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Вид документа : Статья из журнала
Шифр издания :
Автор(ы) : Lyashchenko S. A., Popov Z. I., Varnakov S. N., Popov E. A., Molokeev M. S., Yakovlev I. A., Kuzubov A. A., Ovchinnikov S. G., Shamirzaev T. S., Latyshev A. V., Saranin A. A.
Заглавие : Analysis of optical and magnetooptical spectra of Fe5Si3 and Fe3Si magnetic silicides using spectral magnetoellipsometry
Коллективы : Ministry of Education and Science of the Russian Federation [16.663.2014K, 14.604.21.0002 (RFMEFI60414X0002), 02.G25.31.0043], Russian Foundation for Basic Research [13-02-01265, 14-02-31309]
Место публикации : J. Exp. Theor. Phys.: MAIK Nauka-Interperiodica / Springer, 2015. - Vol. 120, Is. 5. - P.886-893. - ISSN 1063, DOI 10.1134/S1063776115050155. - ISSN 10906509(eISSN)
Примечания : Cited References:31. - This study was financially supported by the Ministry of Education and Science of the Russian Federation (state assignment no. 16.663.2014K, agreement no. 14.604.21.0002 (RFMEFI60414X0002), and contract no. 02.G25.31.0043), the Program is Support of Leading Scientific Schools (project no. NSh-2886.2014.2), and the Russian Foundation for Basic Research (project nos. 13-02-01265 and 14-02-31309).
Предметные рубрики: INITIO MOLECULAR-DYNAMICS
AUGMENTED-WAVE METHOD
FILMS
ELLIPSOMETRY
Аннотация: The optical, magnetooptical, and magnetic properties of polycrystalline (Fe5Si3/SiO2/Si(100)) and epitaxial Fe3Si/Si(111) films are investigated by spectral magnetoellipsometry. The dispersion of the complex refractive index of Fe5Si3 is measured using multiangle spectral ellipsometry in the range of 250–1000 nm. The dispersion of complex Voigt magnetooptical parameters Q is determined for Fe5Si3 and Fe3Si in the range of 1.6–4.9 eV. The spectral dependence of magnetic circular dichroism for both silicides has revealed a series of resonance peaks. The energies of the detected peaks correspond to interband electron transitions for spin-polarized densities of electron states (DOS) calculated from first principles for bulk Fe5Si3 and Fe3Si crystals.
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Вид документа : Статья из журнала
Шифр издания :
Автор(ы) : Aver'yanov E. M.
Заглавие : Effective refractive index of a two-dimensional polycrystal
Место публикации : JETP Letters. - 2015. - Vol. 101, Is. 10. - P.685-689. - ISSN 0021-3640, DOI 10.1134/S0021364015100033
Примечания : Cited References: 28
Предметные рубрики: SPECTROSCOPIC ELLIPSOMETRY
CONJUGATED POLYMERS
LOCAL-FIELD
FILMS
CONDUCTIVITY
POLYFLUORENE
ANISOTROPY
DISPERSION
MEDIA
Аннотация: A relation of the effective refractive index of a two-dimensional polycrystalline dielectric film in the transparency region to the refractive indices n1 and n2 of crystallites at the positions of axes 1 and 2, respectively, of refraction ellipsoids of the crystallites in the plane of the film has been obtained. This relation and the relation L* = (L1 + L2)/2 between the components of the Lorentz tensors for the film and crystallites have been confirmed by comparison with experimental data for conjugate-polymer films with uniaxial domains.
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Вид документа : Статья из журнала
Шифр издания :
Автор(ы) : Aver'yanov E. M.
