примечания : Cited References: 7
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Вид документа : Статья из журнала
Шифр издания :
Автор(ы) : Patrin G. S., Turpanov I. A., Zharkov S. M., Velikanov D. A., Maltsev V. K., Li L. A., Lantsev V. V. , Lee C. -G.
Заглавие : Dependence of magnetic properties on ferromagnetic layer thickness in trilayer Co/Ge/Co films with granular semiconducting spacer
Место публикации : J. Magn. Magn. Mater. - 2006. - Vol. 306, Is. 2. - P.218-222. - ISSN 0304-8853, DOI 10.1016/j.jmmm.2006.02.259
Примечания : Cited Reference Count: 8
Аннотация: We have investigated the magnetic properties of trilayer films of Co-Ge-Co. At a fixed thickness of germanium of 3.5 mn, the formation and distribution of metastable amorphous and cubic phases depends on the thickness of the ferromagnetic layer. The portion of the stable hexagonal phase is affected, too. Possible mechanisms for forming the observed magnetic structure are discussed.
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Вид документа : Статья из журнала
Шифр издания :
Автор(ы) : Patrin G. S., Volkov N. V., Ovchinnikov S. G., Eremin E. V., Panova M. A., Varnakov S. N.
Заглавие : Effect of the ferromagnetic layer thickness on the interlayer interaction in Fe/Si/Fe trilayers
Место публикации : JETP Letters. - 2004. - Vol. 80, Is. 7. - P.491-493. - ISSN 0021-3640, DOI 10.1134/1.1839297
Примечания : Cited References: 13
Предметные рубрики: NONMETALLIC SPACER
DEPENDENCE
Аннотация: Three-layer magnetic film systems Fe/Si/Fe have been studied by the method of magnetic resonance. It is established that the ferromagnetic layer thickness affects the magnitude of the interlayer exchange interaction in this system. A mechanism explaining the observed effect is proposed. (C) 2004 MAIK "Nauka/Interperiodica".
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Вид документа : Статья из журнала
Шифр издания :
Автор(ы) : Krakhalev M. N., Prishchepa O. O., Sutormin V. S., Bikbaev R. G., Timofeev I. V., Zyryanov V. Ya.
Заглавие : Electrically induced transformations of defects in cholesteric layer with tangential-conical boundary conditions
Место публикации : Sci. Rep. - 2020. - Vol. 10, Is. 1. - Ст.4907. - ISSN 20452322 (ISSN), DOI 10.1038/s41598-020-61713-9
Примечания : Cited References: 45. - The authors are grateful for the financial support by the Russian Science Foundation (Grant No. 18-72-10036)
Аннотация: Electric-field-induced changes of the orientational structures of cholesteric liquid crystal layer with the tangential-conical boundary conditions have been investigated. The samples with the ratio of the cholesteric layer thickness d to the helix pitch p equalled to 0.57 have been considered. The perpendicularly applied electric field causes a decrease of the azimuthal director angle at the substrate with the conical surface anchoring. In the cells with d = 22 μm, the defect loops having the under-twisted and over-twisted areas are formed. At the defect loop the pair of point peculiarities is observed where the 180° jump of azimuthal angle of the director occurs. Under the action of electric field the loops shrink and disappear. In the cells with d = 13 μm, the over-twisted and under-twisted defect lines are formed. Applied voltage results in the shortening of lines or/and their transformation into a defect of the third type. The director field distribution near defect lines of three types has been investigated by the polarising microscopy techniques. It has been revealed that the length ratio between the over-twisted and third-type defect lines can be controlled by the electric field.
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Вид документа : Статья из журнала
Шифр издания :
Автор(ы) : Chernozatonskii L.A., Sorokin P.B., Kuzubov A.A., Kvashnin A.G., Kvashnin D.G., Avramov P.V., Yakobson B.I., Sorokin B.P.
Заглавие : Influence of Size Effect on the Electronic and Elastic Properties of Diamond Films with Nanometer Thickness
Место публикации : J. Phys. Chem. C. - 2011. - Vol. 115, Is. 1. - P.132-136. - JAN 13. - ISSN 1932-7447, DOI 10.1021/jp1080687
Примечания : Cited Reference Count: 37. - Гранты: L.A.C. was supported by the Russian Academy of Sciences, program No. 21 and by the Russian Foundation for Basic Research (project no. 08-02-01096). P.B.S. and B.I.Y. acknowledge support by the Office of Naval Research (MURI project). P.V.A. and P.B.S. also acknowledge the collaborative RFBR-JSPS grant no. 09-02-92107-R Phi. We are grateful to the Joint Supercomputer Center of the Russian Academy of Sciences for the possibility of using a cluster computer for quantum chemical calculations. The geometry of all presented structures was visualized by commercial Chem-Craft software.Финансирующая организация: Russian Academy of Sciences [21]; Russian Foundation for Basic Research [08-02-01096]; Office of Naval Research (MURI); RFBR-JSPS [09-02-92107-RPhi]
Предметные рубрики: REVERSIBLE HYDROGENATION
GRAPHENE
GRAPHANE
Atomic structure
Band gaps
Diamond nanocrystals
Elastic properties
Electronic band structure calculation
Energy stability
Experimental data
Hydrogen atoms
Nanometer thickness
Size effects
Theoretical result
Diamond films
Elasticity
Carbon films
Ключевые слова (''Своб.индексиров.''): atomic structure--band gaps--diamond nanocrystals--elastic properties--electronic band structure calculation--energy stability--experimental data--hydrogen atoms--nanometer thickness--size effects--theoretical result--diamond films--elasticity--carbon films
Аннотация: The atomic structure and physical properties of few-layered 111 oriented diamond nanocrystals (diamanes), covered by hydrogen atoms from both sides, are studied using electronic band structure calculations. It was shown that energy stability linearly increases upon increasing of the thickness of proposed structures. All 2D carbon films display direct dielectric band gaps with nonlinear quantum confinement response upon the thickness. Elastic properties of diamanes reveal complex dependence upon increasing of the number of 111 layers. All theoretical results were compared with available experimental data.The atomic structure and physical properties of few-layered 〈111〉 oriented diamond nanocrystals (diamanes), covered by hydrogen atoms from both sides, are studied using electronic band structure calculations. It was shown that energy stability linearly increases upon increasing of the thickness of proposed structures. All 2D carbon films display direct dielectric band gaps with nonlinear quantum confinement response upon the thickness. Elastic properties of diamanes reveal complex dependence upon increasing of the number of 〈111〉 layers. All theoretical results were compared with available experimental data. © 2010 American Chemical Society.
