Поисковый запрос: (<.>S=GAS<.>) |
Общее количество найденных документов : 10
Показаны документы с 1 по 10 |
1.
| Superconductivity in repulsive fermi-systems at low density/M. Y. Kagan [et al.] // Journal of Superconductivity and Novel Magnetism:SPRINGER, 2013. т.Vol. 26,N Is. 9.-С.2809-2815
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2.
| Kohn-Luttinger effect and anomalous pairing in repulsive Fermi-systems at low density/M. Y. Kagan [et al.] // Low Temperature Physics:American Institute of Physics, 2012. т.Vol. 38,N Is. 9.-С.874-879
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3.
| Study of interaction between transition metal atoms and bigraphene monovacancy by means of quantum chemistry/A. A. Kuzubov [et al.] // Computational Materials Science:Elsevier, 2016. т.Vol. 112, Part A.-С.269-275
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4.
| Effect of electron correlations on the structure of photoprotein substrates/S. G. Ovchinnikov [et al.] // JETP Letters, 2010. т.Vol. 91,N Is. 9.-С.490-493
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5.
| Chernozatonskii L. A. Electronic superlattices and waveguides based on graphene: structures, properties and applications/L. A. Chernozatonskii, P. B. Sorokin // , 2008. т.Vol. 245,N Is. 10.-С.2086-2089
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6.
| Kolovsky A. R. Transport of cold atoms in optical lattices/A. R. Kolovsky // European Physical Journal-Special Topics:Springer, 2007. т.Vol. 151.-С.103-112
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7.
| Chernozatonskii L. A. Two-dimensional semiconducting nanostructures based on single graphene sheets with lines of adsorbed hydrogen atoms/L. A. Chernozatonskii, P. B. Sorokin, J. W. Bruning // Applied Physics Letters, 2007. т.Vol. 91,N Is. 18.- Ст.183103
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8.
| Sadreev A. F. Electron transmission through an ac biased quantum point contact/A. F. Sadreev, K. .. Davlet-Kildeev // PHYSICAL REVIEW B:AMER PHYSICAL SOC, 2007. т.Vol. 75,N Is. 23.- Ст.235309
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9.
| Jauho A. P. Simulations of interference effects in gated two-dimensional ballistic electron systems/A. P. Jauho, K. N. Pichugin, A. F. Sadreev // PHYSICAL REVIEW B:AMERICAN PHYSICAL SOC, 1999. т.Vol. 60,N Is. 11.-С.8191-8198
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10.
| Electrical properties of thin In2O3/C films/I. V. Babkina, M. N. Volochaev, O. V. Zhilova [et al.] // Inorganic Materials, 2020. т.Vol. 56,N Is. 4.-С.374-381
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