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Вид документа : Статья из журнала
Шифр издания :
Автор(ы) : Belyaev B. A., Izotov A. V., Solovev P. N.
Заглавие : Competing magnetic anisotropies in obliquely deposited thin permalloy film
Место публикации : Physica B. - 2016. - Vol. 481. - P.86-90. - ISSN 0921-4526, DOI 10.1016/j.physb.2015.10.036
Примечания : Cited References: 31. - This study was supported by the Ministry of Education and Science of the Russian Federation, task no. 3.528.2014K
Предметные рубрики: FERROMAGNETIC-RESONANCE
MICROMAGNETIC CALCULATION
Ключевые слова (''Своб.индексиров.''): thin film--magnetic anisotropy--oblique deposition--ferromagnetic resonance--micromagnetic simulation
Аннотация: Distribution of the magnetic anisotropy in thin film prepared by thermal vacuum oblique deposition of permalloy with small off-normal angle of incident in the presence of an external magnetic field has been studied by ferromagnetic resonance technique. On local area of the sample, a mutual compensation of near orthogonal in-plane uniaxial magnetic anisotropies induced by oblique deposition and by applied magnetic field has been found. Moreover, in addition to the uniaxial (twofold) magnetic anisotropy, fourfold and sixfold magnetic anisotropies have been observed in the sample. To explain the obtained high-order anisotropies, we assumed that the sample has exchange coupled adjacent regions or phases with different parameters of magnetic anisotropy. The results of the micromagnetic analysis of a two-layer model of the sample confirm the hypothesis. © 2015 Elsevier B.V. All rights reserved.
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Вид документа : Статья из журнала
Шифр издания :
Автор(ы) : Belyaev B. A., Izotov A. V., Solovev P. N., Yakovlev I. A.
Заглавие : Determination of magnetic anisotropies and miscut angles in epitaxial thin films on vicinal (111) substrate by the ferromagnetic resonance
Коллективы : Euro-Asian Symposium "Trends in MAGnetism", "Trends in MAGnetism", Euro-Asian Symposium, Институт физики им. Л.В. Киренского Сибирского отделения РАН , Ministry of Education and Science of the Russian Federation [3.528.2014K]
Место публикации : J. Magn. Magn. Mater.: Elsevier Science, 2017. - Vol. 440: EURO-Asian Symposium on Trends in Magnetism (EASTMAG) (AUG 15-19, 2016, Siberian Fed Univ, Krasnoyarsk, RUSSIA). - P.181-184. - ISSN 0304-8853, DOI 10.1016/j.jmmm.2016.12.081. - ISSN 1873-4766(eISSN)
Примечания : Cited References:16. - This work was supported by the Ministry of Education and Science of the Russian Federation, Task no. 3.528.2014K.
Предметные рубрики: SURFACE
SPECTROMETER
SPINTRONICS
Ключевые слова (''Своб.индексиров.''): thin film--ferromagnetic resonance--magnetic anisotropy--vicinal (111)--surface--iron silicide
Аннотация: A method for determining magnetic anisotropy parameters of a thin single-crystal film on vicinal (111) substrate as well as substrate miscut angles from angular dependence of ferromagnetic resonance field has been proposed. The method is based on the following: (i) a new approach for the solution of the system of nonlinear equations for equilibrium and resonance conditions; (ii) a new expression of the objective function for the fitting problem. The study of the iron silicide films grown on vicinal Si(111) substrates with different miscut angles confirmed the efficiency of the method. The proposed method can be easily generalized to determine parameters of single-crystal films grown on substrates with an arbitrary cut.
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Вид документа : Статья из журнала
Шифр издания :
Автор(ы) : Belyaev B. A., Boev N. M., Izotov A. V., Solovev P. N.