Заглавие : Influence of the dimension of a polycrystalline film and the optical anisotropy of crystallites on the effective dielectric constant of the film
Место публикации : Phys. Solid State: MAIK Nauka-Interperiodica / Springer, 2016. - Vol. 58, Is. 8. - P.1634-1641. - ISSN 10637834 (ISSN), DOI 10.1134/S1063783416080035
Примечания : Cited References: 41
Предметные рубрики: EFFECTIVE REFRACTIVE-INDEX
CONJUGATED POLYMER
POLY(P-PHENYLENE VINYLENE)
SPECTROSCOPIC ELLIPSOMETRY
ELECTRICAL-CONDUCTIVITY
LOCAL-FIELD
THIN-FILMS
DISPERSION
POLYFLUORENE
DEVICES
Аннотация: The dimension D of a polycrystalline film and the optical anisotropy m = εz/εx of uniaxial crystallites with the principal components εx = εy and εz of the tensor of the dielectric constant have been shown to produce a strong influence on the effective dielectric constant εD* and the effective refractive index nD* = (εD*)1/2 of the film in the optical transparency region, as well as on the boundaries of the intervals BDl ≤ εD* ≤ BDu. The intervals Δ2(m) = B2l–B2u and Δ3(m) = B3l–B3u are separated by a gap for m in the range 1 m 2, whereas the theoretical dependence ε2*(m) is separated by a gap from the interval Δ3(m) for m in the range 1 m 4. This is confirmed by a comparison of the experimental (noP) and theoretical (nD*) ordinary refractive indices for uniaxial polycrystalline films of the conjugated polymer poly(p-phenylene vinylene) (PPV) with uniaxial crystallites and appropriate values of m. In the visible transparency region of the PPV films with a change in m(λ) in the range 2 m(λ) 3 due to the dependence of the components εx,z(λ) on the light wavelength λ, the refractive indices noP2(λ) 3 near the electronic absorption band of the crystallites, the values of εoP(λ) lie in the region of the overlap of the intervals Δ2(m) and Δ3(m). The boundaries mc of the range 1 m mc are determined, for which the interval Δ2(m) is separated by a gap from the dependences ε3*(m) corresponding to the effective medium theory with spherical crystallites and hierarchical models of a polycrystal, as well as from the proposed new dependence ε3*(m).
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Вид документа : Статья из сборника (однотомник)
Шифр издания :
Автор(ы) : Kosyrev N. N., Varnakov S. N., Tarasov I. A., Lyashenko S. A., Ovchinnikov S. G.
Заглавие : Characterization of manganese and iron silicides by in situ spectral generalized magneto-optical ellipsometry
Коллективы : Workshop Ellipsometry (7; 2012 ; март ; 5-7; Leipzig, Germany)
Место публикации : 7th Workshop on Ellipsometry: abstract book. - 2012. - P. - 82
Аннотация: Dilute magnetic semiconductors (DMS) combine the electronic transport properties of semiconductors and memory characteristics of magnetic materials. The complementary properties of semiconductor and ferromagnetic material can manipulate both degrees of freedoms of electrons0 spins and charges for spintronic devices. In recent years, group IV(Ge,Si)-based DMSs attract considerable experimental effort due to the compatibility with mainstream silicon technology. In ourworkwe present the investigation of structural,magnetic and optical properties ofmanganese and iron silicides thin films on Si (100) substrate by in situ spectral generalizedmagneto-optical ellipsometry. Themeasurementswere performed by spectral and laser ellipsometers (“Spectroscan“ and “LEF-71“ respectively by Institute Semiconductors Physics SB RAS), optimized tomeasure not only traditional ellipsometric parameters, but also magneto-optical response of the sample. The magnetoellipsometers were integrated into the ultrahigh vacuum chambers of molecular beam epitaxy setup, which allowed to control the optical and magnetic properties of thin films directly in the growth process. As a result of the magneto-optical response analysis, it was found that iron and manganese silicides in magnetic phase were formed on the Si surface and by analysis of the ellipsometric parameters dependence on evaporation time the silicide nanoclusters were identified and their structural properties were found. The work was supported by project 4.1 of the OFN RAS, project 27.10 of the Presidium RAS, integration project22 of SB RAS and FEB RAS, and also the FCP NK-744P/6 .
