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Advanced characterization of FeNi-based films for the development of magnetic field sensors with tailored functional parameters / S. V. Komogortsev, I. G. Vazhenina, S. A. Kleshnina [et al.] // Sensors. - 2022. - Vol. 22, Is. 9. - Ст. 3324, DOI 10.3390/s22093324. - Cited References: 35. - This research was funded by the Russian Science Foundation (RSF), project no. 22-29-00980, https://rscf.ru/en/project/22-29-00980/ (accessed on 20 March 2022) . - ISSN 1424-8220
Кл.слова (ненормированные):
magnetic field sensors -- thin films -- multilayered structures -- magnetic anisotropy -- anisotropy distribution -- ferromagnetic resonance -- magnetoimpedance -- high frequency applications
Аннотация: Magnetometry and ferromagnetic resonance are used to quantitatively study magnetic anisotropy with an easy axis both in the film plane and perpendicular to it. In the study of single-layer and multilayer permalloy films, it is demonstrated that these methods make it possible not only to investigate the average field of perpendicular and in-plane anisotropy, but also to characterize their inhomogeneity. It is shown that the quantitative data from direct integral and local measurements of magnetic anisotropy are consistent with the direct and indirect estimates based on processing of the magnetization curves. The possibility of estimating the perpendicular magnetic anisotropy constant from the width of stripe domains in a film in the transcritical state is demonstrated. The average in-plane magnetic anisotropy field of permalloy films prepared by magnetron sputtering onto a Corning glass is almost unchanged with the thickness of a single-layer film. The inhomogeneity of the perpendicular anisotropy field for a 500 nm film is greater than that for a 100 nm film, and for a multilayer film with a total permalloy thickness of 500 nm, it is greater than that for a homogeneous film of the same thickness.

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Держатели документа:
Kirensky Institute of Physics, Federal Research Center KSC SB RAS, Krasnoyarsk, 660036, Russian Federation
Institute of Physics, Siberian Federal University, Krasnoyarsk, 660041, Russian Federation
Department of Magnetism of Solid State, Institute of Natural Sciences and Mathematics, Ural Federal University, Ekaterinburg, 620002, Russian Federation
Laboratory of Advanced Magnetic Materials, Institute of Metal Physics UD RAS, Ekaterinburg, 620108, Russian Federation

Доп.точки доступа:
Komogortsev, S. V.; Комогорцев, Сергей Викторович; Vazhenina, I. G.; Важенина, Ирина Георгиевна; Kleshnina, S. A.; Клешнина, Софья Андреевна; Iskhakov, R. S.; Исхаков, Рауф Садыкович; Lepalovskij, V. N.; Pasynkova, A. A.; Svalov, A. V.
}
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Altunin, R. R.
Effect of the structural properties on the electrical resistivity of the Al/Ag thin films during the solid-state reaction / R. R. Altunin, E. T. Moiseenko, S. M. Zharkov // Phys. Solid State. - 2020. - Vol. 62, Is. 4. - P. 708-713, DOI 10.1134/S1063783420040034. - Cited References: 43. - This study was supported by the Russian Science Foundation, project no. 18-13-00080. . - ISSN 1063-7834. - ISSN 1090-6460

РУБ Physics, Condensed Matter
Рубрики:
LIGHT-EMITTING-DIODES
   PHASE-FORMATION
   AG
   AL
   DIFFUSION
   SUPPRESSION
   INTERFACE
   SURFACE
   GROWTH
   HEAT
Кл.слова (ненормированные):
thin films -- phase formation -- Al/Ag -- solid-state reaction; -- electron diffraction -- resistivity
Аннотация: Based on the results of in situ electron diffraction study of the solid-state reaction and electrical resistivity measurements on the Al/Ag thin films with an atomic ratio of Al : Ag = 1 : 3, the temperature of the reaction onset has been established and a model of the structural phase transitions has been proposed. The solid-state reaction begins at 70°C with the formation of the Al–Ag solid solution at the interface between the aluminum and silver nanolayers. It has been found that, in the course of the reaction, the intermetallic compounds γ-Ag2Al → μ-Ag3Al are successively formed. It is shown that the possibility of the formation of the μ‑Ag3Al phase during the solid-state reaction in the Al/Ag thin films depends on the aluminum-to-silver ratio, while the formation of the μ-Ag3Al phase begins only after all fcc aluminum has reacted.

