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Вид документа : Статья из журнала
Шифр издания :
Автор(ы) : Lyashchenko S. A., Popov Z. I., Varnakov S. N., Popov E. A., Molokeev M. S., Yakovlev I. A., Kuzubov A. A., Ovchinnikov S. G., Shamirzaev T. S., Latyshev A. V., Saranin A. A.
Заглавие : Analysis of optical and magnetooptical spectra of Fe5Si3 and Fe3Si magnetic silicides using spectral magnetoellipsometry
Коллективы : Ministry of Education and Science of the Russian Federation [16.663.2014K, 14.604.21.0002 (RFMEFI60414X0002), 02.G25.31.0043], Russian Foundation for Basic Research [13-02-01265, 14-02-31309]
Место публикации : J. Exp. Theor. Phys.: MAIK Nauka-Interperiodica / Springer, 2015. - Vol. 120, Is. 5. - P.886-893. - ISSN 1063, DOI 10.1134/S1063776115050155. - ISSN 10906509(eISSN)
Примечания : Cited References:31. - This study was financially supported by the Ministry of Education and Science of the Russian Federation (state assignment no. 16.663.2014K, agreement no. 14.604.21.0002 (RFMEFI60414X0002), and contract no. 02.G25.31.0043), the Program is Support of Leading Scientific Schools (project no. NSh-2886.2014.2), and the Russian Foundation for Basic Research (project nos. 13-02-01265 and 14-02-31309).
Предметные рубрики: INITIO MOLECULAR-DYNAMICS
AUGMENTED-WAVE METHOD
FILMS
ELLIPSOMETRY
Аннотация: The optical, magnetooptical, and magnetic properties of polycrystalline (Fe5Si3/SiO2/Si(100)) and epitaxial Fe3Si/Si(111) films are investigated by spectral magnetoellipsometry. The dispersion of the complex refractive index of Fe5Si3 is measured using multiangle spectral ellipsometry in the range of 250–1000 nm. The dispersion of complex Voigt magnetooptical parameters Q is determined for Fe5Si3 and Fe3Si in the range of 1.6–4.9 eV. The spectral dependence of magnetic circular dichroism for both silicides has revealed a series of resonance peaks. The energies of the detected peaks correspond to interband electron transitions for spin-polarized densities of electron states (DOS) calculated from first principles for bulk Fe5Si3 and Fe3Si crystals.
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Вид документа : Статья из журнала
Шифр издания :
Автор(ы) : Maximova O. A., Ovchinnikov S. G., Lyashchenko S. A.
Заглавие : Analytical calculation of dielectric permittivity tensor from magneto-optical ellipsometry measurements
Коллективы : Government of the Russian Federation [075-15-2019-1886]
Место публикации : J. Phys. A: IOP PUBLISHING LTD, 2021. - Vol. 54, Is. 29. - Ст.295201. - ISSN 1751-8113, DOI 10.1088/1751-8121/abfe72. - ISSN 1751-8121(eISSN)
Примечания : Cited References: 24. - This study was supported by the Government of the Russian Federation (Agreement No. 075-15-2019-1886)
Предметные рубрики: FILMS
Аннотация: Magneto-optical ellipsometry combines ellipsometry and magneto-optical Kerr effect measurements which are two powerful techniques. The main difficulty is usually in data processing as a number of parameters should be extracted from measured ellipsometric (ψ, Δ) and magneto-ellipsometric (δψ, δΔ) parameters. Standard procedure of solving magneto-ellipsometry equations involves numerical calculations. In this paper we show that it is possible to find out all elements of dielectric permittivity tensor without numerical calculation methods. It means that the inverse problem of magneto-optical ellipsometry can be solved analytically in the case of expansion of magneto-ellipsometric parameters δψ and δΔ with respect to two small parameters. We present a full set of mathematical expressions that enable us to calculate complex refraction index and complex magneto-optical parameter of a sample from magneto-optical ellipsometry measurements, thereby obtaining diagonal and off-diagonal complex elements of dielectric permittivity tensor. This analytical approach can be used in case of the contribution from magnetism into reflection coefficients being small.
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Вид документа : Статья из сборника (однотомник)
Шифр издания :
Автор(ы) : Kosyrev N. N., Varnakov S. N., Tarasov I. A., Lyashenko S. A., Ovchinnikov S. G.