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Вид документа : Статья из сборника (однотомник)
Шифр издания :
Автор(ы) : Maximova O. A., Lyashchenko S. A., Yakovlev I. A., Shvetsov D. V., Andryushchenko T. A., Varnakov S. N., Ovchinnikov S. G.
Заглавие : Data processing algorithms for magneto-optical ellipsometry of thin films with optical uniaxial anisotropy
Коллективы : International Baltic Conference on Magnetism, Балтийский федеральный университет им. И. Канта
Место публикации : V International Baltic Conference on Magnetism. IBCM: Book of abstracts. - 2023. - P.126
Примечания : Cited References: 5. - РНФ № 21-12-00226
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Вид документа : Статья из журнала
Шифр издания :
Автор(ы) : Lyashchenko S. A., Varnakov S. N., Ovchinnikov S. G., Berezitskaya E. P., Alexandrova G. A., Vaituzin O. P.
Заглавие : Determination of structural parameters of the Fe-Si-system by spectral ellipsometry method
Коллективы : Asian School-Conference on Physics and Technology of Nanostructured Materials, Азиатская школа-конференция по физике и технологии наноструктурированных материалов
Место публикации : Asian School-Conference on Physics and Technology of Nanostructured Materials (1 ; 2011 ; Aug. ; 21-28 ; Vladivostok)Азиатская школа-конференция по физике и технологии наноструктурированных материалов (1 ; 2011 ; авг. ; 21-28 ; Владивосток). Physics Procedia. - 2012. - Vol. 23. - P.49-52. - ISSN 1875-3884, DOI 10.1016/j-phpro.2011.01.013
Ключевые слова (''Своб.индексиров.''): spectral ellipsometry--silicides--atomic force microscopic
Аннотация: Limitation of the thin homogeneous layers with sharp interfaces model for the structure Si(100)/FeSi2(grain) in solution the inverse problem of ellipsometry in the visible spectral range is shown. A new model of random distribution of thin disks for describing the real structure of the sample is designed. The results of the model optimization are confirmed by AFM.
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Вид документа : Статья из сборника (выпуск монографической серии)
Шифр издания :
Автор(ы) : Maximova O. A., Kosyrev N. N., Varnakov S. N., Lyashchenko S. A., Tarasov I. A., Yakovlev I. A., Maximova O. M., Shevtsov D. V., Ovchinnikov S. G.
Заглавие : Development of in situ magneto-ellipsometry for studying correlation between the optical and magneto-optical properties of ferromagnetic thin films
Коллективы : Joint European Magnetic Symposia , Russian Foundation for Basic Research [16-32-00209 mol_a, 14-02-01211, 16-42-24083]; Complex program of SB RAS [II.2P, 0358-2015-0004]; Ministry of Education and Science of the RF [16.663.2014kappa]; Grant of the President of the Russian Federation [7559.2016.2]
Место публикации : J. Phys.: Conf. Ser. - 2017. - Vol. 903. - Ст.012060. - , DOI 10.1088/1742-6596/903/1/012060
Примечания : Cited References:7. - The work was supported partly by the Russian Foundation for Basic Research Grant No. 16-32-00209 mol_a, Grant No. 14-02-01211, Grant No. 16-42-24083; the Complex program of SB RAS No II.2P, project 0358-2015-0004; the Ministry of Education and Science of the RF (State task No. 16.663.2014 kappa); Grant of the President of the Russian Federation (Scientific School No. 7559.2016.2).
Аннотация: In this work we present the way of nanostructured films study by means of magneto-ellipsometry. The method of interpretation of in situ magneto-optical ellipsometry spectra from the in situ molecular beam epitaxy setup with an integrated magneto-ellipsometric real time synthesis control is described. The method has been successfully tested on Fe/SiO2/Si nanostructures within the model of a homogeneous semi-infinite medium. As a result, the dielectric tensor components for Fe layer were calculated using a developed approach.
