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    Micromagnetic analysis of edge effects in a thin magnetic film during local excitation of magnetization oscillations / B. A. Belyaev, A. V. Izotov, G. V. Skomorokhov, P. N. Solovev // Russ. Phys. J. - 2020. - Vol. 63, Is. 5. - P. 837-843, DOI 10.1007/s11182-020-02106-3. - Cited References: 19. - This research was performed with financial support of the Russian Foundation for Basic Research within the research project No. 18-32-00086 . - ISSN 1064-8887. - ISSN 1573-9228
Рубрики:
ANISOTROPIES
   SIMULATIONS
   FIELDS
Кл.слова (ненормированные):
micromagnetic simulation -- thin magnetic film -- edge effects -- ferromagnetic resonance -- magnetic anisotropy
Аннотация: The method of numerical micromagnetic simulation was used to study the magnetization dynamics of a thin film with uniaxial magnetic anisotropy during ferromagnetic resonance (FMR) excitation in it on the local sites by a linearly polarized high-frequency magnetic field emitted from the 1 mm opening in the metallic screen of the transmission line. It was established that non-uniformities of demagnetizing fields emerging near the film edges lead not only to the change in the FMR field, but also to the change in the value and direction of the uniaxial anisotropy field. The distribution of non-uniformities of the magnetic anisotropy characteristics over the area of 60 nm thick permalloy film that was measured on the scanning FMR spectrometer agrees well with the micromagnetic simulation results. Demagnetizing fields were proved to be the main cause for the edge effects in magnetic films.

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Публикация на русском языке Микромагнитный анализ краевых эффектов в тонкой магнитной пленке при локальном возбуждении колебаний намагниченности [Текст] / Б. А. Беляев, А. В. Изотов, Г. В. Скоморохов, П. Н. Соловьев // Изв. вузов. Физика. - 2020. - Т. 63 № 5. - С. 116-121

Держатели документа:
Russian Acad Sci, Siberian Branch, LV Kirensky Inst Phys, Krasnoyarsk Sci Ctr, Krasnoyarsk, Russia.
Siberian Fed Univ, Krasnoyarsk, Russia.

Доп.точки доступа:
Belyaev, B. A.; Беляев, Борис Афанасьевич; Izotov, A. V.; Изотов, Андрей Викторович; Skomorokhov, G. V.; Скоморохов, Георгий Витальевич; Solovev, P. N.; Соловьев, Платон Николаевич
}
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Magnetic properties of permalloy thin film edges / B. A. Belyaev, N. M. Boev, A. V. Izotov [et al.] // Russ. Phys. J. - 2020. - Vol. 63, Is. 1. - P. 16-22, DOI 10.1007/s11182-020-01997-6. - Cited References: 23. - This work was supported by the Ministry of Science and Higher Education of the Russian Federation (Project No. 02.G25.31.0313). . - ISSN 1064-8887. - ISSN 1573-9228
Рубрики:
ANISOTROPIES
Кл.слова (ненормированные):
magnetic thin film -- ferromagnetic resonance -- edge effects -- magnetic anisotropy
Аннотация: The paper presents the results of ferromagnetic resonance (FMR) spectrometry of magnetic properties of nanocrystalline thin films obtained by magnetron sputtering of permalloy targets of various composition (NixFe1-x, x = 0.6-0.85). The behavior of the main magnetic properties of the thin film edges is analyzed. Near the film edges, not only the fluctuation of the uniaxial magnetic anisotropy field is observed, but also a drastic widening of the FMR line and the decrease in the effective saturation magnetization.

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Публикация на русском языке Особенности поведения магнитных характеристик вблизи краев тонких пермаллоевых пленок [Текст] / Б. А. Беляев, Н. М. Боев, А. В. Изотов [и др.] // Изв. вузов. Физика. - 2020. - Т. 63 № 1. - С. 17-23

Держатели документа:
Russian Acad Sci, Kirensky Inst Phys, Siberian Branch, Krasnoyarsk, Russia.
Siberian Fed Univ, Krasnoyarsk, Russia.

