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1.


   
    Micromagnetic analysis of edge effects in a thin magnetic film during local excitation of magnetization oscillations / B. A. Belyaev, A. V. Izotov, G. V. Skomorokhov, P. N. Solovev // Russ. Phys. J. - 2020. - Vol. 63, Is. 5. - P. 837-843, DOI 10.1007/s11182-020-02106-3. - Cited References: 19. - This research was performed with financial support of the Russian Foundation for Basic Research within the research project No. 18-32-00086 . - ISSN 1064-8887. - ISSN 1573-9228
Рубрики:
ANISOTROPIES
   SIMULATIONS

   FIELDS

Кл.слова (ненормированные):
micromagnetic simulation -- thin magnetic film -- edge effects -- ferromagnetic resonance -- magnetic anisotropy
Аннотация: The method of numerical micromagnetic simulation was used to study the magnetization dynamics of a thin film with uniaxial magnetic anisotropy during ferromagnetic resonance (FMR) excitation in it on the local sites by a linearly polarized high-frequency magnetic field emitted from the 1 mm opening in the metallic screen of the transmission line. It was established that non-uniformities of demagnetizing fields emerging near the film edges lead not only to the change in the FMR field, but also to the change in the value and direction of the uniaxial anisotropy field. The distribution of non-uniformities of the magnetic anisotropy characteristics over the area of 60 nm thick permalloy film that was measured on the scanning FMR spectrometer agrees well with the micromagnetic simulation results. Demagnetizing fields were proved to be the main cause for the edge effects in magnetic films.

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Публикация на русском языке Микромагнитный анализ краевых эффектов в тонкой магнитной пленке при локальном возбуждении колебаний намагниченности [Текст] / Б. А. Беляев, А. В. Изотов, Г. В. Скоморохов, П. Н. Соловьев // Изв. вузов. Физика. - 2020. - Т. 63 № 5. - С. 116-121

Держатели документа:
Russian Acad Sci, Siberian Branch, LV Kirensky Inst Phys, Krasnoyarsk Sci Ctr, Krasnoyarsk, Russia.
Siberian Fed Univ, Krasnoyarsk, Russia.

Доп.точки доступа:
Belyaev, B. A.; Беляев, Борис Афанасьевич; Izotov, A. V.; Изотов, Андрей Викторович; Skomorokhov, G. V.; Скоморохов, Георгий Витальевич; Solovev, P. N.; Соловьев, Платон Николаевич
}
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2.


   
    Magnetic properties of permalloy thin film edges / B. A. Belyaev, N. M. Boev, A. V. Izotov [et al.] // Russ. Phys. J. - 2020. - Vol. 63, Is. 1. - P. 16-22, DOI 10.1007/s11182-020-01997-6. - Cited References: 23. - This work was supported by the Ministry of Science and Higher Education of the Russian Federation (Project No. 02.G25.31.0313). . - ISSN 1064-8887. - ISSN 1573-9228
Рубрики:
ANISOTROPIES
Кл.слова (ненормированные):
magnetic thin film -- ferromagnetic resonance -- edge effects -- magnetic anisotropy
Аннотация: The paper presents the results of ferromagnetic resonance (FMR) spectrometry of magnetic properties of nanocrystalline thin films obtained by magnetron sputtering of permalloy targets of various composition (NixFe1-x, x = 0.6-0.85). The behavior of the main magnetic properties of the thin film edges is analyzed. Near the film edges, not only the fluctuation of the uniaxial magnetic anisotropy field is observed, but also a drastic widening of the FMR line and the decrease in the effective saturation magnetization.

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Публикация на русском языке Особенности поведения магнитных характеристик вблизи краев тонких пермаллоевых пленок [Текст] / Б. А. Беляев, Н. М. Боев, А. В. Изотов [и др.] // Изв. вузов. Физика. - 2020. - Т. 63 № 1. - С. 17-23

Держатели документа:
Russian Acad Sci, Kirensky Inst Phys, Siberian Branch, Krasnoyarsk, Russia.
Siberian Fed Univ, Krasnoyarsk, Russia.