Заглавие : Domain structure and magnetization reversal in multilayer structures consisting of thin permalloy films separated with nonmagnetic interlayers
Коллективы : Ministry of Science and Higher EducationMinistry of Science and Higher Education, PolandEuropean Commission
Место публикации : Russ. Phys. J. - 2021. - Vol. 64, Is. 6. - P.1160-1167. - ISSN 1064-8887, DOI 10.1007/s11182-021-02436-w. - ISSN 1573-9228(eISSN)
Примечания : Cited References: 30. - This work was financially supported by the Ministry of Science and Higher Education under agreement No. 075-11-2019-054 November 22, 2019
Предметные рубрики: MICROMAGNETIC CALCULATION
MAGNETOMETER
SIMULATION
NOISE
Аннотация: Using numerical micromagnetic modeling, we have investigated the development of domain structure and magnetization reversal in multilayer thin-film structures. The permalloy (Ni80Fe20) magnetic layers had the inplane uniaxial and perpendicular magnetic anisotropy. We found that as the thickness of nonmagnetic interlayers decreases, the in-plane configuration of magnetic moments in the permalloy layers transforms from a single domain state to stripe domains, which is caused by the increase of magnetostatic interaction between layers. In structures with "thick" interlayers, even weak magnetostatic interaction enforces the neighboring single domain permalloy layers to have opposite orientations of magnetic moments. The saturation field of such samples increases linearly with the number of layers. By analyzing the dynamic characteristics of multilayers, we determined the optimum number of layers ensuring the maximum conversion efficiency of wideband microwave microstrip sensors of weak magnetic fields.
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Вид документа : Статья из журнала
Шифр издания :
Автор(ы) : Belyaev B. A., Izotov A. V., Skomorokhov G. V., Solovev P. N.
Заглавие : Experimental study of the magnetic characteristics of nanocrystalline thin films: the role of edge effects
Коллективы : RFBRRussian Foundation for Basic Research (RFBR) [18-32-00086]; Ministry of Science and Higher Education of the Russian Federation [3.1031.2017/PCh]
Место публикации : Mater. Res. Express. - 2019. - Vol. 6, Is. 11. - Ст.116105. - ISSN 2053-1591, DOI 10.1088/2053-1591/ab4456
Примечания : Cited References: 37. - This work was supported by RFBR according to the research project no. 18-32-00086 and by the Ministry of Science and Higher Education of the Russian Federation no. 3.1031.2017/PCh.
Предметные рубрики: FERROMAGNETIC-RESONANCE
ANISOTROPIES
ROUGHNESS
SUBSTRATE
Аннотация: Magnetic characteristics and their spatial distribution of magnetron sputtered nanocrystalline NiFe thin films of various compositions were investigated by ferromagnetic resonance (FMR) and magneto-optical Kerr effect microscopy. A sharp increase in the FMR line width and a strong deviation of the uniaxial magnetic anisotropy field were observed near the film edges. It was shown that the observed magnetic anisotropy behavior can be explained by assuming that besides the field-induced uniaxial magnetic anisotropy an additional source of the uniaxial anisotropy near the film edges exists, with the easy axis parallel to the edges. The possible origins of this additional contribution were discussed.
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Вид документа : Статья из журнала
Шифр издания :
Автор(ы) : Izotov A. V., Belyaev B. A., Boev N. M., Burmitskikh A. V., Skomorokhov G. V., Zharkov S. M., Solovev P. N.