Доп.точки доступа:
Belyaev, B. A.; Беляев, Борис Афанасьевич; Boev, N. M.; Боев, Никита Михайлович; Izotov, A. V.; Изотов, Андрей Викторович; Skomorokhov, G. V.; Скоморохов, Георгий Витальевич; Solovev, P. N.; Соловьев, Платон Николаевич; Ministry of Science and Higher Education of the Russian Federation [02, G25.31.0313]
}
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Small-angle scattering and radiation polarization by a stretched polymer film with nematic liquid crystal droplets having a single-domain structure / V. A. Loiko, A. V. Konkolovich, A. A. Miskevich [et al.] // Opt. Spectrosc. - 2020. - Vol. 128, Is. 3. - P. 331-338, DOI 10.1134/S0030400X20030121. - Cited References: 24. - This work was carried out within the framework of the agreement on interacademic collaboration between the National Academy of Sciences of Belarus and Siberian Branch of the Russian Academy of Sciences. It was supported by the Belarusian Republican Foundation for Fundamental Research (project no. F18RA-003). M.N. Krakhalev acknowledges the support of the Russian Foundation for Basic Research, the Government of Krasnoyarsk krai, and Krasnoyarsk Krai Foundation of Science (grant no. 18-42-243006). . - ISSN 0030-400X. - ISSN 1562-6911

РУБ Optics + Spectroscopy
Рубрики:
IONIC MODIFICATION
LIGHT
Кл.слова (ненормированные):
light scattering -- radiation polarization -- liquid crystal
Аннотация: The coefficient of directed transmittance of a stretched polymer-dispersed liquid crystal film with a defect-free single-domain liquid crystal droplet structure formed by a stretched surfactant-doped film and the polarization degree of forward-transmitted light in the visible and near-infrared spectrum ranges are studied. Results are presented for the 5CB, E7, and E44 nematic liquid crystals. Dependences of the transmission coefficient and polarizing ability of the film on the photodetector field of view are studied. Relationships allowing one to determine film parameters at which the transmission coefficient and polarizing ability of the films simultaneously reach values close to limit ones (0.5 and ±1.0, respectively) are obtained in the Foldy–Twersky and anomalous diffraction approximations.

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Публикация на русском языке Малоугловое рассеяние и поляризация излучения вытянутой полимерной пленкой с каплями нематического жидкого кристалла, имеющими монодоменную структуру [Текст] / В. А. Лойко, А. В. Конколович, А. А. Мискевич, М. Н. Крахалев // Оптика и спектроскопия. - 2020. - Т. 128 Вып. 3. - С. 343-350

Держатели документа:
Natl Acad Sci Belarus, Stepanov Inst Phys, Minsk 220072, BELARUS.
Russian Acad Sci, Siberian Branch, Kirensky Inst Phys, Krasnoyarsk 660036, Russia.
Siberian Fed Univ, Inst Engn Phys & Radio Elect, Krasnoyarsk 660041, Russia.

Доп.точки доступа:
Loiko, V. A.; Konkolovich, A. V.; Miskevich, A. A.; Krakhalev, M. N.; Крахалев, Михаил Николаевич; Prishchepa, O. O.; Прищепа, Оксана Олеговна; Zyryanov, V. Ya.; Зырянов, Виктор Яковлевич; Belarusian Republican Foundation for Fundamental Research [F18RA-003]; Russian Foundation for Basic ResearchRussian Foundation for Basic Research (RFBR); Government of Krasnoyarsk krai; Krasnoyarsk Krai Foundation of Science [18-42-243006]
}
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    Micromagnetic simulation of domain structure in thin permalloy films with in-plane and perpendicular anisotropy / P. N. Solovev, A. V. Izotov, B. A. Belyaev, N. M. Boev // Physica B. - 2020. - Vol. 604. - Ст. 412699, DOI 10.1016/j.physb.2020.412699. - Cited References: 31. - This work was supported by the Ministry of Science and Higher Education of the Russian Federation , agreement number 075-11-2019-054 dated 22.11.2019 . - ISSN 0921-4526
   Перевод заглавия: Микромагнитное моделирование доменной структуры тонких пермаллоевых пленок с одноосной планарной и перпендикулярной анизотропией
Кл.слова (ненормированные):
Micromagnetic simulation -- Thin magnetic film -- Magnetic anisotropy -- Stripe domains -- Hysteresis loop -- Saturation field
Аннотация: We investigate the domain structure formation and magnetization processes in thin permalloy films with in-plane and perpendicular magnetic anisotropy by using micromagnetic simulation. We show that the films of thicknesses less than a critical value Lcr are in the monodomain state, and their magnetization processes are specified by the in-plane anisotropy. Above the critical thickness Lcr, the perpendicular anisotropy dominates, leading to the formation of the stripe domain structure that significantly complicates the magnetization reversal. The values of the critical thickness, parameters of the domain structure, and the saturation field obtained from the micromagnetic simulations are compared with the corresponding values calculated using analytical expressions derived by Murayama in the framework of the domain structures theory.