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Публикация на русском языке Алтунин Р. Р. Влияние структурных свойств на электросопротивление тонких пленок Al/Ag в процессе твердофазной реакции [Текст] / Р. Р. Алтунин, Е. Т. Моисеенко, С. М. Жарков // Физ. тверд. тела. - 2020. - Т. 62 Вып. 4. - С. 621-626

Держатели документа:
Siberian Fed Univ, Krasnoyarsk 660041, Russia.
Russian Acad Sci, Kirensky Inst Phys, Siberian Branch, Krasnoyarsk Sci Ctr, Krasnoyarsk 660036, Russia.

Доп.точки доступа:
Moiseenko, E. T.; Zharkov, S. M.; Жарков, Сергей Михайлович; Russian Science FoundationRussian Science Foundation (RSF) [18-13-00080]
}
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Altunin, R. R.
Structural phase transformations during a solid-state reaction in a bilayer Al/Fe thin-film nanosystem / R. R. Altunin, E. T. Moiseenko, S. M. Zharkov // Phys. Solid State. - 2020. - Vol. 62, Is. 1. - P. 200-205, DOI 10.1134/S1063783420010059. - Cited References: 36. - This study was supported by the Russian Foundation for Basic Research, project no. 18-03-01173a . - ISSN 1063-7834
Кл.слова (ненормированные):
thin films -- Al/Fe -- solid-state reaction -- phase formation -- electron diffraction
Аннотация: The processes of phase formation during a solid-state reaction between Fe and Al nanolayers have been investigated by the in situ electron diffraction method. It is established that the solid-state reaction at the interface between iron and aluminum nanolayers begins at ≈100°C with the formation of a disordered Al solid solution in α-Fe. It is shown that intermetallic phases (FeAl6 and/or Fe2Al5, FeAl, and Fe3Al) are successively formed upon further heating.

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Публикация на русском языке Алтунин Р. Р. Структурные фазовые превращения при твердофазной реакции в двухслойной тонкопленочной наносистеме Al/Fe [Текст] / Р. Р. Алтунин, Е. Т. Моисеенко, С. М. Жарков // Физ. тверд. тела. - 2020. - Т. 62 Вып. 1. - С. 158-163

Держатели документа:
Siberian Federal University, Krasnoyarsk, 660041, Russian Federation
Kirensky Institute of Physics, Federal Research Center Krasnoyarsk Science Center, Siberian Branch, Russian Academy of Sciences, Krasnoyarsk, 660036, Russian Federation

Доп.точки доступа:
Moiseenko, E. T.; Zharkov, S. M.; Жарков, Сергей Михайлович
}
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CoPt-Al2O3 nanocomposite films: synthesis, structure, and magnetic properties / V. S. Zhigalov, L. E. Bykova, V. G. Myagkov [et al.] // J. Surf. Ingestig. - 2020. - Vol. 14, Is. 1. - P. 47-53, DOI 10.1134/S102745102001022X. - Cited References: 29. - This study was supported by the Russian Foundation for Basic Research, Government of Krasnoyarsk Territory, Krasnoyarsk Regional Fund of Science to the research projects no. 18-42-243009 r_mol_a and no. 19-43-240003 r_a, and the Foundation for Assistance to Small Innovative Enterprises in Science and Technology, contract no. 11843GU/2017, code 0033636, U.M.N.I.K. competition. . - ISSN 1027-4510. - ISSN 1819-7094