Заглавие : Characterization of manganese and iron silicides by in situ spectral generalized magneto-optical ellipsometry
Коллективы : Workshop Ellipsometry (7; 2012 ; март ; 5-7; Leipzig, Germany)
Место публикации : 7th Workshop on Ellipsometry: abstract book. - 2012. - P. - 82
Аннотация: Dilute magnetic semiconductors (DMS) combine the electronic transport properties of semiconductors and memory characteristics of magnetic materials. The complementary properties of semiconductor and ferromagnetic material can manipulate both degrees of freedoms of electrons0 spins and charges for spintronic devices. In recent years, group IV(Ge,Si)-based DMSs attract considerable experimental effort due to the compatibility with mainstream silicon technology. In ourworkwe present the investigation of structural,magnetic and optical properties ofmanganese and iron silicides thin films on Si (100) substrate by in situ spectral generalizedmagneto-optical ellipsometry. Themeasurementswere performed by spectral and laser ellipsometers (“Spectroscan“ and “LEF-71“ respectively by Institute Semiconductors Physics SB RAS), optimized tomeasure not only traditional ellipsometric parameters, but also magneto-optical response of the sample. The magnetoellipsometers were integrated into the ultrahigh vacuum chambers of molecular beam epitaxy setup, which allowed to control the optical and magnetic properties of thin films directly in the growth process. As a result of the magneto-optical response analysis, it was found that iron and manganese silicides in magnetic phase were formed on the Si surface and by analysis of the ellipsometric parameters dependence on evaporation time the silicide nanoclusters were identified and their structural properties were found. The work was supported by project 4.1 of the OFN RAS, project 27.10 of the Presidium RAS, integration project22 of SB RAS and FEB RAS, and also the FCP NK-744P/6 .
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Вид документа : Статья из сборника (однотомник)
Шифр издания :
Автор(ы) : Maximova O. A., Lyashchenko S. A., Yakovlev I. A., Shvetsov D. V., Andryushchenko T. A., Varnakov S. N., Ovchinnikov S. G.
Заглавие : Data processing algorithms for magneto-optical ellipsometry of thin films with optical uniaxial anisotropy
Коллективы : International Baltic Conference on Magnetism, Балтийский федеральный университет им. И. Канта
Место публикации : V International Baltic Conference on Magnetism. IBCM: Book of abstracts. - 2023. - P.126
Примечания : Cited References: 5. - РНФ № 21-12-00226
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Вид документа : Статья из журнала
Шифр издания :
Автор(ы) : Lyashchenko S. A., Varnakov S. N., Ovchinnikov S. G., Berezitskaya E. P., Alexandrova G. A., Vaituzin O. P.
Заглавие : Determination of structural parameters of the Fe-Si-system by spectral ellipsometry method
Коллективы : Asian School-Conference on Physics and Technology of Nanostructured Materials, Азиатская школа-конференция по физике и технологии наноструктурированных материалов
Место публикации : Asian School-Conference on Physics and Technology of Nanostructured Materials (1 ; 2011 ; Aug. ; 21-28 ; Vladivostok)Азиатская школа-конференция по физике и технологии наноструктурированных материалов (1 ; 2011 ; авг. ; 21-28 ; Владивосток). Physics Procedia. - 2012. - Vol. 23. - P.49-52. - ISSN 1875-3884, DOI 10.1016/j-phpro.2011.01.013
Ключевые слова (''Своб.индексиров.''): spectral ellipsometry--silicides--atomic force microscopic
Аннотация: Limitation of the thin homogeneous layers with sharp interfaces model for the structure Si(100)/FeSi2(grain) in solution the inverse problem of ellipsometry in the visible spectral range is shown. A new model of random distribution of thin disks for describing the real structure of the sample is designed. The results of the model optimization are confirmed by AFM.
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Вид документа : Статья из сборника (выпуск монографической серии)
Шифр издания :
Автор(ы) : Maximova O. A., Kosyrev N. N., Varnakov S. N., Lyashchenko S. A., Tarasov I. A., Yakovlev I. A., Maximova O. M., Shevtsov D. V., Ovchinnikov S. G.
Заглавие : Development of in situ magneto-ellipsometry for studying correlation between the optical and magneto-optical properties of ferromagnetic thin films
Коллективы : Joint European Magnetic Symposia , Russian Foundation for Basic Research [16-32-00209 mol_a, 14-02-01211, 16-42-24083]; Complex program of SB RAS [II.2P, 0358-2015-0004]; Ministry of Education and Science of the RF [16.663.2014kappa]; Grant of the President of the Russian Federation [7559.2016.2]
Место публикации : J. Phys.: Conf. Ser. - 2017. - Vol. 903. - Ст.012060. - , DOI 10.1088/1742-6596/903/1/012060
Примечания : Cited References:7. - The work was supported partly by the Russian Foundation for Basic Research Grant No. 16-32-00209 mol_a, Grant No. 14-02-01211, Grant No. 16-42-24083; the Complex program of SB RAS No II.2P, project 0358-2015-0004; the Ministry of Education and Science of the RF (State task No. 16.663.2014 kappa); Grant of the President of the Russian Federation (Scientific School No. 7559.2016.2).
Аннотация: In this work we present the way of nanostructured films study by means of magneto-ellipsometry. The method of interpretation of in situ magneto-optical ellipsometry spectra from the in situ molecular beam epitaxy setup with an integrated magneto-ellipsometric real time synthesis control is described. The method has been successfully tested on Fe/SiO2/Si nanostructures within the model of a homogeneous semi-infinite medium. As a result, the dielectric tensor components for Fe layer were calculated using a developed approach.
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Вид документа : Статья из сборника (однотомник)
Шифр издания :
Автор(ы) : Maximova O. A., Kosyrev N. N., Ovchinnikov S. G.
