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Kolovsky, A. R.
Topological phase transitions in tilted optical lattices / A. R. Kolovsky // Phys. Rev. A. - 2018. - Vol. 98, Is. 1. - Ст. 013603, DOI 10.1103/PhysRevA.98.013603. - Cited References: 17 . - ISSN 2469-9926. - ISSN 2469-9934

РУБ Optics + Physics, Atomic, Molecular & Chemical
Рубрики:
BLOCH OSCILLATIONS
   REALIZATION
   BANDS
   MODEL
Аннотация: We analyze the energy spectrum and eigenstates of cold atoms in a tilted brick-wall optical lattice. When the tilt is applied, the system exhibits a sequence of topological phase transitions reflected in an abrupt change of the eigenstates. It is demonstrated that these topological phase transitions can be easily detected in a laboratory experiment by observing Bloch oscillations of cold atoms.

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Держатели документа:
RAS, VL Kirensky Inst Phys SB, Krasnoyarsk 660036, Russia.
Siberian Fed Univ, Sch Engn Phys & Radio Elect, Krasnoyarsk 660041, Russia.

Доп.точки доступа:
Коловский, Андрей Радиевич
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Low cost embedded copper mesh Based on cracked template for highly durability transparent EMI shielding films / A. S. Voronin, Y. V. Fadeev, M. O. Makeev [et al.] // Materials. - 2022. - Vol. 15, Is. 4. - Ст. 1449, DOI 10.3390/ma15041449. - Cited References: 55. - This research work was supported by the Ministry of Science and Higher Education of the Russian Federation within the framework of state tasks No. 0287-2021-0026 and No. 0705-2020-0032 . - ISSN 1996-1944

РУБ Chemistry, Physical + Materials Science, Multidisciplinary + Metallurgy & Metallurgical Engineering + Physics, Applied + Physics, Condensed Matter
Рубрики:
PERFORMANCE
   REALIZATION
   ELECTRODE
   NANOMESH
   PATTERN
Кл.слова (ненормированные):
transparent electromagnetic interference (EMI) shielding films -- cracked template -- electroplating -- photocurable resin -- embedded mesh -- durability
Аннотация: Embedded copper mesh coatings with low sheet resistance and high transparency were formed using a low-cost Cu seed mesh obtained with a magnetron sputtering on a cracked template, and subsequent operations electroplating and embedding in a photocurable resin layer. The influence of the mesh size on the optoelectric characteristics and the electromagnetic shielding efficiency in a wide frequency range is considered. In optimizing the coating properties, a shielding efficiency of 49.38 dB at a frequency of 1 GHz, with integral optical transparency in the visible range of 84.3%, was obtained. Embedded Cu meshes have been shown to be highly bending stable and have excellent adhesion strength. The combination of properties and economic costs for the formation of coatings indicates their high prospects for practical use in shielding transparent objects, such as windows and computer monitors.

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Держатели документа:
Russian Acad Sci, Dept Mol Elect, Fed Res Ctr, Krasnoyarsk Sci Ctr,Siberian Branch,FRC,KSC,SB,RA, Krasnoyarsk 660036, Russia.
Siberian Fed Univ, Sch Engn & Construct, Krasnoyarsk 660041, Russia.
Bauman Moscow State Syst Univ, Lab EMI Shielding Mat, Moscow 105005, Russia.
Russian Acad Sci, Lab Reinforced Plast, NN Semenov Fed Res Ctr Chem Phys, Moscow 119991, Russia.
Siberian Fed Univ, Sch Nonferrous Met & Mat Sci, Krasnoyarsk 660041, Russia.
Reshetnev Siberian Univ Sci & Technol, Dept Aircraft, Krasnoyarsk 660037, Russia.
Siberian Fed Univ, Sch Engn Phys & Radio Elect, Krasnoyarsk 660041, Russia.
Russian Acad Sci, Lab Radiospectroscopy & Spintron, LV Kirensky Phys Inst, Siberian Branch, Krasnoyarsk 660036, Russia.
Reshetnev Siberian Univ Sci & Technol, Sci & Training Ctr Space Res, Krasnoyarsk 660037, Russia.
Reshetnev Siberian Univ Sci & Technol, High Technol Inst, Krasnoyarsk 660037, Russia.
Tomsk Polytech Univ, Lab Radiat & Plasma Technol, Tomsk 634050, Russia.
Russian Acad Sci, Lab Radiophoton, Siberian Branch, VE Zuev Inst Atmospher Opt, Tomsk 634055, Russia.
Russian Acad Sci, Lab Photon Mol Syst, LV Kirensky Phys Inst, Siberian Branch, Krasnoyarsk 660036, Russia.
LLC Res & Prod Co Spectehnauka, Krasnoyarsk 660043, Russia.

Доп.точки доступа:
Voronin, Anton S.; Fadeev, Yurii V.; Makeev, Mstislav O.; Mikhalev, Pavel A.; Osipkov, Alexey S.; Provatorov, Alexander S.; Ryzhenko, Dmitriy S.; Yurkov, Gleb Y.; Simunin, Mikhail M.; Karpova, Darina V.; Lukyanenko, A. V.; Лукьяненко, Анна Витальевна; Kokh, Dieter; Bainov, Dashi D.; Tambasov, I. A.; Тамбасов, Игорь Анатольевич; Nedelin, Sergey V.; Zolotovsky, Nikita A.; Khartov, Stanislav V.; Ministry of Science and Higher Education of the Russian Federation [0705-2020-0032]; [0287-2021-0026]
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