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Вид документа : Статья из журнала
Шифр издания :
Автор(ы) : Greben'kova Yu.E., Chernichenko A. V., Velikanov D. A., Turpanov I. A., Mukhamedzhanov E. Kh., Zubavichus Y. V., Cherkov A. K., Patrin G. S.
Заглавие : Ni-Ge nanostructures: Role of the interface and the magnetic properties
Место публикации : Phys. Solid State: MAIK Nauka-Interperiodica / Springer, 2012. - Vol. 54, Is. 7. - P.1494-1500. - ISSN 1063-7834
Примечания : Cited References: 17. - This study was supported by the Russian Foundation for Basic Research (project nos. 11-02-00675 and 11-02-00972). The synchrotron investigations were performed on equipment of the Center for Collective Use "Kurchatov Center for Synchrotron Radiation and Nanotechnology" (state contract no. 16.552.11.7003).
Предметные рубрики: FILMS
PHASE
FeGe
Аннотация: The surface morphology and local structure of layers in the Ni-Ge and Ge-Ni-Ge-Ni-Ge films have been investigated. It has been shown that the surface of the films follows the roughnesses of the substrate surface, which have characteristic dimensions of 2–4 nm in height and ∼100 nm in plane. It has been found that an interface with the depth ranging from 9 to 18 nm is formed at the boundaries between the Ni and Ge layers. The data obtained have been used to explain the specific features of the magnetic properties of the studied films, such as the asymmetry of hysteresis loops at low temperatures and the difference between the temperature dependences of the magnetization of the samples for two cooling modes: in a magnetic field and without a magnetic field.
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