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Вид документа : Статья из журнала
Шифр издания :
Автор(ы) : Edelman I. S., Patrin G. S., Velikanov D. A., Chernichenko A. V., Turpanov I. A., Bondarenko G. V.
Заглавие : Interface effect on the magnetic properties of Ni-Ge bilayer films
Место публикации : JETP Letters. - 2008. - Vol. 87, Is. 5. - P.262-265. - ISSN 0021-3640, DOI 10.1134/S0021364008050081
Примечания : Cited References: 12
Предметные рубрики: LAYER THICKNESS
CO/GE/CO FILMS
DEPENDENCE
Аннотация: Magnetic and magneto-optical properties of the Ni-Ge bilayer films are studied. The unusual temperature behavior of the magnetization curves is revealed: the hysteresis loops at room temperature have a near-rectangular shape; when the films are cooled down to 4.2 K, the coercive force increases by more than an order of magnitude and the asymmetry and displacement of the loop along the field axis are observed. These effects are stronger in thinner Ni layers. The observed features are attributed to the effect of the interlayer between the Ni and Ge layers, which has a complex magnetic structure.
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Вид документа : Статья из журнала
Шифр издания :
Автор(ы) : Patrin G. S., Yakovchuk V.Yu., Velikanov D. A., Patrin K. G., Yarikov S. A.
Заглавие : Interlayer interactions in FeNi/Bi/FeNi trilayers
Место публикации : Bull. Russ. Acad. Sci.: Phys.: Allerton Press, 2012. - Vol. 76, Is. 2. - P.177-179. - ISSN 1062-8738
Примечания : Cited References: 5. - This study was supported by the Russian Foundation for Basic Research, project no. 110200675a.
Ключевые слова (''Своб.индексиров.''): giant magnetoresistance effect--interlayer interactions--spacer thickness--squid magnetometry--trilayers--magnetic resonance--bismuth
Аннотация: Interlayer interactions in FeNi/Bi/FeNi films are studied experimentally. It is established by SQUID magnetometry and magnetic resonance investigations that the interlayer interaction in these films is determined by the bismuth spacer thickness and temperature. A giant magnetoresistance effect is observed in the investigated trilayers. © 2012 Allerton Press, Inc.
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10.

Вид документа : Статья из журнала
Шифр издания :
Автор(ы) : Chzhan A. V., Patrin G. S., Kiparisov S. Y., Seredkin V. A., Burkova L. V., Velikanov D. A.
Заглавие : Magnetic and magneto-optical properties of Co-P films prepared by chemical deposition
Место публикации : J. Magn. Magn. Mater. - 2011. - Vol. 323, Is. 20. - P.2493-2496. - OCT. - ISSN 0304-8853, DOI 10.1016/j.jmmm.2011.05.024
Примечания : Cited Reference Count: 22. - Гранты: This study was supported by the Russian Foundation for Basic Research, Project no. 08-02-00397a and the departmental target program Development of Scientific Potential of Higher Education, 2009-2010, Project no. 2.1.1./4399.Финансирующая организация: Russian Foundation for Basic Research [08-02-00397a]; departmental target program Development of Scientific Potential of Higher Education [2.1.1./4399]
Предметные рубрики: SPECTROSCOPY
THICKNESS
COBALT
Ключевые слова (''Своб.индексиров.''): co-p films--chemically deposition--the polar kerr and faraday effects--hysteresis loops--chemically deposition--cop films--hysteresis loops--the polar kerr and faraday effects--chemical deposition--chemically deposition--co films--cop films--film magnetization--film surface morphology--incident light--magnetic and magneto-optical properties--magnetic layers--polar kerr effect--polar-kerr--polycrystalline--underlayers--chemical analysis--faraday effect--hysteresis loops--kerr magnetooptical effect--light reflection--magnetic materials--optical kerr effect--palladium--cobalt
Аннотация: Features in the formation of chemically deposited polycrystalline Co-P films with thicknesses of a few nanometers are established by analyzing film surface morphology and variation in the film magnetization. It is shown that in the thickness range below 30 nm the polar Kerr effect value OK changes nonmonotonically and depends on a wavelength of the incident light. For the films thicker than 30 nm, this value depends weakly on both the thickness and the wavelength. These features in the OK behavior are attributed to the Faraday effect, which is revealed at small thicknesses upon light reflection from the lower surface of a magnetic layer. It is found that the Faraday effect in the Co-P films exceeds that in the Co films by a factor of more than two. This effect is assumed to be caused by the presence of a Pd underlayer in the samples under study. (C) 2011 Elsevier BY. All rights reserved.
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