Заглавие : Development of spectroscopic magneto-ellipsometry for studying of magneto-optical properties of ferromagnetic nanostructures
Коллективы : Asian School-Conference on Physics and Technology of Nanostructured Materials, Азиатская школа-конференция по физике и технологии наноструктурированных материалов
Место публикации : Third Asian school-conference on physics and technology of nanostructured materials (ASCO-NANOMAT 2015): proceedings. - 2015. - Ст.VI.21.07p. - ISBN 978-5-8044-1556-4
Аннотация: The elements of the dielectric tensor ε are the subject of interest. In this paper a new method for obtaining diagonal and off-diagonal elements of this tensor is presented. In situ spectroscopic ellipsometry and magneto-ellipsometry measurements data from the in situ molecular beam epitaxy setup with an integrated magneto-ellipsometric real time control are used. The formulae and the algorithm for data analysis are obtained. The method is approved on the ferromagnetic nanostructures Fe/SiO2/Si.
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Вид документа : Статья из сборника (однотомник)
Шифр издания :
Автор(ы) : Maximova O. A., Lyashchenko S. A., Shevtsov D. V., Yakovlev I. A., Ovchinnikov S. G.
Заглавие : Development of techniques for processing data from magneto-ellipsometry measurements
Коллективы : Asian School-Conference on Physics and Technology of Nanostructured Materials, Азиатская школа-конференция по физике и технологии наноструктурированных материалов, Институт автоматики и процессов управления ДВО РАН, Дальневосточный федеральный университет
Место публикации : Fourth Asian school-conference on physics and technology of nanostructured materials (ASCO-NANOMAT 2018): proceedings/ progr. com. S. G. Ovchinnikov [et al.]. - 2018. - Ст.IV.25.05p. - P.180. - ISBN 978-5-7444-4368-9
Аннотация: The approach to data processing for layered thin films with a ferromagnet layer is proposed for studying optical and magneto- optical properties. The scope and applicability of models which describe reflective layered structures are studied in order to recommend the best model choice for each case. A significant effect of penetration depth on this choice was observed.
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Вид документа : Статья из журнала
Шифр издания :
Автор(ы) : Aver'yanov E. M.
Заглавие : Effective refractive index of a two-dimensional polycrystal
Место публикации : JETP Letters. - 2015. - Vol. 101, Is. 10. - P.685-689. - ISSN 0021-3640, DOI 10.1134/S0021364015100033
Примечания : Cited References: 28
Предметные рубрики: SPECTROSCOPIC ELLIPSOMETRY
CONJUGATED POLYMERS
LOCAL-FIELD
FILMS
CONDUCTIVITY
POLYFLUORENE
ANISOTROPY
DISPERSION
MEDIA
Аннотация: A relation of the effective refractive index of a two-dimensional polycrystalline dielectric film in the transparency region to the refractive indices n1 and n2 of crystallites at the positions of axes 1 and 2, respectively, of refraction ellipsoids of the crystallites in the plane of the film has been obtained. This relation and the relation L* = (L1 + L2)/2 between the components of the Lorentz tensors for the film and crystallites have been confirmed by comparison with experimental data for conjugate-polymer films with uniaxial domains.
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10.

Вид документа : Статья из журнала
Шифр издания :
Автор(ы) : Maximova O. A., Lyashchenko S. A., Vysotin M. A., Tarasov I. A., Yakovlev I. A., Shevtsov D. V., Fedorov A. S., Varnakov S. N., Ovchinnikov S. G.
Заглавие : Experimental and Theoretical In Situ Spectral Magneto-Ellipsometry Study of Layered Ferromagnetic Structures
Место публикации : JETP Letters. - 2019. - Vol. 110, Is. 3. - P.166-172. - ISSN 00213640 (ISSN), DOI 10.1134/S0021364019150098
Примечания : Cited References: 28. - This work was supported by the Ministry of Education and Science of the Russian Federation and the Siberian Branch, Russian Academy of Sciences (project nos. 0356-2018-0061 and II.8.70).
Аннотация: A method for processing of in situ spectral magneto-ellipsometry data has been developed to analyze planar ferromagnetic nanostructures. A multilayer model containing a ferromagnetic layer with two interfaces, a nonferromagnetic buffer layer, and a nonferromagnetic substrate has been tested within a new approach to the interpretation of magnetic-field-modulated spectral ellipsometric measurements involving the magnetooptical Kerr effect in the transverse configuration. In particular, the effect of the thickness of the ferromagnetic layer on the results of magneto-ellipsometric measurements has been analyzed. The measurements have been performed with polycrystalline Fe films with different thicknesses on a nonferromagnetic SiO2/Si(100) surface. The diagonal and off-diagonal components of the complex dielectric tensor in the spectral range of 1.38–3.45 eV have been determined by processing spectral magneto-ellipsometric data. The results have been compared to the available data obtained by other authors and to the calculation of the dielectric tensor of Fe within the density functional theory.
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