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1.

Вид документа : Статья из журнала
Шифр издания :
Автор(ы) : Belyaev B. A., Lemberg K. V., Serzhantov, Alexey M., Leksikov Al. A., Bal'va Y. F., Leksikov An. A.
Заглавие : Magnetically tunable resonant phase shifters for UHF band
Коллективы : Ministry of Education and Science of the Russian Federation [3.528.2014K]
Место публикации : IEEE Trans. Magn.: IEEE-Institute Electrical and Electronics Engineers, 2015. - Vol. 51, Is. 6. - Ст.4003205. - ISSN 0018, DOI 10.1109/TMAG.2014.2368513. - ISSN 19410069(eISSN)
Примечания : Cited References:22. - This work was supported by the Ministry of Education and Science of the Russian Federation, task no. 3.528.2014K.
Предметные рубрики: FERROMAGNETIC-RESONANCE
COMPACT
SPECTROMETER
FERRITE
FILMS
LINE
Ключевые слова (''Своб.индексиров.''): ferrite--microstrip structure--microwave--tunable phase shifter
Аннотация: This paper presents a new type of magnetically tunable phase shifter. The shifter has the structure of microstrip bandpass filter on a substrate containing magnetic material whose magnetic permeability is controlled by magnetic field due to ferromagnetic resonance. The phase shifter's operation is based on the fact that phase shift in a bandpass filter changes with tuning of its central frequency. Two types of devices were designed and fabricated for the UHF band. One of them has a five-layer NiFe film as an active medium and demonstrates a figure of merit of 40°/dB achieved already at 20 Oe of the controlling magnetic field in 10% of the relative operational bandwidth. The second device with YIG ferrite as an active medium gave 360° tunable phase shift in 5% operational bandwidth that corresponds to the figure of merit of 150°/dB (3.1°/dB·Oe).
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2.

Вид документа : Статья из журнала
Шифр издания :
Автор(ы) : Belyaev B. A., Izotov A. V.
Заглавие : FMR study of the anisotropic properties of an epitaxial Fe3Si film on a Si(111) vicinal surface
Место публикации : JETP Letters. - 2016. - Vol. 103, Is. 1. - P.41-45. - ISSN 00213640 (ISSN), DOI 10.1134/S0021364016010033
Примечания : Cited References: 28
Предметные рубрики: Thin magnetic-films
Ferromagnetic-resonance
Cobalt films
Metal-films
Spectrometer
Spintronics
Roughness
Аннотация: The anisotropic characteristics of an iron silicide (Fe3Si) epitaxial thin magnetic film grown on a Si(111) silicon vicinal surface with a misorientation angle of 0.14° have been measured by the ferromagnetic resonance method. It has been shown that the polar and azimuth misorientation angles of the crystallographic plane of the substrate can be determined simultaneously from the angular dependences of the ferromagnetic resonance field of the epitaxial film. The effective saturation magnetization of the film M eff = 1105 G and the constant of the cubic magnetocrystalline anisotropy K 4 = 1.15 × 105 erg/cm3 have been determined. The misorientation of the substrate plane leads to the formation of steps on the film surface and, as a result, to the appearance of uniaxial magnetic anisotropy of the magnetic dipole nature with the constant K 2 = 796 erg/cm3. Small unidirectional magnetic anisotropy (K 1 = 163 erg/cm3), which may be associated with symmetry breaking on the steps of the film and is due to the Dzyaloshinskii–Moriya interaction, has been detected.
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3.

Вид документа : Статья из журнала
Шифр издания :
Автор(ы) : Belyaev B. A., Izotov A. V., Kiparisov S. Y., Skomorokhov G. V.
Заглавие : Synthesis and study of the magnetic characteristics of nanocrystalline cobalt films
Место публикации : Phys. Solid State. - 2008. - Vol. 50, Is. 4. - P.676-683. - ISSN 1063-7834, DOI 10.1134/S1063783408040136
Примечания : Cited References: 13
Предметные рубрики: FERROMAGNETIC-RESONANCE
SPECTROMETER
Аннотация: The effect of various technological factors on the main magnetic characteristics of nanocrystalline cobalt films obtained by chemical deposition is studied. The effective saturation magnetization, uniaxial anisotropy, coercive force, and other characteristics of local spots of films were measured using a scanning FMR spectrometer over the decimeter wavelength range. A technique for preparing substrates is developed, and the optimum technological conditions of thin-film synthesis are found making it possible to significantly decrease magnetic inhomogeneities across the area and thickness of samples. It is shown that one can significantly decrease the FMR linewidth and increase the magnetic permeability of films in a given microwave frequency range.
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4.

Вид документа : Статья из журнала
Шифр издания :
Автор(ы) : Belyaev B. A., Izotov A. V., Solovev P. N., Yakovlev I. A.
Заглавие : Determination of magnetic anisotropies and miscut angles in epitaxial thin films on vicinal (111) substrate by the ferromagnetic resonance
Коллективы : Euro-Asian Symposium "Trends in MAGnetism", "Trends in MAGnetism", Euro-Asian Symposium, Институт физики им. Л.В. Киренского Сибирского отделения РАН , Ministry of Education and Science of the Russian Federation [3.528.2014K]
Место публикации : J. Magn. Magn. Mater.: Elsevier Science, 2017. - Vol. 440: EURO-Asian Symposium on Trends in Magnetism (EASTMAG) (AUG 15-19, 2016, Siberian Fed Univ, Krasnoyarsk, RUSSIA). - P.181-184. - ISSN 0304-8853, DOI 10.1016/j.jmmm.2016.12.081. - ISSN 1873-4766(eISSN)
Примечания : Cited References:16. - This work was supported by the Ministry of Education and Science of the Russian Federation, Task no. 3.528.2014K.
Предметные рубрики: SURFACE
SPECTROMETER
SPINTRONICS
Ключевые слова (''Своб.индексиров.''): thin film--ferromagnetic resonance--magnetic anisotropy--vicinal (111)--surface--iron silicide
Аннотация: A method for determining magnetic anisotropy parameters of a thin single-crystal film on vicinal (111) substrate as well as substrate miscut angles from angular dependence of ferromagnetic resonance field has been proposed. The method is based on the following: (i) a new approach for the solution of the system of nonlinear equations for equilibrium and resonance conditions; (ii) a new expression of the objective function for the fitting problem. The study of the iron silicide films grown on vicinal Si(111) substrates with different miscut angles confirmed the efficiency of the method. The proposed method can be easily generalized to determine parameters of single-crystal films grown on substrates with an arbitrary cut.
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