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Analysis of optical and magnetooptical spectra of Fe5Si3 and Fe3Si magnetic silicides using spectral magnetoellipsometry / S. A. Lyashchenko [et al.] // J. Exp. Theor. Phys. - 2015. - Vol. 120, Is. 5. - P. 886-893, DOI 10.1134/S1063776115050155. - Cited References:31. - This study was financially supported by the Ministry of Education and Science of the Russian Federation (state assignment no. 16.663.2014K, agreement no. 14.604.21.0002 (RFMEFI60414X0002), and contract no. 02.G25.31.0043), the Program is Support of Leading Scientific Schools (project no. NSh-2886.2014.2), and the Russian Foundation for Basic Research (project nos. 13-02-01265 and 14-02-31309). . - ISSN 1063. - ISSN 1090-6509. -

РУБ Physics, Multidisciplinary
Рубрики:
INITIO MOLECULAR-DYNAMICS
   AUGMENTED-WAVE METHOD
   FILMS
   ELLIPSOMETRY
Аннотация: The optical, magnetooptical, and magnetic properties of polycrystalline (Fe5Si3/SiO2/Si(100)) and epitaxial Fe3Si/Si(111) films are investigated by spectral magnetoellipsometry. The dispersion of the complex refractive index of Fe5Si3 is measured using multiangle spectral ellipsometry in the range of 250–1000 nm. The dispersion of complex Voigt magnetooptical parameters Q is determined for Fe5Si3 and Fe3Si in the range of 1.6–4.9 eV. The spectral dependence of magnetic circular dichroism for both silicides has revealed a series of resonance peaks. The energies of the detected peaks correspond to interband electron transitions for spin-polarized densities of electron states (DOS) calculated from first principles for bulk Fe5Si3 and Fe3Si crystals.

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Публикация на русском языке Исследование оптических и магнитооптических спектров магнитных силицидов Fe5Si3 и Fe3Si методом спектральной магнитоэллипсометрии [Текст] / С. А. Лященко [и др.] // Журн. эксперим. и теор. физ. : Наука, 2015. - Т. 147 Вып. 5. - С. 1023–1031

Держатели документа:
Reshetnikov Siberian State Aerosp Univ, Krasnoyarsk 660014, Russia.
Russian Acad Sci, Kirensky Inst Phys, Siberian Branch, Krasnoyarsk 660036, Russia.
Siberian Fed Univ, Krasnoyarsk 660041, Russia.
Russian Acad Sci, Rzhanov Inst Semicond Phys, Siberian Branch, Novosibirsk 630090, Russia.
Russian Acad Sci, Inst Automat & Control Proc, Far East Branch, Vladivostok 690041, Russia.
Far Eastern State Transport Univ, Khabarovsk 680021, Russia.

Доп.точки доступа:
Lyashchenko, S. A.; Лященко, Сергей Александрович; Popov, Z. I.; Попов, Захар Иванович; Varnakov, S. N.; Варнаков, Сергей Николаевич; Popov, E. A.; Molokeev, M. S.; Молокеев, Максим Сергеевич; Yakovlev, I. A.; Яковлев, Иван Александрович; Kuzubov, A. A.; Кузубов, Александр Александрович; Ovchinnikov, S. G.; Овчинников, Сергей Геннадьевич; Shamirzaev, T. S.; Latyshev, A. V.; Saranin, A. A.; Ministry of Education and Science of the Russian Federation [16.663.2014K, 14.604.21.0002 (RFMEFI60414X0002), 02.G25.31.0043]; Russian Foundation for Basic Research [13-02-01265, 14-02-31309]
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Maximova, O. A.
Analytical calculation of dielectric permittivity tensor from magneto-optical ellipsometry measurements / O. Maximova, S. Ovchinnikov, S. Lyaschenko // J. Phys. A. - 2021. - Vol. 54, Is. 29. - Ст. 295201, DOI 10.1088/1751-8121/abfe72. - Cited References: 24. - This study was supported by the Government of the Russian Federation (Agreement No. 075-15-2019-1886) . - ISSN 1751-8113. - ISSN 1751-8121