РУБ Physics, Condensed Matter
Рубрики:
SOLID-STATE SYNTHESIS
   GRANULAR THIN-FILMS
   THERMITE SYNTHESIS
   PHASE
Кл.слова (ненормированные):
thin films -- ferromagnetic nanocomposites -- CoPt alloy -- magnetic anisotropy
Аннотация: The structure and magnetic properties of CoPt–Al2O3 nanocomposite films synthesized by the annealing of Al/(Co3O4 + Pt) bilayers on a MgO(001) substrate at 650°C in vacuum are investigated. The synthesized composite films contain ferromagnetic CoPt grains with an average size of 25–45 nm enclosed in a nonconducting Al2O3 matrix. The saturation magnetization (Ms ~ 330 G) and coercivity (Hc ≈ 6 kOe) of the films are measured in the film plane and perpendicular to it. The obtained films are characterized by a spatial rotational magnetic anisotropy, which makes it possible to arbitrarily set the easy magnetization axis in the film plane or perpendicular to it using a magnetic field stronger than the coercivity (H ˃ Hc).

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Публикация на русском языке Нанокомпозитные пленки CoPt–Al2O3: синтез, структурные и магнитные свойства [Текст] / В. С. Жигалов, Л. Е. Быкова, В. Г. Мягков [и др.] // Поверхность. - 2020. - № 1. - С. 60-67

Держатели документа:
Russian Acad Sci, Siberian Branch, Krasnoyarsk Sci Ctr, Kirensky Inst Phys, Krasnoyarsk 660036, Russia.
Siberian State Univ Sci & Technol, Krasnoyarsk 660014, Russia.
Siberian Fed Univ, Krasnoyarsk 660041, Russia.

Доп.точки доступа:
Zhigalov, V. S.; Жигалов, Виктор Степанович; Bykova, L. E.; Быкова, Людмила Евгеньевна; Myagkov, V. G.; Мягков, Виктор Григорьевич; Pavlova, A. N.; Volochaev, M. N.; Волочаев, Михаил Николаевич; Matsynin, A. A.; Мацынин, Алексей Александрович; Patrin, G. S.; Патрин, Геннадий Семёнович; Russian Foundation for Basic ResearchRussian Foundation for Basic Research (RFBR); Government of Krasnoyarsk Territory; Krasnoyarsk Regional Fund of Science [18-42-243009 r_mol_a, 19-43-240003 r_a]; Foundation for Assistance to Small Innovative Enterprises in Science and Technology [11843GU/2017, 0033636]
}
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Correlation between magneto-optical and transport properties of Sr doped manganite films / Y. E. Samoshkina [et al.] // J. Alloys Compd. - 2019. - Vol. 782. - P. 334-342, DOI 10.1016/j.jallcom.2018.12.158. - Cited References: 51. - The authors are grateful to A.V. Malakhovskii (Kirensky Institute of Physics, Federal Research Center KSC SB RAS) for fruitful discussions of the magneto-optics data and V.I. Chichkov and N.V. Andreev (National University of Science and Technology MISiS) for the preparation of the manganite films. The work was supported partly by Russian Academy of Sciences , [grant number 0356-2017-0030 ], and the Russian Foundation for Basic Research , [grant number 16-32-00209 ]. . - ISSN 0925-8388
Кл.слова (ненормированные):
Thin films -- Manganites -- Crystal structure -- Electrical transport -- Electronic properties -- Magnetic circular dichroism
Аннотация: The features of electronic structure of La0.7Sr0.3MnO3 Pr0.8Sr0.2MnO3, and Pr0.6Sr0.4MnO3 polycrystalline films of different thickness have been investigated using magnetic circular dichroism (MCD) in the range of 1.1–4.2 eV. The temperature behavior of the samples electrical resistance were also has been studied. It was found that films with high Sr content (0.3 and 0.4) act as high-temperature semiconductors, while the maximum in the temperature dependences of resistivity these films indicates the transition of the samples to the metallic state at some temperature TM-S, which is different for different sample thickness. The films with the lower Sr content (0.2) act as insulators in the used temperature range. The MCD spectra have been decomposed to the Gaussian-shaped lines, and the temperature dependence of intensity of each line has been analyzed in comparison with temperature dependence of the films magnetization and with their electric conductivity type. Different temperature behavior of the intensity of four specified Gaussian-lines was revealed for semiconductor films. In the case of insulating Pr0.8Sr0.2MnO3 samples, the intensity of three specified Gaussian lines changes with the temperature in the same way as the magnetization changed. It was established that the lanthanide (La, Pr) type does not affect the MCD spectra shape for the films with the same electrical conductivity type. Besides, the correlation between the MCD data of the films and their conductivity type was revealed. Due to the detailed analysis of the specified Gaussian lines with taking into account the well-known in the literature absorption bands, lying outside the studied spectral region, the MCD bands for the studied manganite films have been identified with electronic transitions of a different nature.

