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Вид документа : Статья из журнала
Шифр издания :
Автор(ы) : Patrin G. S., Maltsev V. K., Krayukhin I. N., Turpanov I. A.
Заглавие : NMR studies of the magnetic state of interfacial cobalt in (Co/Ge)(n) films
Коллективы : Russian Foundation for Basic Research [11-02-00675-a]
Место публикации : J. Exp. Theor. Phys.: MAIK NAUKA/INTERPERIODICA/SPRINGER, 2013. - Vol. 117, Is. 6. - P.1097-1100. - ISSN 1063-7761, DOI 10.1134/S1063776113140033. - ISSN 1090-6509
Примечания : Cited References: 19. - We thank L. A. Li for the help in preparing the films and G. V. Bondarenko for the X-ray measurements. This work was supported by the Russian Foundation for Basic Research (project no. 11-02-00675-a).
Предметные рубрики: SUPERLATTICES
DEPENDENCE
THICKNESS
SPACER
LAYER
Аннотация: The results of NMR studies of film structures in a cobalt-germanium system as a function of the cobalt layer thickness are presented. Two phases of cobalt, one is a face-centered cubic phase and the other is presumably a Co-Ge alloy with a weakly ferromagnetic order, have been found to exist. A "dead" layer no more than 2 nm in thickness is formed at the interface.
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Вид документа : Статья из журнала
Шифр издания :
Автор(ы) : Gritsenko, C.h., Dzhun I., Volochaev M. N., Gorshenkov M., Babaytsev G., Chechenin N., Sokolov A. Е., Tretiakov, Oleg A., Rodionova V.
Заглавие : Temperature-dependent magnetization reversal in exchange bias NiFe/IrMn/NiFe structures
Коллективы : Russian Foundation for Basic Research (RFBR) [17-32-50170]; MEXT, Japan [17 K05511, 17H05173]; Center for Science and Innovation in Spintronics (Core Research Cluster), Tohoku University; JSPS; RFBR under the Japan-Russian Research Cooperative Program; Ministry of Education and Science of the Russian Federation [3.9002.2017/6.7]
Место публикации : J. Magn. Magn. Mater. - 2019. - Vol. 482. - P.370-375. - ISSN 0304-8853, DOI 10.1016/j.jmmm.2019.03.044. - ISSN 1873-4766(eISSN)
Примечания : Cited References: 55. - Ch. G. and M. G. acknowledge financial support by the Russian Foundation for Basic Research (RFBR grant. 17-32-50170). Ch. G. acknowledges the 5 top 100 Russian Academic Excellence Project at the Immanuel Kant Baltic Federal University. O.A.T. acknowledges support by the Grants-in-Aid for Scientific Research (Grant Nos. 17 K05511 and 17H05173) from MEXT, Japan, by the grant of the Center for Science and Innovation in Spintronics (Core Research Cluster), Tohoku University, by JSPS and RFBR under the Japan-Russian Research Cooperative Program. V.R. acknowledges the Ministry of Education and Science of the Russian Federation in the framework of government assignment 3.9002.2017/6.7. Electron microscopy examination was carried out at the Center for Collective Use of the Krasnoyarsk Scientific Center of the Siberian Branch of the Russian Academy of Sciences. We also thank Montserrat Rivas for helpful discussions.
Предметные рубрики: COERCIVITY
FILM
ROUGHNESS
THICKNESS
HEADS
IRMN
Аннотация: We demonstrate magnetization reversal features in NiFe/IrMn/NiFe thin-film structures with 40% and 75% relative content of Ni in Permalloy in the temperature range from 80 K to 300 K. The magnetization reversal sequence of the two ferromagnetic layers is found to depend on the type of NiFe alloy. In the samples with 75% relative content of Ni, the bottom ferromagnetic layer reverses prior to the top one. On the contrary, in the samples with 40% of Ni, the top ferromagnetic layer reverses prior to the bottom one. These tendencies of magnetization reversal are preserved in the entire range of temperatures. These distinctions can be explained by the morphological and structural differences of interfaces in the samples based on two types of Permalloy.
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Вид документа : Статья из журнала
Шифр издания :
Автор(ы) : Chzhan A. V., Patrin G. S., Kiparisov S. Y., Seredkin V. A., Burkova L. V., Velikanov D. A.
Заглавие : Magnetic and magneto-optical properties of Co-P films prepared by chemical deposition
Место публикации : J. Magn. Magn. Mater. - 2011. - Vol. 323, Is. 20. - P.2493-2496. - OCT. - ISSN 0304-8853, DOI 10.1016/j.jmmm.2011.05.024
Примечания : Cited Reference Count: 22. - Гранты: This study was supported by the Russian Foundation for Basic Research, Project no. 08-02-00397a and the departmental target program Development of Scientific Potential of Higher Education, 2009-2010, Project no. 2.1.1./4399.Финансирующая организация: Russian Foundation for Basic Research [08-02-00397a]; departmental target program Development of Scientific Potential of Higher Education [2.1.1./4399]
Предметные рубрики: SPECTROSCOPY
THICKNESS
COBALT
Ключевые слова (''Своб.индексиров.''): co-p films--chemically deposition--the polar kerr and faraday effects--hysteresis loops--chemically deposition--cop films--hysteresis loops--the polar kerr and faraday effects--chemical deposition--chemically deposition--co films--cop films--film magnetization--film surface morphology--incident light--magnetic and magneto-optical properties--magnetic layers--polar kerr effect--polar-kerr--polycrystalline--underlayers--chemical analysis--faraday effect--hysteresis loops--kerr magnetooptical effect--light reflection--magnetic materials--optical kerr effect--palladium--cobalt
Аннотация: Features in the formation of chemically deposited polycrystalline Co-P films with thicknesses of a few nanometers are established by analyzing film surface morphology and variation in the film magnetization. It is shown that in the thickness range below 30 nm the polar Kerr effect value OK changes nonmonotonically and depends on a wavelength of the incident light. For the films thicker than 30 nm, this value depends weakly on both the thickness and the wavelength. These features in the OK behavior are attributed to the Faraday effect, which is revealed at small thicknesses upon light reflection from the lower surface of a magnetic layer. It is found that the Faraday effect in the Co-P films exceeds that in the Co films by a factor of more than two. This effect is assumed to be caused by the presence of a Pd underlayer in the samples under study. (C) 2011 Elsevier BY. All rights reserved.
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