Заглавие : Ferromagnetic resonance line broadening and shift effect in nanocrystalline thin magnetic films: Relation with crystalline and magnetic structure
Коллективы : RFBRRussian Foundation for Basic Research (RFBR); Government of Krasnoyarsk Territory; Krasnoyarsk Regional Fund; JSC "NPP "Radiosviaz" [20-42-242901]; Ministry of Science and Higher Education of the Russian Federation [075-11-2019-054, FSRZ-2020-0011]
Место публикации : J. Alloy. Compd. - 2022. - Vol. 900. - Ст.163416. - ISSN 0925-8388, DOI 10.1016/j.jallcom.2021.163416. - ISSN 1873-4669(eISSN)
Примечания : Cited References: 52. - The reported study was funded by RFBR, the Government of Krasnoyarsk Territory, Krasnoyarsk Regional Fund and JSC "NPP "Radiosviaz", project number 20-42-242901 and was supported by the Ministry of Science and Higher Education of the Russian Federation, agreement number 075-11-2019-054 dated 22.11.2019.; The electron microscopy investigations were conducted in the SFU Joint Scientific Center whose infrastructure was supported by the State assignment (#FSRZ-2020-0011) of the Ministry of Science and Higher Education of the Russian Federation
Предметные рубрики: SUSCEPTIBILITY
RIPPLE
ANISOTROPIES
ALLOYS
Аннотация: With the rapid development of telecommunication technologies and highly integrated electronic devices, researchers show great interest in nanocrystalline soft magnetic thin films with unique characteristics for microwave applications. An important direction of the current research in this field is the study of high-frequency magnetization dynamics that directly depends on the damping processes in a magnetic medium. This paper reports on the effect of sharp broadening and shift of the ferromagnetic resonance (FMR) line revealed experimentally in a 40-nm-thick nanocrystalline permalloy (Fe20Ni80) thin film at a frequency of about 5 GHz. The effect arises only in films with crystallite size exceeding some critical value Dcr. The micromagnetic simulation demonstrates that exchange and dipolar interactions between randomly oriented crystallites form in the film a quasiperiodic magnetic structure with a characteristic wavelength in the range from 36 nm to 3.3 µm. An analysis of the two-magnon scattering model and simulation results shows that the formed magnetic structure provides the energy transfer from uniform magnetization oscillations (uniform FMR) to spin waves, which results in an additional energy dissipation channel and, consequently, sharp FMR line broadening. A theoretical estimate of the critical crystallite size Dcr based on this model yields a value of ~14.3 nm for 40-nm-thick Fe20Ni80 films.
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Вид документа : Статья из журнала
Шифр издания :
Автор(ы) : Izotov A. V., Belyaev B. A., Solovev P. N., Boev N. M.
Заглавие : Grain-size dependence of magnetic microstructure and high-frequency susceptibility of nanocrystalline thin films: A micromagnetic simulation study
Место публикации : J. Magn. Magn. Mater. - 2021. - Vol. 529. - Ст.167856. - ISSN 03048853 (ISSN), DOI 10.1016/j.jmmm.2021.167856
Примечания : Cited References: 73. - The reported study was funded by RFBR, the Government of Krasnoyarsk Territory, Krasnoyarsk Regional Fund and JSC «NPP «Radiosviaz», project number 20-42-242901
Аннотация: The size of crystallites is one of the most important factors that determine the key characteristics of nanocrystalline thin magnetic films that make them very promising media for various applications. In this paper, using micromagnetic simulation, we study in detail the influence of the grain size on the magnetic microstructure of the films and its relation with high-frequency dynamics of magnetization. When the grain size exceeds some critical value Dcr, a sharp broadening and shift of the ferromagnetic resonance line are observed at certain frequencies of the alternating magnetic field. Using a two-magnon scattering model, it is shown that these effects are caused by the scattering of spin waves on the inhomogeneous stochastic magnetic structure—magnetization ripple. An expression for the determination of the critical size Dcr is obtained. The micromagnetic simulation results agree with the main conclusions of the static and dynamic theories of magnetization ripple and also confirmed by experimental data reported by other authors.
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Вид документа : Статья из журнала
Шифр издания :
Автор(ы) : Belyaev B. A., Izotov A. V., Solovev P. N.
Заглавие : Growth simulation and structure analysis of obliquely deposited thin films
Коллективы : Ministry of Education and Science of the Russian Federation [A3.528.2014K]
Место публикации : Russ. Phys. J.: Springer, 2016. - Vol. 59, Is. 2. - P.301-307. - ISSN 1064-8887, DOI 10.1007/s11182-016-0771-2. - ISSN 1573-9228(eISSN)
Примечания : Cited References:27. - This work was supported in part by State Assignment for R&D A3.528.2014K of Ministry of Education and Science of the Russian Federation to Siberian Federal University in 2014.