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Держатели документа:
Kirensky Institute of Physics, Federal Research Center KSC SB RAS, Krasnoyarsk, 660036, Russian Federation
Siberian Federal University, Krasnoyarsk, 660041, Russian Federation

Доп.точки доступа:
Samoshkina, Yu. E.; Самошкина, Юлия Эрнестовна; Edelman, I. S.; Эдельман, Ирина Самсоновна; Rautskii, M. V.; Рауцкий, Михаил Владимирович; Molokeev, M. S.; Молокеев, Максим Сергеевич
}
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Density-functional model cluster studies of EPR g tensors of F-s(+) centers on the surface of MgO / C. . Di Valentin [et al.] // J. Chem. Phys. - 2006. - Vol. 124, Is. 4. - Ст. 44708, DOI 10.1063/1.2161190. - Cited References: 37 . - ISSN 0021-9606

РУБ Physics, Atomic, Molecular & Chemical
Рубрики:
ELECTRONIC G-TENSORS
   CORRELATION-ENERGY
   MGO(001) SURFACE
   OXYGEN VACANCIES
   SPIN-ORBIT
   G-VALUES
   ATOMS
   APPROXIMATION
   COMPLEXES
   MOLECULES
Кл.слова (ненормированные):
Density-functional model cluster -- Single-crystalline thin films -- Spin-orbit interaction -- Anisotropy -- Paramagnetic resonance -- Single crystals -- Tensors -- Thin films -- Magnesium compounds
Аннотация: We report g tensors of surface color centers, so-called F-s(+) centers, of MgO calculated with two density-functional approaches using accurately embedded cluster models. In line with recent UHV measurements on single-crystalline MgO film, we determined only small g-tensor anisotropies and negative shifts Delta g equivalent to g-g(e) for all F-s(+) sites considered, namely, (001)-terrace, step, edge, and corner sites. The g values are very sensitive to the local structure of the defect: relaxation reverses the sign of Delta g. However, accounting for the spin-orbit interaction either self-consistently or perturbatively yields very similar results. In addition to the values of the tensor components, their direction with respect to the surface was determined. In contrast to edges, significant deviations from ideal C-2v symmetry were found for F-s(+) centers at steps. Recent data on single-crystalline thin films are reevaluated in the light of these results. (c) 2006 American Institute of Physics.