Доп.точки доступа:
Belyaev, B. A.; Беляев, Борис Афанасьевич; Boev, N. M.; Боев, Никита Михайлович; Izotov, A. V.; Изотов, Андрей Викторович; Skomorokhov, G. V.; Скоморохов, Георгий Витальевич; Solovev, P. N.; Соловьев, Платон Николаевич; Ministry of Science and Higher Education of the Russian Federation [02, G25.31.0313]
}
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3.


   
    Small-angle scattering and radiation polarization by a stretched polymer film with nematic liquid crystal droplets having a single-domain structure / V. A. Loiko, A. V. Konkolovich, A. A. Miskevich [et al.] // Opt. Spectrosc. - 2020. - Vol. 128, Is. 3. - P. 331-338, DOI 10.1134/S0030400X20030121. - Cited References: 24. - This work was carried out within the framework of the agreement on interacademic collaboration between the National Academy of Sciences of Belarus and Siberian Branch of the Russian Academy of Sciences. It was supported by the Belarusian Republican Foundation for Fundamental Research (project no. F18RA-003). M.N. Krakhalev acknowledges the support of the Russian Foundation for Basic Research, the Government of Krasnoyarsk krai, and Krasnoyarsk Krai Foundation of Science (grant no. 18-42-243006). . - ISSN 0030-400X. - ISSN 1562-6911
РУБ Optics + Spectroscopy
Рубрики:
IONIC MODIFICATION
   LIGHT

Кл.слова (ненормированные):
light scattering -- radiation polarization -- liquid crystal
Аннотация: The coefficient of directed transmittance of a stretched polymer-dispersed liquid crystal film with a defect-free single-domain liquid crystal droplet structure formed by a stretched surfactant-doped film and the polarization degree of forward-transmitted light in the visible and near-infrared spectrum ranges are studied. Results are presented for the 5CB, E7, and E44 nematic liquid crystals. Dependences of the transmission coefficient and polarizing ability of the film on the photodetector field of view are studied. Relationships allowing one to determine film parameters at which the transmission coefficient and polarizing ability of the films simultaneously reach values close to limit ones (0.5 and ±1.0, respectively) are obtained in the Foldy–Twersky and anomalous diffraction approximations.

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Публикация на русском языке Малоугловое рассеяние и поляризация излучения вытянутой полимерной пленкой с каплями нематического жидкого кристалла, имеющими монодоменную структуру [Текст] / В. А. Лойко, А. В. Конколович, А. А. Мискевич, М. Н. Крахалев // Оптика и спектроскопия. - 2020. - Т. 128 Вып. 3. - С. 343-350

Держатели документа:
Natl Acad Sci Belarus, Stepanov Inst Phys, Minsk 220072, BELARUS.
Russian Acad Sci, Siberian Branch, Kirensky Inst Phys, Krasnoyarsk 660036, Russia.
Siberian Fed Univ, Inst Engn Phys & Radio Elect, Krasnoyarsk 660041, Russia.

Доп.точки доступа:
Loiko, V. A.; Konkolovich, A. V.; Miskevich, A. A.; Krakhalev, M. N.; Крахалев, Михаил Николаевич; Prishchepa, O. O.; Прищепа, Оксана Олеговна; Zyryanov, V. Ya.; Зырянов, Виктор Яковлевич; Belarusian Republican Foundation for Fundamental Research [F18RA-003]; Russian Foundation for Basic ResearchRussian Foundation for Basic Research (RFBR); Government of Krasnoyarsk krai; Krasnoyarsk Krai Foundation of Science [18-42-243006]
}
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4.