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Вид документа : Статья из сборника (однотомник)
Шифр издания :
Автор(ы) : Maximova O. A., Lyashchenko S. A., Shevtsov D. V., Yakovlev I. A., Ovchinnikov S. G.
Заглавие : Development of techniques for processing data from magneto-ellipsometry measurements
Коллективы : Asian School-Conference on Physics and Technology of Nanostructured Materials, Азиатская школа-конференция по физике и технологии наноструктурированных материалов, Институт автоматики и процессов управления ДВО РАН, Дальневосточный федеральный университет
Место публикации : Fourth Asian school-conference on physics and technology of nanostructured materials (ASCO-NANOMAT 2018): proceedings/ progr. com. S. G. Ovchinnikov [et al.]. - 2018. - Ст.IV.25.05p. - P.180. - ISBN 978-5-7444-4368-9
Аннотация: The approach to data processing for layered thin films with a ferromagnet layer is proposed for studying optical and magneto- optical properties. The scope and applicability of models which describe reflective layered structures are studied in order to recommend the best model choice for each case. A significant effect of penetration depth on this choice was observed.
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Вид документа : Статья из журнала
Шифр издания :
Автор(ы) : Maximova O. A., Lyashchenko S. A., Vysotin M. A., Tarasov I. A., Yakovlev I. A., Shevtsov D. V., Fedorov A. S., Varnakov S. N., Ovchinnikov S. G.
Заглавие : Experimental and Theoretical In Situ Spectral Magneto-Ellipsometry Study of Layered Ferromagnetic Structures
Место публикации : JETP Letters. - 2019. - Vol. 110, Is. 3. - P.166-172. - ISSN 00213640 (ISSN), DOI 10.1134/S0021364019150098
Примечания : Cited References: 28. - This work was supported by the Ministry of Education and Science of the Russian Federation and the Siberian Branch, Russian Academy of Sciences (project nos. 0356-2018-0061 and II.8.70).
Аннотация: A method for processing of in situ spectral magneto-ellipsometry data has been developed to analyze planar ferromagnetic nanostructures. A multilayer model containing a ferromagnetic layer with two interfaces, a nonferromagnetic buffer layer, and a nonferromagnetic substrate has been tested within a new approach to the interpretation of magnetic-field-modulated spectral ellipsometric measurements involving the magnetooptical Kerr effect in the transverse configuration. In particular, the effect of the thickness of the ferromagnetic layer on the results of magneto-ellipsometric measurements has been analyzed. The measurements have been performed with polycrystalline Fe films with different thicknesses on a nonferromagnetic SiO2/Si(100) surface. The diagonal and off-diagonal components of the complex dielectric tensor in the spectral range of 1.38–3.45 eV have been determined by processing spectral magneto-ellipsometric data. The results have been compared to the available data obtained by other authors and to the calculation of the dielectric tensor of Fe within the density functional theory.
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10.

Вид документа : Статья из сборника (однотомник)
Шифр издания :
Автор(ы) : Maximova O. A., Lyashchenko S. A., Visotin M. A., Tarasov I. A., Yakovlev I. A., Shevtsov D. V., Fedorov A. S., Varnakov S. N., Ovchinnikov S. G.
Заглавие : Fe/SiO2/Si thin films study by means of in situ magneto-ellipsometry and DFT
Коллективы : Российская академия наук, Уральское отделение РАН, Институт физики металлов им. М. Н. Михеева Уральского отделения РАН, Уральский федеральный университет им. первого Президента России Б.Н. Ельцина, Российский фонд фундаментальных исследований, Euro-Asian Symposium "Trends in MAGnetism", "Trends in MAGnetism", Euro-Asian Symposium
Место публикации : Euro-asian symposium "Trends in magnetism" (EASTMAG-2019): Book of abstracts/ чл. конс. ком.: S. G. Ovchinnikov, N. V. Volkov [et al.] ; чл. прогр. ком. D. M. Dzebisashvili [et al.]. - 2019. - Vol. 1. - Ст.E.P1. - P.421-422. - ISBN 978-5-9500855-7-4 (Шифр В33/E12-125657784)
Примечания : Cited References: 4. - Support by the Ministry of Education and Science of the Russian Federation and by Siberian Branch of the Russian Academy of Sciences (Project II.8.70, 0356-2018-0057) is acknowledged. Participation in the event VII Euro-Asian Symposium “Trends in Magnetism” (EASTMAG-2019) was funded by Krasnoyarsk Regional Fund of Science
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11.