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Держатели документа:
Kirensky Institute of Physics, Federal Research Center KSC SB RAS, 50/38 Akademgorodok, Krasnoyarsk, 660036, Russian Federation
Siberian Federal University, 79 Svobodny pr., Krasnoyarsk, 660041, Russian Federation

Доп.точки доступа:
Solovev, P. N.; Соловьев, Платон Николаевич; Izotov, A. V.; Изотов, Андрей Викторович; Belyaev, B. A.; Беляев, Борис Афанасьевич; Boev, N. M.; Боев, Никита Михайлович
}
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Effect of Heat Treatment on the Stability of Nanosized (Co40Fe40B20)34(SiO2)66/ZnO/In2O3 Multilayers / I. V. Babkina, M. N. Volochaev, O. V. Zhilova [et al.] // Bull. Russ. Acad. Sci. Phys. - 2020. - Vol. 84, Is. 9. - P. 1100-1103, DOI 10.3103/S1062873820090051. - Cited References: 11. - This work was supported by the RF Ministry of Science and Higher Education as part of State Task no. FZGM-2020-0007 . - ISSN 1062-8738
Кл.слова (ненормированные):
After-heat treatment -- Binary alloys -- Film preparation -- II-VI semiconductors -- Ion beams -- Magnetic semiconductors -- Multilayers -- Oxide minerals -- Semiconducting indium compounds -- Semiconducting silicon compounds -- Semiconducting zinc compounds -- Silica -- Silicon -- Sputtering -- Wide band gap semiconductors -- Zinc oxide
Аннотация: An investigation is performed of the thermal stability and phase transformations of thin-film heterogeneous [(Co40Fe40B20)34(SiO2)66/ZnO/In2O3]85 multilayers obtained via ion beam sputtering. The system contains 85 layers, each consisting of a (Co40Fe40B20)34(SiO2)66 composite layer and ZnO and In2O3 semiconductor spacers. The sample structure in the initial state and after heat treatment is studied by means of X-ray diffraction. It is shown that the samples are stable at temperatures of up to 500°С. Zn2SiO4, InBO3, CoFe, and In2O3 phases form during annealing.

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Публикация на русском языке Влияние термообработки на стабильность наноразмерных многослойных структур (Co40Fe40B20)34(SiO2)66/ZnO/In2O3 [Текст] / И. В. Бабкина, М. Н. Волочаев, О. В. Жилова [и др.] // Изв. РАН. Сер. физич. - 2020. - Т. 84 № 9. - С. 1293-1296

Держатели документа:
Voronezh State Technical University, Voronezh, 394026, Russian Federation
Kirensky Institute of Physics, Krasnoyarsk Scientific Center, Siberian Branch, Russian Academy of Sciences, Krasnoyarsk, 660036, Russian Federation

Доп.точки доступа:
Babkina, I. V.; Volochaev, M. N.; Волочаев, Михаил Николаевич; Zhilova, O. V.; Kalinin, Y. E.; Kashirin, M. A.; Sitnikov, A. V.; Chehonadskih, M. V.; Yanchenko, L. I.
}
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Amorphous and Crystalline Nickel Oxide Films Obtained by the Extraction-Pyrolysis Method for Electrochromic Cells / A. L. Belousov, T. N. Patrusheva, A. A. Karacharov [et al.] // Theor. Found. Chem. Eng. - 2020. - Vol. 54, Is. 4. - P. 699-705, DOI 10.1134/S0040579520040041. - Cited References: 8. - This work was performed as part of the program "Research and Development for the Priority Areas of the Russian Science-and-Technology Sector for 2014-2020"; Grant Agreement no. 075-15-2019-1843; the Project Unique Identifier RFMEFI60719X0307 . - ISSN 0040-5795. - ISSN 1608-3431

РУБ Engineering, Chemical
Рубрики:
NIO THIN-FILMS
Кл.слова (ненормированные):
nickel extract -- extraction-pyrolysis technology -- thin film -- annealing -- electrochromic cell
Аннотация: This paper reports studies of thin films of nickel oxide obtained by the extraction–pyrolysis method on glass and quartz substrates at temperatures of 380–600°C. The films have been characterized by atomic force microscopy and X-ray diffraction. It is shown that amorphous and crystalline nickel oxide films are formed on the glass. The grain size depends on the annealing temperature, while increased annealing temperatures lead to recrystallization and a decrease in the grain size in NiO films from 130 to 35 nm.

