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    Weak localization and size effects in thin In2O3 films prepared by autowave oxidation / I. A. Tambasov [et al.] // Physica E. - 2016. - Vol. 84. - P. 162-167, DOI 10.1016/j.physe.2016.06.005. - Cited References:70. - This study was supported by the Russian Foundation for Basic Research (Grants # 16-32-00302 MOJI_a, # 15-02-00948-A, # 16-03-00069-A), by the Council for Grants of the President of the Russian Federation (SP-317.2015.1), and by the Program of Foundation for Promotion of Small Enterprises in Science and Technology (No. 6662 Gamma Y2015, 9607 Gamma Y/2015) ("UMNIK" Program). Electron microscopic studies were performed on the equipment of CCU KSC SB RAS. . - ISSN 1386-9477. - ISSN 1873-1759
   Перевод заглавия: Слабая локализация и размерные эффекты в тонких пленках In2O3 приготовленные автоволновым окислением

РУБ Nanoscience & Nanotechnology + Physics, Condensed Matter
Рубрики:
SOLID-STATE SYNTHESIS
   INDIUM TIN OXIDE
   DOPED ZNO FILMS
   OPTICAL-PROPERTIES
   MAGNETIC-FIELD
   NEGATIVE MAGNETORESISTANCE
   CARBON NANOTUBES
   TEMPERATURE
   SEMICONDUCTOR
   TRANSPORT
Кл.слова (ненормированные):
Thin indium oxide films -- Weak localization -- Electron-electron -- interaction -- Disordered semiconductors -- Nanostructured films -- Phase-coherent length
Аннотация: The negative magnetoresistance of thin In2O3 films, obtained by an autowave oxidation reaction, was detected within a temperature range of 4.2-80 K. The magnetoresistance was -1.35% at a temperature of 4.2 K and an external magnetic field of 1 T. A weak localization theory was used to explain the negative magnetoresistance and to determine the phase-coherence length in a temperature range of 4.2-80 K. The phase-coherence length was found to oscillate as the temperatures increased to around 30 K. From the maximum and minimum values of the oscillation of the phase-coherence length, it was suggested that the In2O3 film has two structure characteristic parameters. Transmission electron microscopy showed the structure of the thin In2O3 film to have structural features of a crystal phase- amorphous phase. It was found that the crystalline phase characteristic size was consistent with the maximum phase-coherence length and the amorphous phase characteristic size was consistent with the minimum phase-coherence length. It has been suggested that the temperature measurements of the magnetoresistance and the theory of weak localization can be used to evaluate the structural features of nanocomposite or nanostructured thin films. (C) 2016 Elsevier B.V. All rights reserved.

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Держатели документа:
Russian Acad Sci, Siberian Branch, Kirensky Inst Phys, Akademgorodok 50, Krasnoyarsk 660036, Russia.
Siberian Fed Univ, Svobodny Prospect 79, Krasnoyarsk 660041, Russia.
Reshetnev Siberian State Aerosp Univ, Krasnoyarsk Worker 31, Krasnoyarsk 660014, Russia.

Доп.точки доступа:
Tambasov, I. A.; Тамбасов, Игорь Анатольевич; Tarasov, A. S.; Тарасов, Антон Сергеевич; Volochaev, M. N.; Волочаев, Михаил Николаевич; Rautskii, M. V.; Рауцкий, Михаил Владимирович; Myagkov, V. G.; Мягков, Виктор Григорьевич; Bykova, L. E.; Быкова, Людмила Евгеньевна; Zhigalov, V. S.; Жигалов, Виктор Степанович; Matsynin, A. A.; Мацынин, Алексей Александрович; Tambasova, E. V.; Russian Foundation for Basic Research [16-32-00302 MOJI_a, 15-02-00948-A, 16-03-00069-A]; Council for Grants of the President of the Russian Federation [SP-317.2015.1]; Program of Foundation for Promotion of Small Enterprises in Science and Technology ("UMNIK" Program) [6662GammaY2015, 9607GammaY/2015]
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Electrosound and asymmetry of the I-V characteristic induced by ultrasound in the RexMn1-xS (Re = Tm, Yb) / S. Aplesnin, M. Sitnikov, O. Romanova [et al.] // Eur. Phys. J. Plus. - 2022. - Vol. 137, Is. 2. - Ст. 226, DOI 10.1140/epjp/s13360-022-02432-0. - Cited References: 46. - This study was supported by the Russian Foundation for Basic Research and the Belarussian Republic Foundation for Basic Research (Project No. 20-52-00005). The investigation ofmicrostructural properties of the sampleswas carried out using equipment's (SEM and TEM) the Krasnoyarsk Regional Center of Research Equipment of Federal Research Center " Krasnoyarsk Science Center SB RAS". The authors are grateful to A.V. Shabanov, senior researcher of the Laboratory of Molecular Spectroscopy, Kirensky Institute of Physics, for the scanning electron microscopy investigations . - ISSN 2190-5444

РУБ Physics, Multidisciplinary
Рубрики:
ACOUSTIC CHARGE-TRANSPORT
   WAVES
   SEMICONDUCTOR
   ATTENUATION
Аннотация: A correlation between the temperatures corresponding to the maxima of the sound attenuation and temperature resistance coefficient in the RexMn1-xS solid solutions related to the condensation of electrons and holes has been established. X-ray diffraction, energy-dispersive X-ray spectrum, and scanning electron microscope techniques have been used to investigate the microstructure of the samples. In the Yb0.2Mn0.8S compound, a decrease in the ultrasound attenuation with increasing temperature has been observed. The functional dependences of the electrosound on the ultrasound intensity and carrier type and the change in the electrosound sign with temperature have been established. The asymmetry of the I-V characteristic depending on the ultrasound intensity and the attenuation coefficient depending on the electric field has been found. The nonlinear attenuation of the ultrasound as a function of the intensity has been observed. Model of elastic and inelastic scattering of current carriers by acoustic phonons, deformation interaction is used to explain the asymmetry.

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Держатели документа:
Fed Res Ctr KSC SB RAS, Kirensky Inst Phys, Krasnoyarsk 660036, Russia.
Reshetnev Siberian State Univ Sci & Technol, Krasnoyarsk 660037, Russia.

Доп.точки доступа:
Aplesnin, S. S.; Аплеснин, Сергей Степанович; Sitnikov, Maxim; Romanova, O. B.; Романова, Оксана Борисовна; Kharkov, Anton; Begisheva, Olga; Zelenov, Fyodor; Russian Foundation for Basic ResearchRussian Foundation for Basic Research (RFBR); Belarussian Republic Foundation for Basic Research [20-52-00005]
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