   
    Micromagnetic simulation of domain structure in thin permalloy films with in-plane and perpendicular anisotropy / P. N. Solovev, A. V. Izotov, B. A. Belyaev, N. M. Boev // Physica B. - 2020. - Vol. 604. - Ст. 412699, DOI 10.1016/j.physb.2020.412699. - Cited References: 31. - This work was supported by the Ministry of Science and Higher Education of the Russian Federation , agreement number 075-11-2019-054 dated 22.11.2019 . - ISSN 0921-4526
   Перевод заглавия: Микромагнитное моделирование доменной структуры тонких пермаллоевых пленок с одноосной планарной и перпендикулярной анизотропией
Кл.слова (ненормированные):
Micromagnetic simulation -- Thin magnetic film -- Magnetic anisotropy -- Stripe domains -- Hysteresis loop -- Saturation field
Аннотация: We investigate the domain structure formation and magnetization processes in thin permalloy films with in-plane and perpendicular magnetic anisotropy by using micromagnetic simulation. We show that the films of thicknesses less than a critical value Lcr are in the monodomain state, and their magnetization processes are specified by the in-plane anisotropy. Above the critical thickness Lcr, the perpendicular anisotropy dominates, leading to the formation of the stripe domain structure that significantly complicates the magnetization reversal. The values of the critical thickness, parameters of the domain structure, and the saturation field obtained from the micromagnetic simulations are compared with the corresponding values calculated using analytical expressions derived by Murayama in the framework of the domain structures theory.

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Держатели документа:
Kirensky Institute of Physics, Federal Research Center KSC SB RAS, 50/38 Akademgorodok, Krasnoyarsk, 660036, Russian Federation
Siberian Federal University, 79 Svobodny pr., Krasnoyarsk, 660041, Russian Federation

Доп.точки доступа:
Solovev, P. N.; Соловьев, Платон Николаевич; Izotov, A. V.; Изотов, Андрей Викторович; Belyaev, B. A.; Беляев, Борис Афанасьевич; Boev, N. M.; Боев, Никита Михайлович
}
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5.


   
    Effect of Heat Treatment on the Stability of Nanosized (Co40Fe40B20)34(SiO2)66/ZnO/In2O3 Multilayers / I. V. Babkina, M. N. Volochaev, O. V. Zhilova [et al.] // Bull. Russ. Acad. Sci. Phys. - 2020. - Vol. 84, Is. 9. - P. 1100-1103, DOI 10.3103/S1062873820090051. - Cited References: 11. - This work was supported by the RF Ministry of Science and Higher Education as part of State Task no. FZGM-2020-0007 . - ISSN 1062-8738
Кл.слова (ненормированные):
After-heat treatment -- Binary alloys -- Film preparation -- II-VI semiconductors -- Ion beams -- Magnetic semiconductors -- Multilayers -- Oxide minerals -- Semiconducting indium compounds -- Semiconducting silicon compounds -- Semiconducting zinc compounds -- Silica -- Silicon -- Sputtering -- Wide band gap semiconductors -- Zinc oxide
Аннотация: An investigation is performed of the thermal stability and phase transformations of thin-film heterogeneous [(Co40Fe40B20)34(SiO2)66/ZnO/In2O3]85 multilayers obtained via ion beam sputtering. The system contains 85 layers, each consisting of a (Co40Fe40B20)34(SiO2)66 composite layer and ZnO and In2O3 semiconductor spacers. The sample structure in the initial state and after heat treatment is studied by means of X-ray diffraction. It is shown that the samples are stable at temperatures of up to 500°С. Zn2SiO4, InBO3, CoFe, and In2O3 phases form during annealing.

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Публикация на русском языке Влияние термообработки на стабильность наноразмерных многослойных структур (Co40Fe40B20)34(SiO2)66/ZnO/In2O3 [Текст] / И. В. Бабкина, М. Н. Волочаев, О. В. Жилова [и др.] // Изв. РАН. Сер. физич. - 2020. - Т. 84 № 9. - С. 1293-1296

Держатели документа:
Voronezh State Technical University, Voronezh, 394026, Russian Federation
Kirensky Institute of Physics, Krasnoyarsk Scientific Center, Siberian Branch, Russian Academy of Sciences, Krasnoyarsk, 660036, Russian Federation

Доп.точки доступа:
Babkina, I. V.; Volochaev, M. N.; Волочаев, Михаил Николаевич; Zhilova, O. V.; Kalinin, Y. E.; Kashirin, M. A.; Sitnikov, A. V.; Chehonadskih, M. V.; Yanchenko, L. I.
}
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6.


