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Comparative analysis of characteristic electron energy loss spectra and inelastic scattering cross-section spectra of Fe / A. S. Parshin [et al.] // Phys. Solid State. - 2016. - Vol. 58, Is. 5. - P. 908-914, DOI 10.1134/S106378341605019X. - Cited References: 29 . - ISSN 1063-7834

РУБ Physics, Condensed Matter
Рубрики:
Loss-spectroscopy
   Quantitative-analysis
   Iron
   Si
   Ge
Аннотация: The inelastic electron scattering cross section spectra of Fe have been calculated based on experimental spectra of characteristic reflection electron energy loss as dependences of the product of the inelastic mean free path by the differential inelastic electron scattering cross section on the electron energy loss. It has been shown that the inelastic electron scattering cross-section spectra have certain advantages over the electron energy loss spectra in the analysis of the interaction of electrons with substance. The peaks of energy loss in the spectra of characteristic electron energy loss and inelastic electron scattering cross sections have been determined from the integral and differential spectra. It has been shown that the energy of the bulk plasmon is practically independent of the energy of primary electrons in the characteristic electron energy loss spectra and monotonically increases with increasing energy of primary electrons in the inelastic electron scattering cross-section spectra. The variation in the maximum energy of the inelastic electron scattering cross-section spectra is caused by the redistribution of intensities over the peaks of losses due to various excitations. The inelastic electron scattering cross-section spectra have been analyzed using the decomposition of the spectra into peaks of the energy loss. This method has been used for the quantitative estimation of the contributions from different energy loss processes to the inelastic electron scattering cross-section spectra of Fe and for the determination of the nature of the energy loss peaks. © 2016, Pleiades Publishing, Ltd.

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Публикация на русском языке Сравнительный анализ спектров характеристических потерь энергии электронов и спектров сечения неупругого рассеяния в Fe [Текст] / А. С. Паршин [и др.] // Физ. тверд. тела : Физико-технический институт им. А. Ф. Иоффе РАН, 2016. - Т. 58 Вып. 5. - С. 881–887

Держатели документа:
Siberian State Aerospace University, ul. Gazety Krasnoyarskii Rabochii 31, Krasnoyarsk, Russian Federation
Institute of Chemistry and Chemical Technology, Siberian Branch, Russian Academy of Sciences, Akademgorodok 50/24, Krasnoyarsk, Russian Federation
Rzhanov Institute of Semiconductor Physics, Siberian Branch, Russian Academy of Sciences, pr. Akademika Lavrent’eva 13, Novosibirsk, Russian Federation
Kirensky Institute of Physics, Siberian Branch, Russian Academy of Sciences, Akademgorodok 50/38, Krasnoyarsk, Russian Federation

Доп.точки доступа:
Parshin, A. S.; Igumenov, A. Y.; Mikhlin, Y. L.; Pchelyakov, O. P.; Zhigalov, V. S.; Жигалов, Виктор Степанович
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Reflection electron-energy-loss spectroscopy of FexSi1-x thin films / A. S. Parshin [et al.] // Tech. Phys. Lett. - 2008. - Vol. 34, Is. 5. - P. 381-383, DOI 10.1134/S1063785008050064. - Cited References: 13. - This study was supported within the framework of the “Spintronics” Program of the Department of Physics of the Russian Academy of Sciences (project no. 2007-3-1.3-24-01-286) and the Russian Foundation for Basic Research (project no. 07-03-00320) . - ISSN 1063-7850

РУБ Physics, Applied
Рубрики:
SCATTERING CROSS-SECTIONS
   LOSS SPECTRA
   QUANTITATIVE-ANALYSIS
   SURFACE
Аннотация: The values of the product of the inelastic mean free path and the differential cross section for inelastic scattering of electrons have been determined from the reflection electron-energy-loss spectra of thin films of the FexSi1-x system (0

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Публикация на русском языке Спектроскопия характеристических потерь энергии отраженных электронов в тонких пленках системы Fe[x]Si[1-x] [Текст] / А. С. Паршин [и др.] // Письма в журн. техн. физ. - 2008. - Т. 34 Вып. 9. - С. 41-48

Держатели документа:
Siberian State Aerosp Univ, Krasnoyarsk 660014, Russia
Russian Acad Sci, Inst Semicond Phys, Siberian Branch, Novosibirsk 630090, Russia
Russian Acad Sci, LV Kirensky Phys Inst, Siberian Branch, Krasnoyarsk 660036, Russia
ИФ СО РАН

Доп.точки доступа:
Parshin, A. S.; Alexandrova, G. A.; Dolbak, A. E.; Pchelyakov, O. P.; Ol'shanetski, B. Z.; Ovchinnikov, S. G.; Овчинников, Сергей Геннадьевич; Kushchenkov, S. A.
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Electron spectroscopy of iron disilicide / A. S. Parshin [et al.] // Tech. Phys. - 2016. - Vol. 61, Is. 9. - P. 1418-1422, DOI 10.1134/S1063784216090176. - Cited References: 33 . - ISSN 1063-7842

РУБ Physics, Applied
Рубрики:
SCATTERING CROSS-SECTIONS
   ENERGY-LOSS SPECTROSCOPY
   QUANTITATIVE-ANALYSIS
   LOSS SPECTRA
   SURFACE
   SI
   HETEROSTRUCTURES
   INTERFACE
   PARAMETER
   PHASE
Аннотация: We have reported on the results of a complex investigation of iron disilicide FeSi2 using characteristic electron energy loss spectroscopy, inelastic electron scattering cross section spectroscopy, and X-ray photoelectron spectroscopy. It has been shown that the main peak in the spectra of inelastic electron scattering for FeSi2 is a superposition of two unresolved peaks, viz., surface and bulk plasmons. An analysis of the fine structure of the spectra of inelastic electron scattering cross section by their decomposition into Lorentzlike Tougaard peaks has made it possible to quantitatively estimate the contributions of individual energy loss processes to the resulting spectrum and determine their origin and energy. © 2016, Pleiades Publishing, Ltd.

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Публикация на русском языке Исследование дисилицида железа методами электронной спектроскопии [Текст] / А. С. Паршин [и др.] // Журн. техн. физ. : Физико-технический институт им. А. Ф. Иоффе РАН, 2016. - Т. 86 Вып. 9. - С. 136–140

Держатели документа:
Rechetnev Siberian State Aerospace University, ul. Krasnoyarskii rabochii 31, Krasnoyarsk, Russian Federation
Institute of Chemistry and Chemical Technology, Siberian Branch, Russian Academy of Sciences, Akademgorodok 50/24, Krasnoyarsk, Russian Federation
Rzhanov Institute of Semiconductor Physics, Siberian Branch, Russian Academy of Sciences, pr. Akademika Lavrent’eva 13, Novosobirsk, Russian Federation
Kirensky Institute of Physics, Siberian Branch, Russian Academy of Sciences, Akademgorodor 50/38, Krasnoyarsk, Russian Federation

Доп.точки доступа:
Parshin, A. S.; Igumenov, A. Y.; Mikhlin, Y. L.; Pchelyakov, O. P.; Zhigalov, V. S.; Жигалов, Виктор Степанович
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