Библиотека института физики им. Л.В. Киренского СО РАН

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Каталог книг и брошюр библиотеки ИФ СО РАН

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Труды сотрудников ИФ СО РАН

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Вид документа : Статья из журнала
Шифр издания :
Автор(ы) : Komogortsev S. V., Varnakov S. N., Satsuk S. A., Yakovlev I. A., Ovchinnikov S. G.
Заглавие : Magnetic anisotropy in Fe films deposited on SiO2/Si(001) and Si(001) substrates
Место публикации : J. Magn. Magn. Mater.: Elsevier Science, 2014. - Vol. 351. - P.104-108. - ISSN 0304-8853, DOI 10.1016/j.jmmm.2013.09.058. - ISSN 873-4766
Примечания : Cited References: 40. - The work has been supported by RFBR Grant 11-03-00168-a, 12-02-00943-a, 13-02-01265-a, Interdisciplinary integration of fundamental research of SB RAS (2012-2014) project No. 64. Also the study was supported by The Ministry of Education and Science of Russian Federation, project 14.513.11.0016.
Предметные рубрики: UNIAXIAL ANISOTROPY
SURFACE
SILICON
ROUGHNESS
Ключевые слова (''Своб.индексиров.''): epitaxial growth--iron--magnetic anisotropy--thin film
Аннотация: The magnetic anisotropy of 10 nm iron films deposited in an ultra high vacuum on the Si(001) surface and on the Si(001) over caped by 1.5 nm layer of SiO2 was investigated. There is in-plane uniaxial magnetic anisotropy caused by oblique sputtering in the Fe films on a SiO2 buffer layer. The easy magnetization axis is always normal to the atomic flux direction but the value of the anisotropy field is different depending on the axial angle among sputtering direction and the substrate crystallographic axes. It is argued that the uniaxial magnetic anisotropy results from elongated surface roughness formation during film deposition. Several easy magnetization axes are found in Fe/Si(001) film without the SiO2 buffer layer. The mutual orientation of the main easy axes and Si crystallographic axes indicates that there is epitaxial growth of Fe/Si(001) film with the following orientation relative to the substrate: Fe[100] ?Si[110]. The anisotropy energy of Fe/Si(001) film is estimated by simulation of angle dependence of remnant magnetization m r as the sum of the mr angle plot from uniaxial anisotropy (induced by oblique deposition) and the polar plot from biaxial magnetocrystalline anisotropy. В© 2013 Elsevier B.V.
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Вид документа : Статья из журнала
Шифр издания :
Автор(ы) : Belyaev B. A., Izotov A. V.
Заглавие : FMR study of the anisotropic properties of an epitaxial Fe3Si film on a Si(111) vicinal surface
Место публикации : JETP Letters. - 2016. - Vol. 103, Is. 1. - P.41-45. - ISSN 00213640 (ISSN), DOI 10.1134/S0021364016010033
Примечания : Cited References: 28
Предметные рубрики: Thin magnetic-films
Ferromagnetic-resonance
Cobalt films
Metal-films
Spectrometer
Spintronics
Roughness
Аннотация: The anisotropic characteristics of an iron silicide (Fe3Si) epitaxial thin magnetic film grown on a Si(111) silicon vicinal surface with a misorientation angle of 0.14° have been measured by the ferromagnetic resonance method. It has been shown that the polar and azimuth misorientation angles of the crystallographic plane of the substrate can be determined simultaneously from the angular dependences of the ferromagnetic resonance field of the epitaxial film. The effective saturation magnetization of the film M eff = 1105 G and the constant of the cubic magnetocrystalline anisotropy K 4 = 1.15 × 105 erg/cm3 have been determined. The misorientation of the substrate plane leads to the formation of steps on the film surface and, as a result, to the appearance of uniaxial magnetic anisotropy of the magnetic dipole nature with the constant K 2 = 796 erg/cm3. Small unidirectional magnetic anisotropy (K 1 = 163 erg/cm3), which may be associated with symmetry breaking on the steps of the film and is due to the Dzyaloshinskii–Moriya interaction, has been detected.
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Вид документа : Статья из журнала
Шифр издания :
Автор(ы) : Gritsenko, C.h., Dzhun I., Volochaev M. N., Gorshenkov M., Babaytsev G., Chechenin N., Sokolov A. Е., Tretiakov, Oleg A., Rodionova V.
Заглавие : Temperature-dependent magnetization reversal in exchange bias NiFe/IrMn/NiFe structures
Коллективы : Russian Foundation for Basic Research (RFBR) [17-32-50170]; MEXT, Japan [17 K05511, 17H05173]; Center for Science and Innovation in Spintronics (Core Research Cluster), Tohoku University; JSPS; RFBR under the Japan-Russian Research Cooperative Program; Ministry of Education and Science of the Russian Federation [3.9002.2017/6.7]
Место публикации : J. Magn. Magn. Mater. - 2019. - Vol. 482. - P.370-375. - ISSN 0304-8853, DOI 10.1016/j.jmmm.2019.03.044. - ISSN 1873-4766(eISSN)
Примечания : Cited References: 55. - Ch. G. and M. G. acknowledge financial support by the Russian Foundation for Basic Research (RFBR grant. 17-32-50170). Ch. G. acknowledges the 5 top 100 Russian Academic Excellence Project at the Immanuel Kant Baltic Federal University. O.A.T. acknowledges support by the Grants-in-Aid for Scientific Research (Grant Nos. 17 K05511 and 17H05173) from MEXT, Japan, by the grant of the Center for Science and Innovation in Spintronics (Core Research Cluster), Tohoku University, by JSPS and RFBR under the Japan-Russian Research Cooperative Program. V.R. acknowledges the Ministry of Education and Science of the Russian Federation in the framework of government assignment 3.9002.2017/6.7. Electron microscopy examination was carried out at the Center for Collective Use of the Krasnoyarsk Scientific Center of the Siberian Branch of the Russian Academy of Sciences. We also thank Montserrat Rivas for helpful discussions.