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Публикация на русском языке Пленки аморфного и кристаллического оксида никеля, полученные экстракционно-пиролитическим методом для электрохромных ячеек [Текст] / А. Л. Белоусов [и др.] // Хим. технол. - 2019. - Т. 20 № 5. - С. 215-221

Держатели документа:
Siberian Fed Univ, Krasnoyarsk 660041, Russia.
Baltic State Tech Univ VOENMEX, St Petersburg 190005, Russia.
Russian Acad Sci, Siberian Branch, Inst Chem & Chem Technol, Krasnoyarsk 660036, Russia.
Russian Acad Sci, Kirensky Inst Phys, Siberian Branch, Krasnoyarsk 660036, Russia.
Russian Acad Sci, Kurnakov Inst Gen & Inorgan Chem, Moscow 119991, Russia.

Доп.точки доступа:
Belousov, A. L.; Patrusheva, T. N.; Karacharov, A. A.; Ivanenko, A. A.; Иваненко, Александр Анатольевич; Kirik, S. D.; Khol'kin, A. I.; program "Research and Development for the Priority Areas of the Russian Science-and-Technology Sector for 2014-2020" [075-15-2019-1843]; [RFMEFI60719X0307]
}
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Komogortsev, S. V.
Magnetic behavior of nanocrystalline magnetic film in a rotating field / S. V. Komogortsev, V. A. Fel'k // Euro-asian symposium "Trends in magnetism" (EASTMAG-2019) : Book of abstracts / чл. конс. ком.: S. G. Ovchinnikov, N. V. Volkov [et al.] ; чл. прогр. ком. D. M. Dzebisashvili [et al.]. - 2019. - Vol. 1. - Ст. C.P20. - P. 304. - Cited References: 2. - Support by Russian Foundation for Basic Research, Government of Krasnoyarsk Territory, Krasnoyarsk Region Science and Technology Support Fund to the research project no. 18-42-240006 is acknowledged . - ISBN 978-5-9500855-7-4

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Держатели документа:
Kirensky Institute of Physics, Federal Research Center KSC SB RAS, Krasnoyarsk, Russia
Reshetnev Siberian State University of Science and Technology, Krasnoyarsk, Russia

Доп.точки доступа:
Ovchinnikov, S. G. \чл. конс. ком.\; Овчинников, Сергей Геннадьевич; Volkov, N. V. \чл. конс. ком.\; Волков, Никита Валентинович; Dzebisashvili, D. M. \чл. прогр. ком.\; Дзебисашвили, Дмитрий Михайлович; Fel'k, V. A.; Комогорцев, Сергей Викторович; Российская академия наук; Уральское отделение РАН; Институт физики металлов им. М. Н. Михеева Уральского отделения РАН; Уральский федеральный университет им. первого Президента России Б.Н. Ельцина; Российский фонд фундаментальных исследований; Euro-Asian Symposium "Trends in MAGnetism"(7 ; 2019 ; Sept. ; 8-13 ; Ekaterinburg); "Trends in MAGnetism", Euro-Asian Symposium(7 ; 2019 ; Sept. ; 8-13 ; Ekaterinburg)
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    Magnetic properties of Fe–Bi film structures / G. S. Patrin [et al.] // Euro-asian symposium "Trends in magnetism" (EASTMAG-2019) : Book of abstracts / чл. конс. ком.: S. G. Ovchinnikov, N. V. Volkov [et al.] ; чл. прогр. ком. D. M. Dzebisashvili [et al.]. - 2019. - Vol. 1. - Ст. C.P31. - P. 320. - These studies are carried out with the financial support of RFBR (grant No. 18-02-00161-a) . - ISBN 978-5-9500855-7-4
   Перевод заглавия: Магнитные свойства пленочных структур Fe-Bi

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Держатели документа:
Kirensky Institute of Physics, Federal Research Center KSC SB RAS, Krasnoyarsk, Russia
Siberian Federal University, Krasnoyarsk, Russia