РУБ Physics, Multidisciplinary + Physics, Mathematical
Рубрики:
FILMS
Кл.слова (ненормированные):
ellipsometry -- dielectric permittivity tensor -- ferromagnetics -- transverse magneto-optical Kerr effect
Аннотация: Magneto-optical ellipsometry combines ellipsometry and magneto-optical Kerr effect measurements which are two powerful techniques. The main difficulty is usually in data processing as a number of parameters should be extracted from measured ellipsometric (ψ, Δ) and magneto-ellipsometric (δψ, δΔ) parameters. Standard procedure of solving magneto-ellipsometry equations involves numerical calculations. In this paper we show that it is possible to find out all elements of dielectric permittivity tensor without numerical calculation methods. It means that the inverse problem of magneto-optical ellipsometry can be solved analytically in the case of expansion of magneto-ellipsometric parameters δψ and δΔ with respect to two small parameters. We present a full set of mathematical expressions that enable us to calculate complex refraction index and complex magneto-optical parameter of a sample from magneto-optical ellipsometry measurements, thereby obtaining diagonal and off-diagonal complex elements of dielectric permittivity tensor. This analytical approach can be used in case of the contribution from magnetism into reflection coefficients being small.

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Держатели документа:
Kirensky Inst Phys SB RAS, 50-38 Akademgorodok, Krasnoyarsk 660036, Russia.
Siberian Fed Univ, 79 Svobodny Pr, Krasnoyarsk 660041, Russia.

Доп.точки доступа:
Ovchinnikov, S. G.; Овчинников, Сергей Геннадьевич; Lyashchenko, S. A.; Лященко, Сергей Александрович; Максимова, Ольга Александровна; Government of the Russian Federation [075-15-2019-1886]
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Characterization of manganese and iron silicides by in situ spectral generalized magneto-optical ellipsometry / N. N. Kosyrev [et al.] // 7th Workshop on Ellipsometry : abstract book. - 2012. - P. . - 82
Аннотация: Dilute magnetic semiconductors (DMS) combine the electronic transport properties of semiconductors and memory characteristics of magnetic materials. The complementary properties of semiconductor and ferromagnetic material can manipulate both degrees of freedoms of electrons0 spins and charges for spintronic devices. In recent years, group IV(Ge,Si)-based DMSs attract considerable experimental effort due to the compatibility with mainstream silicon technology. In ourworkwe present the investigation of structural,magnetic and optical properties ofmanganese and iron silicides thin films on Si (100) substrate by in situ spectral generalizedmagneto-optical ellipsometry. Themeasurementswere performed by spectral and laser ellipsometers (“Spectroscan“ and “LEF-71“ respectively by Institute Semiconductors Physics SB RAS), optimized tomeasure not only traditional ellipsometric parameters, but also magneto-optical response of the sample. The magnetoellipsometers were integrated into the ultrahigh vacuum chambers of molecular beam epitaxy setup, which allowed to control the optical and magnetic properties of thin films directly in the growth process. As a result of the magneto-optical response analysis, it was found that iron and manganese silicides in magnetic phase were formed on the Si surface and by analysis of the ellipsometric parameters dependence on evaporation time the silicide nanoclusters were identified and their structural properties were found. The work was supported by project 4.1 of the OFN RAS, project 27.10 of the Presidium RAS, integration project22 of SB RAS and FEB RAS, and also the FCP NK-744P/6 .