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Держатели документа:
ICREA, Barcelona 08010, Spain
Univ Barcelona & Parc Cientif Barcelona, Dept Quim Fis, Barcelona 08028, Spain
Univ Barcelona & Parc Cientif Barcelona, Ctr Especial Recerca Quim Teor, Barcelona 08028, Spain
Max Planck Gesell, Fritz Haber Inst, Dept Phys Chem, D-14195 Berlin, Germany
Russian Acad Sci, Inst Chem & Chem Technol, Krasnoyarsk 660049, Russia
Univ Milan Bicocca, Dipartimento Sci Mat, I-20125 Milan, Italy
Tech Univ Munich, Dept Chem Theoret Chem, D-85747 Garching, Germany
ИХХТ СО РАН
Dipartimento di Scienza dei Materiali, Universit? degli Studi Milano-Bicocca, 20125 Milano, Italy
Institucio Catalana de Recerca i Estudis Avanats (ICREA), 08010 Barcelona, Spain
Departament de Quimica Fisisca, Centre Especial de Recerca en Quimica Teorica, Parc Cientific de Barcelona, 08028 Barcelona, Spain
Fritz-Haber Institut, Max-Planck Gesellschaft, Department of Chemical Physics, Faradayweg 4-6, D-14195 Berlin, Germany
Institute of Chemistry and Chemical Technology, Russian Academy of Sciences, 660049 Krasnoyarsk, Russian Federation
Department Chemie, Theoretische Chemie, Technische Universitat Munchen, 85747 Garching, Germany

Доп.точки доступа:
Di Valentin, C.; Neyman, K. M.; Risse, T.; Sterrer, M.; Fischbach, E.; Freund, H. J.; Nasluzov, V. A.; Pacchioni, G.; Rosch, N.
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Experimental study of the thermal conductivity of single-walled carbon nanotube-based thin films / I. A. Tambasov, A. S. Voronin, N. P. Evsevskaya [et al.] // Phys. Solid State. - 2020. - Vol. 62, Is. 6. - P. 1090-1094, DOI 10.1134/S1063783420060311. - Cited References: 21. - This study was supported by the Russian Foundation for Basic Research, the Government of the Krasnoyarsk Territory, and the Krasnoyarsk Territorial Foundation for Support of Scientific and R&D Activity, project Study of the Thermal Conductivity and Structural Features in Nanostructured Oxide Thin Films Promising for Thermoelectric Applications no. 18-42-243010 and the Scholarships of the President of the Russian Federation (SP-2235.2019.1). . - ISSN 1063-7834. - ISSN 1090-6460

РУБ Physics, Condensed Matter
Рубрики:
THERMOELECTRIC PROPERTIES
TRANSPORT-PROPERTIES
Кл.слова (ненормированные):
single-walled carbon nanotubes -- vacuum filtration -- thin films -- thermal conductivity
Аннотация: The single-walled carbon nanotube-based thin films with a thickness from 11 ± 3 to 157 ± 18 nm have been formed using vacuum filtration. The thermal conductivity of the thin films as a function of thickness and temperature up to 450 K has been studied by the 3ω technique. It has been found that, in the region of 49 nm, the supplied heat from a gold strip started propagating with the high efficiency to the thin film plane. The thermal conductivity of the thin films with a thickness of 49 ± 8 nm was measured using the 3ω technique for bulk samples. It has been found that the thermal conductivity of the single-walled carbon nanotube-based thin films strongly depends on their thickness and temperature. The thermal conductivity sharply (by a factor of ~60) increases with an increase in thickness from 11 ± 3 to 65 ± 4 nm. In addition, it has been observed that the thermal conductivity of the thin film with a thickness of 157 ± 18 nm rapidly decreases from 211 ± 11 to 27.5 ± 1.4 W m–1 K–1 at 300 and 450 K, respectively.

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Публикация на русском языке Экспериментальное исследование коэффициента теплопроводности в тонких пленках на основе одностенных углеродных нанотрубок [Текст] / И. А. Тамбасов, А. С. Воронин, Н. П. Евсевская [и др.] // Физ. тверд. тела. - 2020. - Т. 62 Вып. 6. - С. 960-964

Держатели документа:
Russian Acad Sci, Kirensky Inst Phys, Krasnoyarsk Sci Ctr, Siberian Branch, Krasnoyarsk 660036, Russia.
Russian Acad Sci, Krasnoyarsk Sci Ctr, Siberian Branch, Krasnoyarsk 660036, Russia.
Russian Acad Sci, Inst Chem & Chem Technol, Krasnoyarsk Sci Ctr, Siberian Branch, Krasnoyarsk 660036, Russia.
Nizhnii Novgorod State Univ, Res Inst Phys & Technol, Nizhnii Novgorod 603950, Russia.
Siberian Fed Univ, Krasnoyarsk 660041, Russia.
Siberian State Univ Sci & Technol, Krasnoyarsk 660014, Russia.