Предметные рубрики: GLANCING ANGLE DEPOSITION
EVAPORATION
ANISOTROPY
Ключевые слова (''Своб.индексиров.''): oblique angle deposition--simulation of film growth--monte carlo method
Аннотация: Based on the Monte Carlo method, a model of growth of thin films prepared by oblique angle deposition of particles is constructed. The morphology of structures synthesized by simulation is analyzed. To study the character of distribution of microstructural elements (columns) in the film plane, the autocorrelation function of the microstructure and the fast Fourier transform are used. It is shown that with increasing angle of particle incidence, the film density monotonically decreases; in this case, anisotropy arises and monotonically increases in the cross sections of columns, and the anisotropy of distribution of columns in the substrate plane also increases.
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Вид документа : Статья из сборника (однотомник)
Шифр издания :
Автор(ы) : Belyaev B. A., Izotov A. V., Solovev P. N.
Заглавие : Influence the technological conditions of vacuum deposition of thin magnetic films on produced samples properties
Коллективы : Euro-Asian Symposium "Trends in MAGnetism": Nanomagnetism
Место публикации : V Euro-Asian simposium "Trend in MAGnetism": Nanomagnetism: abstracts. - Vladivostok: FEFU, 2013. - P.184. - ISBN 978-5-7444-3124-2
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Вид документа : Статья из сборника (однотомник)
Шифр издания :
Автор(ы) : Belyaev B. A., Izotov A. V., Solovev P. N.
Заглавие : Influence the technological conditions of vacuum deposition of thin magnetic films on produced samples properties
Коллективы : Euro-Asian Symposium "Trends in MAGnetism": Nanomagnetism
Место публикации : V Euro-Asian simposium "Trend in MAGnetism": Nanomagnetism: abstracts. - Vladivostok: FEFU, 2013. - P.229. - ISBN 978-5-7444-3124-2
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10.

Вид документа : Статья из журнала
Шифр издания :
Автор(ы) : Solovev P. N., Belyaev B. A., Boev N. M., Skomorokhov G. V., Izotov A. V.
Заглавие : Magnetic anisotropy and ferromagnetic resonance in inhomogeneous demagnetizing fields near edges of thin magnetic films
Колич.характеристики :12 с
Место публикации : J. Phys. Condens. Matter. - 2024. - Vol. 36, Is. 19. - Ст.195803. - ISSN 09538984 (ISSN), DOI 10.1088/1361-648X/ad258c. - ISSN 1361648X (eISSN)
Примечания : Cited References: 38
Аннотация: Using local ferromagnetic resonance spectroscopy, we have studied the magnetic properties near edges of thin tangentially magnetized permalloy films, in which a well-defined uniaxial magnetic anisotropy was induced perpendicular to one of the edges. In the experiment, two samples with thicknesses of 90 and 300 nm and with slightly different compositions were examined. To explain the magnetization dynamics near edges, we propose a simple yet effective model of a film in the form of a rectangular prism, which yields the modified Kittel formula for the resonance frequency. In this formula, the locally averaged distance-dependent demagnetizing field that emerges near the edges is included as an additional uniaxial anisotropy term. The measurements reveal that at a certain distance from the edge, the resulting (apparent) anisotropy, determined from the angular dependencies of the resonance field, almost vanishes. Moreover, its easy axis reorients to become parallel to the edge. The model predictions agree well with these results, proving that the main resonance mode behavior near the film edges can be accurately described by introducing additional effective uniaxial anisotropy, provided the measuring area is relatively large. However, for the thick (300 nm) sample, additional precession modes are also observed. These modes distort the angular dependence of the main mode, thus demonstrating the limitations of the model.
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