Вид документа : Статья из журнала
Шифр издания :
Автор(ы) : Maksimova O. A., Kosyrev N. N., Varnakov S. N., Lyashchenko S. A., Ovchinnikov S. G.
Заглавие : Features of the ellipsometric investigation of magnetic nanostructures
Коллективы : Russian Federation [2886.2014.2], RFBR [13-02-01265, 14-02-01211], Ministry of Education and Science of the Russian Federation[14.604.21.0002, 02.G25.31.0043], Foundation for Assistance to SmallInnovative Enterprises in Science and Technology [0003831]
Место публикации : J. Struct. Chem.: MAIK Nauka-Interperiodica / Springer, 2014. - Vol. 55, Is. 6. - P.1134-1141. - ISSN 0022, DOI 10.1134/S0022476614060225. - ISSN 15738779(eISSN)
Примечания : Cited References:8. - The work was supported by the Program of the President of the RussianFederation for the support of leading scientific schools (ScientificSchool 2886.2014.2), RFBR (grant No. 13-02-01265, No. 14-02-01211), theMinistry of Education and Science of the Russian Federation (Agreement14.604.21.0002 State contract No. 02.G25.31.0043), and the Foundationfor Assistance to Small Innovative Enterprises in Science and Technology(program "A Member of the Youth Research and Innovation Competition",contract number 0003831).
Предметные рубрики: PARAMETERS
Ключевые слова (''Своб.индексиров.''): magneto-ellipsometry--ellipsometric measurements--magneto-optical kerr--effect--thin films--semi-infinite medium model--refraction coefficient
Аннотация: The technique for interpreting magneto-ellipsometric measurements is proposed. The model of a homogeneous semi-infinite medium for reflecting layered magnetic structures in the presence of the magnetic field in the configuration of the magneto-optical equatorial Kerr effect is considered. Based on the analysis of the Fresnel coefficients with regard to the magneto-optical parameter Q appearing in the off-diagonal elements of the permittivity tensor, the expressions are obtained using which the refraction (n) and absorption (k) coefficients, the real (Q (1)) and imaginary (Q (2)) parts of the magneto-optical parameter can be found from the ellipsometric (psi(0) and Delta(0)) and magneto-ellipsometric (psi(0) + delta psi and Delta(0) + delta I") measurements. The results will allow to measure and analyze the magnetic characteristics such as hysteresis loops and the coercitive force of layered nanostructures using the conventional ellipsometric equipment.
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12.

Вид документа : Статья из журнала
Шифр издания :
Автор(ы) : Maximova O. A., Kosyrev N. N., Varnakov S. N., Lyashchenko S. A., Yakovlev I. A., Tarasov I. A., Shevtsov D. V., Maximova O. M., Ovchinnikov S. G.