Доп.точки доступа:
Tambasov, I. A.; Тамбасов, Игорь Анатольевич; Voronin, A. S.; Evsevskaya, N. P.; Kuznetsov, Yu M.; Luk'yanenko, A. V.; Лукьяненко, Анна Витальевна; Tambasova, E. V.; Gornakov, M. O.; Горнаков, М. О.; Dorokhin, M., V; Loginov, Yu Yu; Russian Foundation for Basic ResearchRussian Foundation for Basic Research (RFBR); Government of the Krasnoyarsk Territory; Krasnoyarsk Territorial Foundation for Support of Scientific and RD Activity [18-42-243010]; Russian FederationRussian Federation [SP-2235.2019.1]
}
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Features of the course of the solid-state reactions in a Sn/Fe/Cu trilayer film system / Yu. Yu. Balashov, V. G. Myagkov, L. E. Bykova [et al.] // Tech. Phys. - 2023. - Vol. 68, Is. 7. - P. 940-944, DOI 10.61011/TP.2023.07.56642.73-23. - Cited References: 18 . - ISSN 1063-7842. - ISSN 1090-6525
Кл.слова (ненормированные):
thin films -- transmission electron microscopy -- energy dispersion spectroscopy -- mass transfer mechanisms
Аннотация: Study of the mechanisms of the solid-state reactions in Sn/Fe/Cu thin films is interesting both from a fundamental point of view and from a view of the importance of emerging intermetallics in the technology of solder joints and thin-film lithium-ion batteries. By the integrated approach, including both X-ray phase analysis and local elemental analysis of the cross-sections of the films, the phase composition and the mutual arrangement of phases were studied, at various stages of the solid-state reaction occurring at different temperatures. The observed sequence of the appearing phases differs significantly from the expected one if the mass transfer took place by a volume diffusion through the forming layers.

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Публикация на русском языке Особенности протекания твердофазных реакций в трехслойной пленочной системе Sn/Fe/Cu [Текст] / Ю. Ю. Балашов, В. Г. Мягков, Л. Е. Быкова [и др.]. - 5 с. // Журн. техн. физ. - 2023. - Т. 93 Вып. 7. - С. 1009-1013

Держатели документа:
Kirensky Institute of Physics, Federal Research Center KSC SB, Russian Academy of Sciences, Krasnoyarsk, Russia
Siberian State University, Krasnoyarsk, Russia

Доп.точки доступа:
Balashov, Yu. Yu.; Балашов, Юрий Юрьевич; Myagkov, V. G.; Мягков, Виктор Григорьевич; Bykova, L. E.; Быкова, Людмила Евгеньевна; Volochaev, M. N.; Волочаев, Михаил Николаевич; Zhigalov, V. S.; Жигалов, Виктор Степанович; Matsynin, A. A.; Мацынин, Алексей Александрович; Galushka, K. A.; Bondarenko, G. N.; Бондаренко, Галина Николаевна; Komogortsev, S. V.; Комогорцев, Сергей Викторович; Nanophysics & Nanoelectronics, International Symposium(27 ; 13-16 March 2023 ; Nizhny Novgorod, Russia)
}
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Features of the ellipsometric investigation of magnetic nanostructures / O. A. Maksimova [et al.] // J. Struct. Chem. - 2014. - Vol. 55, Is. 6. - P. 1134-1141, DOI 10.1134/S0022476614060225. - Cited References:8. - The work was supported by the Program of the President of the RussianFederation for the support of leading scientific schools (ScientificSchool 2886.2014.2), RFBR (grant No. 13-02-01265, No. 14-02-01211), theMinistry of Education and Science of the Russian Federation (Agreement14.604.21.0002 State contract No. 02.G25.31.0043), and the Foundationfor Assistance to Small Innovative Enterprises in Science and Technology(program "A Member of the Youth Research and Innovation Competition",contract number 0003831). . - ISSN 0022. - ISSN 1573-8779. -