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Доп.точки доступа:
Kosyrev, N. N.; Косырев, Николай Николаевич; Varnakov, S. N.; Варнаков, Сергей Николаевич; Tarasov, I. A.; Тарасов, Иван Анатольевич; Lyashenko, S. A.; Ovchinnikov, S. G.; Овчинников, Сергей Геннадьевич; Workshop Ellipsometry (7 ; 2012 ; март ; 5-7 ; Leipzig, Germany)
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Data processing algorithms for magneto-optical ellipsometry of thin films with optical uniaxial anisotropy / O. A. Maximova, S. A. Lyashchenko, I. A. Yakovlev [et al.] // V International Baltic Conference on Magnetism. IBCM : Book of abstracts. - 2023. - P. 126. - Cited References: 5. - РНФ № 21-12-00226

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Держатели документа:
Kirensky Institute of Physics, Federal Research Center KSC SB RAS
Siberian Federal University

Доп.точки доступа:
Maximova, O. A.; Максимова, Ольга Александровна; Lyashchenko, S. A.; Лященко, Сергей Александрович; Yakovlev, I. A.; Яковлев, Иван Александрович; Shvetsov, D. V.; Andryushchenko, T. A.; Varnakov, S. N.; Варнаков, Сергей Николаевич; Ovchinnikov, S. G.; Овчинников, Сергей Геннадьевич; International Baltic Conference on Magnetism(5 ; 2023 ; Aug. 20-24 ; Svetlogorsk, Russia); Балтийский федеральный университет им. И. Канта
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Determination of structural parameters of the Fe-Si-system by spectral ellipsometry method / S. A. Lyashchenko [et al.] // Physics Procedia. - 2012. - Vol. 23. - P. 49-52, DOI 10.1016/j-phpro.2011.01.013 . - ISSN 1875-3884
Кл.слова (ненормированные):
spectral ellipsometry -- silicides -- atomic force microscopic
Аннотация: Limitation of the thin homogeneous layers with sharp interfaces model for the structure Si(100)/FeSi2(grain) in solution the inverse problem of ellipsometry in the visible spectral range is shown. A new model of random distribution of thin disks for describing the real structure of the sample is designed. The results of the model optimization are confirmed by AFM.

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Доп.точки доступа:
Lyashchenko, S. A.; Лященко, Сергей Александрович; Varnakov, S. N.; Варнаков, Сергей Николаевич; Ovchinnikov, S. G.; Овчинников, Сергей Геннадьевич; Berezitskaya, E. P.; Alexandrova, G. A.; Vaituzin, O. P.; Asian School-Conference on Physics and Technology of Nanostructured Materials(2011 ; Aug. ; 21-28 ; Vladivostok); Азиатская школа-конференция по физике и технологии наноструктурированных материалов(1 ; 2011 ; авг. ; 21-28 ; Владивосток)
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    Development of in situ magneto-ellipsometry for studying correlation between the optical and magneto-optical properties of ferromagnetic thin films / O. A. Maximova [et al.] // J. Phys.: Conf. Ser. - 2017. - Vol. 903. - Ст. 012060, DOI 10.1088/1742-6596/903/1/012060. - Cited References:7. - The work was supported partly by the Russian Foundation for Basic Research Grant No. 16-32-00209 mol_a, Grant No. 14-02-01211, Grant No. 16-42-24083; the Complex program of SB RAS No II.2P, project 0358-2015-0004; the Ministry of Education and Science of the RF (State task No. 16.663.2014 kappa); Grant of the President of the Russian Federation (Scientific School No. 7559.2016.2).
   Перевод заглавия: Развитие метода in situ магнитоэллипсометрии для изучения корреляции между оптическими и магнитооптическими свойствами ферромагнитных тонких пленок

РУБ Physics, Applied + Physics, Condensed Matter

Аннотация: In this work we present the way of nanostructured films study by means of magneto-ellipsometry. The method of interpretation of in situ magneto-optical ellipsometry spectra from the in situ molecular beam epitaxy setup with an integrated magneto-ellipsometric real time synthesis control is described. The method has been successfully tested on Fe/SiO2/Si nanostructures within the model of a homogeneous semi-infinite medium. As a result, the dielectric tensor components for Fe layer were calculated using a developed approach.