Заглавие : In situ magneto-optical ellipsometry data analysis for films growth control
Коллективы : Euro-Asian Symposium "Trends in MAGnetism", "Trends in MAGnetism", Euro-Asian Symposium, Институт физики им. Л.В. Киренского Сибирского отделения РАН , Russian Foundation for Basic Research; Government of Krasnoyarsk Territory, Krasnoyarsk Region Science and Technology [16-42-243058, 16-42-243060]; Russian Foundation for Basic Research [16-32-00209 mol_a, 14-02-01211]; SB RAS II.2P [0358-2015-0004]; Ministry of Education and Science of RF [16.663.2014]; Grant Scientific School [7559.2016.2]
Место публикации : J. Magn. Magn. Mater.: Elsevier Science, 2017. - Vol. 440: EURO-Asian Symposium on Trends in Magnetism (EASTMAG) (AUG 15-19, 2016, Siberian Fed Univ, Krasnoyarsk, RUSSIA). - P.196-198. - ISSN 0304-8853, DOI 10.1016/j.jmmm.2016.12.050. - ISSN 1873-4766(eISSN)
Примечания : Cited References:10. - The reported study was funded by Russian Foundation for Basic Research, Government of Krasnoyarsk Territory, Krasnoyarsk Region Science and Technology Support Fund to the research project Nos. 16-42-243058 and 16-42-243060. The work was supported partly by the Russian Foundation for Basic Research, Grant nos. 16-32-00209 mol_a and 14-02-01211; the Complex program of SB RAS II.2P, project 0358-2015-0004; the Ministry of Education and Science of the RF (State task no. 16.663.2014); Grant Scientific School 7559.2016.2.
Ключевые слова (''Своб.индексиров.''): magneto-optical kerr effect--ellipsometry--in situ measurements
Аннотация: In this work we present the way of ferromagnetic films study by means of magneto-ellipsometry. The method of interpretation of in situ magneto-optical ellipsometry spectra for real time growth control is described. The method has been successfully tested on Si/SiO2/Fe films within the model of a homogeneous semi-infinite medium. As a result, the dielectric tensor components for Fe layer were calculated using a developed approach.
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13.

Вид документа : Статья из журнала
Шифр издания :
Автор(ы) : Kosyrev N. N., Patrin G. S., Shiyan Ya. G., Volchenko E. N., Yakovchuk V. Yu., Komarov V. A., Semenov S. V.
Заглавие : Influence of the DyxCo1-x–Bi interface on the magnetic properties of DyxCo1-x/Bi/Py three-layer structures
Колич.характеристики :6 с
Место публикации : J. Supercond. Nov. Magn. - 2024. - Vol. 37, Is. 2. - P.419-424. - ISSN 15571939 (ISSN), DOI 10.1007/s10948-024-06690-0. - ISSN 15571947 (eISSN)
Примечания : Cited References: 15. - The authors are grateful to R.Yu. Rudenko for carrying out measurements using an atomic force microscopeThe research was conducted according to the state assignment of the Ministry of Science and Higher Education of the Russian Federation and the Federal State Autonomous Educational Institution of Higher Education Siberian Federal University (No. FSRZ-2023–0008)
Аннотация: The interlayer interactions in multilayer systems with a non-magnetic semimetallic interlayer are great of interest. The magnetic and structural properties of the DyxCo1-x/Bi/Py systems (17 ˂ x ˂ 26 at.%) have been studied. The temperature dependences of magnetization in the range 4.2–300 K were measured for the first time. The influence of the bismuth interlayer thickness on the exchange interaction between the DyCo and Py layers was found as well as the critical value of its thickness. The obtained atypical value of the period of exchange bias oscillations was explained by the formation of bismuth compounds with dysprosium–pnictogenides at bismuth thicknesses below the critical value. The interface was investigated by spectral ellipsometry in the range 2–5 eV. The information on the structure of the surface obtained by atomic force microscopy was used to create a multilayer model for fitting experimental ellipsometric data. Analysis of the optical properties showed that pnictogenide Dy3Bi2 is formed at the interface, which affects the general magnetic state of the samples studied.
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14.

Вид документа : Статья из журнала
Шифр издания :
Автор(ы) : Kosyrev N. N., Zabluda V. N., Maximova O. A.