РУБ Chemistry, Inorganic & Nuclear + Chemistry, Physical
Рубрики:
PARAMETERS
Кл.слова (ненормированные):
magneto-ellipsometry -- ellipsometric measurements -- magneto-optical Kerr -- effect -- thin films -- semi-infinite medium model -- refraction coefficient
Аннотация: The technique for interpreting magneto-ellipsometric measurements is proposed. The model of a homogeneous semi-infinite medium for reflecting layered magnetic structures in the presence of the magnetic field in the configuration of the magneto-optical equatorial Kerr effect is considered. Based on the analysis of the Fresnel coefficients with regard to the magneto-optical parameter Q appearing in the off-diagonal elements of the permittivity tensor, the expressions are obtained using which the refraction (n) and absorption (k) coefficients, the real (Q (1)) and imaginary (Q (2)) parts of the magneto-optical parameter can be found from the ellipsometric (psi(0) and Delta(0)) and magneto-ellipsometric (psi(0) + delta psi and Delta(0) + delta I") measurements. The results will allow to measure and analyze the magnetic characteristics such as hysteresis loops and the coercitive force of layered nanostructures using the conventional ellipsometric equipment.

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Публикация на русском языке Особенности анализа эллипсометрических данных для магнитных наноструктур [Текст] / О. А. Максимова [и др.] // Журн. структ. химии. - Новосибирск : Изд-во СО РАН, 2014. - Т. 55 № 6. - С. 1190-1197

Держатели документа:
Siberian Fed Univ, Krasnoyarsk, Russia
Russian Acad Sci, LV Kirensky Phys Inst, Siberian Branch, Krasnoyarsk, Russia
Reshetnev Siberian State Aerosp Univ, Krasnoyarsk, Russia

Доп.точки доступа:
Maksimova, O. A.; Максимова, Ольга Александровна; Kosyrev, N. N.; Косырев, Николай Николаевич; Varnakov, S. N.; Варнаков, Сергей Николаевич; Lyashchenko, S. A.; Лященко, Сергей Александрович; Ovchinnikov, S. G.; Овчинников, Сергей Геннадьевич; Russian Federation [2886.2014.2]; RFBR [13-02-01265, 14-02-01211]; Ministry of Education and Science of the Russian Federation[14.604.21.0002, 02.G25.31.0043]; Foundation for Assistance to SmallInnovative Enterprises in Science and Technology [0003831]
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10.

Felk, V. A.
Micromagnetics in planar system with random magnetic anisotropy and two-dimensional magnetic correlations / V. A. Felk, S. V. Komogortsev // VI Euro-Asian Symposium "Trends in MAGnetism" (EASTMAG-2016) : abstracts / ed.: O. A. Maksimova, R. D. Ivantsov. - Krasnoyarsk : KIP RAS SB, 2016. - Ст. O10.1. - P. 443. - References: 2. - This work was supported by the Russian Foundation for Basic Research, Grants No. 16-03-00256, 15-08-06673 and RFBR-KRFS 15-42-0417 . - ISBN 978-5-904603-06-9
Кл.слова (ненормированные):
thin films -- micromagnetics -- random magnetic anisotropy

Доп.точки доступа:
Komogortsev, S. V.; Комогорцев, Сергей Викторович; Фельк, Владимир Александрович; Euro-Asian Symposium "Trends in MAGnetism"(6 ; 2016 ; Aug. ; 15-19 ; Krasnoyarsk); "Trends in MAGnetism", Euro-Asian Symposium(6 ; 2016 ; Aug. ; 15-19 ; Krasnoyarsk); Институт физики им. Л.В. Киренского Сибирского отделения РАН

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