Доп.точки доступа:
Ovchinnikov, S. G. \чл. конс. ком.\; Овчинников, Сергей Геннадьевич; Volkov, N. V. \чл. конс. ком.\; Волков, Никита Валентинович; Dzebisashvili, D. M. \чл. прогр. ком.\; Дзебисашвили, Дмитрий Михайлович; Patrin, G. S.; Патрин, Геннадий Семёнович; Yakovchuk, V. Yu.; Яковчук, Виктор Юрьевич; Yarikov, S. A.; Яриков, Станислав Алексеевич; Shiyan, Ya. G.; Шиян, Ярослав Германович; Furdyk, V. P.; Российская академия наук; Уральское отделение РАН; Институт физики металлов им. М. Н. Михеева Уральского отделения РАН; Уральский федеральный университет им. первого Президента России Б.Н. Ельцина; Российский фонд фундаментальных исследований; Euro-Asian Symposium "Trends in MAGnetism"(7 ; 2019 ; Sept. ; 8-13 ; Ekaterinburg); "Trends in MAGnetism", Euro-Asian Symposium(7 ; 2019 ; Sept. ; 8-13 ; Ekaterinburg)
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    The role of the semiconductor layer in the exchange-bias film structure of CoNi / Si / FeNi / Si with a spin spring effect / A. V. Kobyakov [et al.] // J. Phys. Conf. Ser. - 2019. - Vol. 1389, Is. 1. - Ст. 012028, DOI 10.1088/1742-6596/1389/1/012028. - Cited References: 13. - These studies are conducted with financial support from the Russian Foundation for Basic Research (grant No.18-02-00161-a). . - ISSN 1742-6588. - ISSN 1742-6596
   Перевод заглавия: Роль полупроводникового слоя в структуре пленок обменного смещения CoNi / Si / FeNi / Si с эффектом спиновой пружины
Аннотация: CoNi / Si / FeNi / Si structures were synthesized by ion-plasma sputtering. A negative hysteresis loop bias was detected at the thickness of the silicon layer was less than 2 nm and the temperature was less than 100 K. A positive hysteresis loop bias was detected at the thickness of the silicon layer was more than 2 nm and the temperature greater than 100K.

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Держатели документа:
Siberian Federal University, prospect Svobodny, 79, Krasnoyarsk, 660041, Russia
L.V. Kirensky Institute of Physics of Siberian Branch of Russian Academy of Sciences, Krasnoyarsk, 660036, Russia

Доп.точки доступа:
Kobyakov, A. V.; Кобяков, Александр Васильевич; Turpanov, I. A.; Турпанов, Игорь Александрович; Patrin, G. S.; Патрин, Геннадий Семёнович; Yushkov, V. I.; Юшков, Василий Иванович; Yarikov, S. A.; Яриков, Станислав Алексеевич; Volochaev, M. N.; Волочаев, Михаил Николаевич; Zhivaya, Ya. A.; Euro-Asian Symposium "Trends in MAGnetism"(7 ; 2019 ; Sept. ; 8-13 ; Ekaterinburg)
}
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10.

Transport and magnetic phenomena in ZnO-С thin-film heterostructures / M. N. Volochaev, A. B. Granovsky, O. V. Zhilova [et al.] // Superlattices Microstruct. - 2020. - Vol. 140. - Ст. 106449, DOI 10.1016/j.spmi.2020.106449. - Cited References: 36. - The work was supported by the Ministry of Education and Science of Russia (project No. 3.1867.2017/4.6 ) and the RFBR (project No. 19-07-00471). The work was partially funded by the Academy of Finland . - ISSN 0749-6036
Кл.слова (ненормированные):
Zinc oxide -- Amorphous carbon -- Multi-layered structures -- Composites -- Hopping conductivity -- Weak localization -- Magnetoresistance
Аннотация: ZnO- and C-based heterostructures were fabricated by the layer-by-layer deposition technique using the ion-beam sputtering process. Structure, electrical and magnetic properties of fabricated heterostructures are discussed. The two-phase (ZnO and C) films are evolved into a multilayer structure, consisting of amorphous carbon and crystalline ZnO layers when the bilayer thickness increases. When carbon is added to ZnO, its electrical resistivity reduces. The conduction mechanism changes from the variable-range hopping in a narrow energy band to the nearest neighbors hopping in ZnO–C films with a thickness of h ˂ 150 nm. The temperature dependence of conductivity changes from the Arrhenius-like to logarithmic law, indicating that the strong charge localization turns into a weak one when the film thickness is about 150 nm. The negative magnetoresistance of up to 1% was detected at 77 K. The film ferromagnetism at the temperature of 10 K was not found.

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Держатели документа:
Kirensky Institute of Physics, Krasnoyarsk660036, Russian Federation
Lomonosov Moscow State University, Moscow119991, Russian Federation
Voronezh State Technical University, Voronezh394026, Russian Federation
National Research Centre ‘‘Kurchatov Institute”, Moscow123182, Russian Federation
Voronezh State University, Voronezh394003, Russian Federation
Lappeenranta-Lahti University of Technology, Lappeenranta FI53851, Finland

Доп.точки доступа:
Volochaev, M. N.; Волочаев, Михаил Николаевич; Granovsky, A. B.; Zhilova, O. V.; Kalinin, Y. E.; Ryl'kov, V. V.; Sumets, M. P.; Makagonov, V. A.; Pankov, S. Y.; Sitnikov, A. V.; Fadeev, E.; Lahderanta, E.; Foshin, V.
}
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