Заглавие : In situ Mueller-matrix magneto-ellipsometry
Коллективы : Asian School-Conference on Physics and Technology of Nanostructured Materials, Азиатская школа-конференция по физике и технологии наноструктурированных материалов
Место публикации : Solid State Phenom.: Selected, peer reviewed papers/ ed. N. Galkin: Trans Tech Publications Ltd, 2016. - Vol. 245: Physics and Technology of Nanostructured Materials III. - P.55-59. - ISSN 1662-9779, DOI 10.4028/www.scientific.net/SSP.245.55. - ISSN 9783038356820
Примечания : Cited References: 7
Ключевые слова (''Своб.индексиров.''): ferromagnetic nanostructures--generalized magneto-optical ellipsometry--mueller matrix--polarized light
Аннотация: We develop the method for determining the Mueller matrix elements using standard photometric ellipsometer. Small ellipsometer design changes give an opportunity to completely determine all elements of the Mueller matrix. It is shown how the values of Mueller matrix elements can be obtained from the measurements at different azimuthal positions of optical units. © (2016) Trans Tech Publications, Switzerland.
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15.

Вид документа : Статья из сборника (однотомник)
Шифр издания :
Автор(ы) : Kosyrev N. N., Zabluda V. N., Ovchinnikov S. G.
Заглавие : In situ Mueller-matrix magneto-ellipsometry
Коллективы : Asian School-Conference on Physics and Technology of Nanostructured Materials, Азиатская школа-конференция по физике и технологии наноструктурированных материалов
Место публикации : Third Asian school-conference on physics and technology of nanostructured materials (ASCO-NANOMAT 2015): proceedings. - Vladivostok: Dalnauka, 2015. - Ст.VII.25.01o. - ISBN 978-5-8044-1556-4
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16.

Вид документа : Статья из журнала
Шифр издания :
Автор(ы) : Maximova O. A., Kosyrev N. N., Yakovlev I. A., Shevtsov D. V., Lyashchenko S. A., Varnakov S. N., Ovchinnikov S. G.
Заглавие : Magneto-ellipsometry as a powerful technique for investigating magneto-optical structures properties
Коллективы : Euro-Asian Symposium "Trends in MAGnetism", "Trends in MAGnetism", Euro-Asian Symposium, Институт физики им. Л.В. Киренского Сибирского отделения РАН , Russian Foundation for Basic Research, Government of Krasnoyarsk Territory, Krasnoyarsk Region Science and Technology Support Fund [1642-243058]; Russian Foundation for Basic Research [16-32-00209mol_a, 14-02-01211]; Ministry of Education and Science of the RF [16.663.2014K, 7559.2016.2]; Complex program of SB RAS [II.2P, 03582015-0004]
Место публикации : J. Magn. Magn. Mater.: Elsevier Science, 2017. - Vol. 440. - P.153-156. - ISSN 0304-8853, DOI 10.1016/j.jmmm.2016.12.073. - ISSN 1873-4766(eISSN)
Примечания : Cited References:20. - The reported study was funded by Russian Foundation for Basic Research, Government of Krasnoyarsk Territory, Krasnoyarsk Region Science and Technology Support Fund to the research project No 1642-243058. The work was supported by the Russian Foundation for Basic Research, Grant No. 16-32-00209mol_a, Grant No. 14-02-01211, The Complex program of SB RAS No II.2P, project 03582015-0004, the Ministry of Education and Science of the RF (State task No. 16.663.2014K), grant Scientific School 7559.2016.2.
Ключевые слова (''Своб.индексиров.''): magneto-optical kerr effect--ellipsometry--in situ measurements
Аннотация: In this work we report on new magneto-ellipsometry set-up that allows to grow thin films and nanostructures by ultrahigh vacuum thermal evaporation as well as to conduct in situ measurements during the growth in order to analyze and control nanostructures properties. Ellipsometry and transverse magneto-optical Kerr effect measurements can be performed in situ inside this set-up. A uniform magnetic field of high intensity (more than 1 kOe) can be applied to samples inside the vacuum chamber. Also, we report on the developed method of data interpretation that is the base of the set-up software. Thus, we present a powerful tool for nanostructures synthesis and characterization.