Предметные рубрики: COERCIVITY
FILM
ROUGHNESS
THICKNESS
HEADS
IRMN
Аннотация: We demonstrate magnetization reversal features in NiFe/IrMn/NiFe thin-film structures with 40% and 75% relative content of Ni in Permalloy in the temperature range from 80 K to 300 K. The magnetization reversal sequence of the two ferromagnetic layers is found to depend on the type of NiFe alloy. In the samples with 75% relative content of Ni, the bottom ferromagnetic layer reverses prior to the top one. On the contrary, in the samples with 40% of Ni, the top ferromagnetic layer reverses prior to the bottom one. These tendencies of magnetization reversal are preserved in the entire range of temperatures. These distinctions can be explained by the morphological and structural differences of interfaces in the samples based on two types of Permalloy.
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Вид документа : Статья из журнала
Шифр издания :
Автор(ы) : Belyaev B. A., Izotov A. V., Skomorokhov G. V., Solovev P. N.
Заглавие : Experimental study of the magnetic characteristics of nanocrystalline thin films: the role of edge effects
Коллективы : RFBRRussian Foundation for Basic Research (RFBR) [18-32-00086]; Ministry of Science and Higher Education of the Russian Federation [3.1031.2017/PCh]
Место публикации : Mater. Res. Express. - 2019. - Vol. 6, Is. 11. - Ст.116105. - ISSN 2053-1591, DOI 10.1088/2053-1591/ab4456
Примечания : Cited References: 37. - This work was supported by RFBR according to the research project no. 18-32-00086 and by the Ministry of Science and Higher Education of the Russian Federation no. 3.1031.2017/PCh.
Предметные рубрики: FERROMAGNETIC-RESONANCE
ANISOTROPIES
ROUGHNESS
SUBSTRATE
Аннотация: Magnetic characteristics and their spatial distribution of magnetron sputtered nanocrystalline NiFe thin films of various compositions were investigated by ferromagnetic resonance (FMR) and magneto-optical Kerr effect microscopy. A sharp increase in the FMR line width and a strong deviation of the uniaxial magnetic anisotropy field were observed near the film edges. It was shown that the observed magnetic anisotropy behavior can be explained by assuming that besides the field-induced uniaxial magnetic anisotropy an additional source of the uniaxial anisotropy near the film edges exists, with the easy axis parallel to the edges. The possible origins of this additional contribution were discussed.
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Вид документа : Статья из журнала
Шифр издания :
Автор(ы) : Muzalevskiy K. V., Zeyliger, Anatoly
Заглавие : Application of Sentinel-1B polarimetric observations to soil moisture retrieval using neural networks: Case study for bare Siberian chernozem soil
Коллективы : Russian Foundation for Basic ResearchRussian Foundation for Basic Research (RFBR) [19-29-05261 mk]; Ministry of Science and Higher Education of the Russian Federation [0287-2021-0034]
Место публикации : Remote Sens. - 2021. - Vol. 13, Is. 17. - Ст.3480. - ISSN 2072-4292(eISSN), DOI 10.3390/rs13173480
Примечания : Cited References: 21. - This work was supported by the Russian Foundation for Basic Research (grant No. 19-29-05261 mk). The field experiment and EC-5 Decagon sensor calibration in laboratory conditions were carried out with the support of Ministry of Science and Higher Education of the Russian Federation, project No. 0287-2021-0034 (basic state assignment)
Предметные рубрики: SURFACE
MODEL
PARAMETERS
ROUGHNESS
INVERSION
DUBOIS
IEM
OH
Аннотация: Sentinel-1 is currently the only synthetic-aperture radar, which radar measurements of the earth’s surface to be carried out, regardless of weather conditions, with high resolution up to 5–40 m and high periodicity from several to 12 days. Sentinel-1 creates a technological platform for the development of new globally remote sensing algorithms of soil moisture, not only for hydrological and climatic model applications, but also on a single field scale for individual farms in precision farming systems used. In this paper, the potential of soil moisture remote sensing using polarimetric Sentinel-1B backscattering observations was studied. As a test site, the fallow agricultural field with bare soil near the Minino village (56.0865°N, 92.6772°E), Krasnoyarsk region, the Russian Federation, was chosen. The relationship between the cross-polarized ratio, reflectivity, and the soil surface roughness established Oh used as a basis for developing the algorithm of soil moisture retrieval with neural networks (NNs) computational model. Two NNs is used as a universal regression technique to establish the relationship between scattering anisotropy, entropy and backscattering coefficients measured by the Sentinel-1B on the one hand and reflectivity on the other. Finally, the soil moisture was found from the soil reflectivity in solving the inverse problem using the Mironov dielectric model. During the field campaign from 21 May to 25 August 2020, it was shown that the proposed approach allows us to predict soil moisture values in the layer thickness of 0.00–0.05 m with the root-mean-square error and determination coefficient not worse than 3% and 0.726, respectively. The validity of the proposed approach needs additional verification on a wider dataset using soils of different textures, a wide range of variations in soil surface roughness, and moisture.
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