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Доп.точки доступа:
Maximova, O. A.; Максимова, Ольга Александровна; Kosyrev, N. N.; Косырев, Николай Николаевич; Varnakov, S. N.; Варнаков, Сергей Николаевич; Lyashchenko, S. A.; Лященко, Сергей Александрович; Tarasov, I. A.; Тарасов, Иван Анатольевич; Yakovlev, I. A.; Яковлев, Иван Александрович; Maximova, O. M.; Shevtsov, D. V.; Шевцов, Дмитрий Валентинович; Ovchinnikov, S. G.; Овчинников, Сергей Геннадьевич; Russian Foundation for Basic Research [16-32-00209 mol_a, 14-02-01211, 16-42-24083]; Complex program of SB RAS [II.2P, 0358-2015-0004]; Ministry of Education and Science of the RF [16.663.2014kappa]; Grant of the President of the Russian Federation [7559.2016.2]; Joint European Magnetic Symposia(8 ; 2016 ; 21-26 Aug. ; Glasgow, UK)
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    Maximova, O. A.
    Development of spectroscopic magneto-ellipsometry for studying of magneto-optical properties of ferromagnetic nanostructures / O. A. Maximova, N. N. Kosyrev, S. G. Ovchinnikov // Third Asian school-conference on physics and technology of nanostructured materials (ASCO-NANOMAT 2015) : proceedings. - 2015. - Ст. VI.21.07p . - ISBN 978-5-8044-1556-4
   Перевод заглавия: Развитие метода спектральной магнитоэллипсометрии для изучения магнитооптических свойств ферромагнитных наноструктур
Аннотация: The elements of the dielectric tensor ε are the subject of interest. In this paper a new method for obtaining diagonal and off-diagonal elements of this tensor is presented. In situ spectroscopic ellipsometry and magneto-ellipsometry measurements data from the in situ molecular beam epitaxy setup with an integrated magneto-ellipsometric real time control are used. The formulae and the algorithm for data analysis are obtained. The method is approved on the ferromagnetic nanostructures Fe/SiO2/Si.

Материалыконференции

Доп.точки доступа:
Kosyrev, N. N.; Косырев, Николай Николаевич; Ovchinnikov, S. G.; Овчинников, Сергей Геннадьевич; Максимова, Ольга Александровна; Asian School-Conference on Physics and Technology of Nanostructured Materials(3 ; 2015 ; aug. ; 19-26 ; Vladivostok); Азиатская школа-конференция по физике и технологии наноструктурированных материалов(3 ; 2015 ; авг. ; 19-26 ; Владивосток)
}
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Development of techniques for processing data from magneto-ellipsometry measurements / O. A. Maximova [et al.] // Fourth Asian school-conference on physics and technology of nanostructured materials (ASCO-NANOMAT 2018) : proceedings / progr. com. S. G. Ovchinnikov [et al.]. - 2018. - Ст. IV.25.05p. - P. 180 . - ISBN 978-5-7444-4368-9
Аннотация: The approach to data processing for layered thin films with a ferromagnet layer is proposed for studying optical and magneto- optical properties. The scope and applicability of models which describe reflective layered structures are studied in order to recommend the best model choice for each case. A significant effect of penetration depth on this choice was observed.

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Доп.точки доступа:
Ovchinnikov, S. G. \progr. com.\; Овчинников, Сергей Геннадьевич; Maximova, O. A.; Максимова, Ольга Александровна; Lyashchenko, S. A.; Лященко, Сергей Александрович; Shevtsov, D. V.; Шевцов, Дмитрий Валентинович; Yakovlev, I. A.; Яковлев, Иван Александрович; Ovchinnikov, S. G.; Asian School-Conference on Physics and Technology of Nanostructured Materials(4 ; 2018 ; Sept. ; 23-28 ; Vladivostok); Азиатская школа-конференция по физике и технологии наноструктурированных материалов(4 ; 2018 ; сент. ; 23-28 ; Владивосток); Институт автоматики и процессов управления ДВО РАН; Дальневосточный федеральный университет
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Aver'yanov, E. M.
Effective refractive index of a two-dimensional polycrystal / E. M. Aver’yanov // JETP Letters. - 2015. - Vol. 101, Is. 10. - P. 685-689, DOI 10.1134/S0021364015100033. - Cited References: 28 . - ISSN 0021-3640