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17.

Вид документа : Статья из сборника (однотомник)
Шифр издания :
Автор(ы) : Maximova O. A., Kosyrev N. N., Yakovlev I. A., Shevtsov D. V.
Заглавие : Magneto-ellipsometry as a powerful technique for investigating magneto-optical structures properties
Коллективы : Euro-Asian Symposium "Trends in MAGnetism", "Trends in MAGnetism", Euro-Asian Symposium, Институт физики им. Л.В. Киренского Сибирского отделения РАН
Место публикации : VI Euro-Asian Symposium "Trends in MAGnetism" (EASTMAG-2016): abstracts/ ed.: O. A. Maksimova, R. D. Ivantsov. - Krasnoyarsk: KIP RAS SB, 2016. - Ст.P6.12. - P.320. - ISBN 978-5-904603-06-9 (Шифр -478014040)
Примечания : References: 5. - The work was supported by The Complex program of SB RAS № II.2P, project 0358-2015-0004
Ключевые слова (''Своб.индексиров.''): magneto-optics--ellisometry--magneto-optical kerr effect
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18.

Вид документа : Статья из сборника (однотомник)
Шифр издания :
Автор(ы) : Maximova O. A., Lyashchenko S. A., Yakovlev I. A., Shevtsov D. V., Varnakov S. N., Ovchinnikov S. G.
Заглавие : Magneto-ellipsometry for controlling properties of perspective magnetic materials
Коллективы : International Baltic Conference on Magnetism: nanoboimedicine and smart materials, Балтийский федеральный университет им. И. Канта
Место публикации : 3th International Baltic Conference on Magnetism (IBCM 2019): Book of abstracts. - 2019. - P.130
Примечания : Cited References: 7. - This work is supported by the Ministry of Education and Science of the Russian Federation and by Siberian Branch of the Russian Academy of Sciences (Project II.8.70) and Fundamental research program of the Presidium of the RAS no. 32 «Nanostructures: physics, chemistry, biology, basics of technologies
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19.

Вид документа : Статья из сборника (однотомник)
Шифр издания :
Автор(ы) : Maximova O. A., Lyashchenko S. A., Varnakov S. N., Ovchinnikov S. G.
Заглавие : Magneto-ellipsometry for optically anisotropic structures
Коллективы : Asian School-Conference on Physics and Technology of Nanostructured Materials, Азиатская школа-конференция по физике и технологии наноструктурированных материалов
Место публикации : The Sixth Asian school-conference on physics and technology of nanostructured materials: Proceedings. - VLadivostok, 2022. - Ст.III.р.10. - P.159. - ISBN 987-5-8044-1716-2
Примечания : Cited References: 6. - This work was supported by the grant from the Russian Science Foundation No. 21-12-00226
Аннотация: This article is devoted to the data analysis of magneto-optical ellipsometry data when they are collected from structures with uniaxial optical anisotropy. The magneto-optical parameter, being a part of an off-diagonal tensor elements of dielectric permit tivity, was deduced through Maxwell equations consideration. The way of carrying out an experiment is also dicsussed.
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20.

Вид документа : Статья из сборника (однотомник)
Шифр издания :
Автор(ы) : Lyashchenko S. A., Maximova O. A., Varnakov S. N., Ovchinnikov S. G.
Заглавие : Magneto-ellipsometry study of MAX-phases: Mn2GaC thin films
Коллективы : "Functional materials", International conference, Крымский федеральный университет имени В.И. Вернадского
Место публикации : Ovchinnikov S. G. International conference "Functional materials": book of abstracts/ ed. V. N. Berzhansky ; org. com. S. G. Ovchinnikov [et al.]. - Simferopol, 2021. - P.298
Примечания : Библиогр.: 3 назв. - The research was carried out with a grant from the Russian Science Foundation № 21-12-00226, https://rscf.ru/project/21-12-00226/
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