РУБ Physics, Multidisciplinary
Рубрики:
SPECTROSCOPIC ELLIPSOMETRY
   CONJUGATED POLYMERS
   LOCAL-FIELD
   FILMS
   CONDUCTIVITY
   POLYFLUORENE
   ANISOTROPY
   DISPERSION
   MEDIA
Аннотация: A relation of the effective refractive index of a two-dimensional polycrystalline dielectric film in the transparency region to the refractive indices n1 and n2 of crystallites at the positions of axes 1 and 2, respectively, of refraction ellipsoids of the crystallites in the plane of the film has been obtained. This relation and the relation L* = (L1 + L2)/2 between the components of the Lorentz tensors for the film and crystallites have been confirmed by comparison with experimental data for conjugate-polymer films with uniaxial domains.

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Публикация на русском языке Аверьянов, Евгений Михайлович. Эффективный показатель преломления двумерного поликристалла [Текст] / Е. М. Аверьянов // Письма в Журн. эксперим. и теор. физ. : Наука, 2015. - Т. 101 Вып. 10. - С. 761-765

Доп.точки доступа:
Аверьянов, Евгений Михайлович
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10.

Experimental and Theoretical In Situ Spectral Magneto-Ellipsometry Study of Layered Ferromagnetic Structures / O. A. Maximova [et al.] // JETP Letters. - 2019. - Vol. 110, Is. 3. - P. 166-172, DOI 10.1134/S0021364019150098. - Cited References: 28. - This work was supported by the Ministry of Education and Science of the Russian Federation and the Siberian Branch, Russian Academy of Sciences (project nos. 0356-2018-0061 and II.8.70). . - ISSN 0021-3640
Аннотация: A method for processing of in situ spectral magneto-ellipsometry data has been developed to analyze planar ferromagnetic nanostructures. A multilayer model containing a ferromagnetic layer with two interfaces, a nonferromagnetic buffer layer, and a nonferromagnetic substrate has been tested within a new approach to the interpretation of magnetic-field-modulated spectral ellipsometric measurements involving the magnetooptical Kerr effect in the transverse configuration. In particular, the effect of the thickness of the ferromagnetic layer on the results of magneto-ellipsometric measurements has been analyzed. The measurements have been performed with polycrystalline Fe films with different thicknesses on a nonferromagnetic SiO2/Si(100) surface. The diagonal and off-diagonal components of the complex dielectric tensor in the spectral range of 1.38–3.45 eV have been determined by processing spectral magneto-ellipsometric data. The results have been compared to the available data obtained by other authors and to the calculation of the dielectric tensor of Fe within the density functional theory.

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Публикация на русском языке

Держатели документа:
Kirensky Institute of Physics, Federal Research Center KSC, Siberian Branch, Russian Academy of Sciences, Akademgorodok, Krasnoyarsk, 660036, Russian Federation
Siberian Federal University, Krasnoyarsk, 660041, Russian Federation

Доп.точки доступа:
Maximova, O. A.; Максимова, Ольга Александровна; Lyashchenko, S. A.; Лященко, Сергей Александрович; Vysotin, M. A.; Высотин, Максим Александрович; Tarasov, I. A.; Тарасов, Иван Анатольевич; Yakovlev, I. A.; Яковлев, Иван Александрович; Shevtsov, D. V.; Шевцов, Дмитрий Валентинович; Fedorov, A. S.; Федоров, Александр Семенович; Varnakov, S. N.; Варнаков, Сергей Николаевич; Ovchinnikov, S. G.; Овчинников, Сергей Геннадьевич
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