   
    Amorphous and Crystalline Nickel Oxide Films Obtained by the Extraction-Pyrolysis Method for Electrochromic Cells / A. L. Belousov, T. N. Patrusheva, A. A. Karacharov [et al.] // Theor. Found. Chem. Eng. - 2020. - Vol. 54, Is. 4. - P. 699-705, DOI 10.1134/S0040579520040041. - Cited References: 8. - This work was performed as part of the program "Research and Development for the Priority Areas of the Russian Science-and-Technology Sector for 2014-2020"; Grant Agreement no. 075-15-2019-1843; the Project Unique Identifier RFMEFI60719X0307 . - ISSN 0040-5795. - ISSN 1608-3431
РУБ Engineering, Chemical
Рубрики:
NIO THIN-FILMS
Кл.слова (ненормированные):
nickel extract -- extraction-pyrolysis technology -- thin film -- annealing -- electrochromic cell
Аннотация: This paper reports studies of thin films of nickel oxide obtained by the extraction–pyrolysis method on glass and quartz substrates at temperatures of 380–600°C. The films have been characterized by atomic force microscopy and X-ray diffraction. It is shown that amorphous and crystalline nickel oxide films are formed on the glass. The grain size depends on the annealing temperature, while increased annealing temperatures lead to recrystallization and a decrease in the grain size in NiO films from 130 to 35 nm.

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Публикация на русском языке Пленки аморфного и кристаллического оксида никеля, полученные экстракционно-пиролитическим методом для электрохромных ячеек [Текст] / А. Л. Белоусов [и др.] // Хим. технол. - 2019. - Т. 20 № 5. - С. 215-221

Держатели документа:
Siberian Fed Univ, Krasnoyarsk 660041, Russia.
Baltic State Tech Univ VOENMEX, St Petersburg 190005, Russia.
Russian Acad Sci, Siberian Branch, Inst Chem & Chem Technol, Krasnoyarsk 660036, Russia.
Russian Acad Sci, Kirensky Inst Phys, Siberian Branch, Krasnoyarsk 660036, Russia.
Russian Acad Sci, Kurnakov Inst Gen & Inorgan Chem, Moscow 119991, Russia.

Доп.точки доступа:
Belousov, A. L.; Patrusheva, T. N.; Karacharov, A. A.; Ivanenko, A. A.; Иваненко, Александр Анатольевич; Kirik, S. D.; Khol'kin, A. I.; program "Research and Development for the Priority Areas of the Russian Science-and-Technology Sector for 2014-2020" [075-15-2019-1843]; [RFMEFI60719X0307]
}
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7.


    Komogortsev, S. V.
    Magnetic behavior of nanocrystalline magnetic film in a rotating field / S. V. Komogortsev, V. A. Fel'k // Euro-asian symposium "Trends in magnetism" (EASTMAG-2019) : Book of abstracts / чл. конс. ком.: S. G. Ovchinnikov, N. V. Volkov [et al.] ; чл. прогр. ком. D. M. Dzebisashvili [et al.]. - 2019. - Vol. 1. - Ст. C.P20. - P. 304. - Cited References: 2. - Support by Russian Foundation for Basic Research, Government of Krasnoyarsk Territory, Krasnoyarsk Region Science and Technology Support Fund to the research project no. 18-42-240006 is acknowledged . - ISBN 978-5-9500855-7-4

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Держатели документа:
Kirensky Institute of Physics, Federal Research Center KSC SB RAS, Krasnoyarsk, Russia
Reshetnev Siberian State University of Science and Technology, Krasnoyarsk, Russia

Доп.точки доступа:
Ovchinnikov, S. G. \чл. конс. ком.\; Овчинников, Сергей Геннадьевич; Volkov, N. V. \чл. конс. ком.\; Волков, Никита Валентинович; Dzebisashvili, D. M. \чл. прогр. ком.\; Дзебисашвили, Дмитрий Михайлович; Fel'k, V. A.; Комогорцев, Сергей Викторович; Российская академия наук; Уральское отделение РАН; Институт физики металлов им. М. Н. Михеева Уральского отделения РАН; Уральский федеральный университет им. первого Президента России Б.Н. Ельцина; Российский фонд фундаментальных исследований; Euro-Asian Symposium "Trends in MAGnetism"(7 ; 2019 ; Sept. ; 8-13 ; Ekaterinburg); "Trends in MAGnetism", Euro-Asian Symposium(7 ; 2019 ; Sept. ; 8-13 ; Ekaterinburg)
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}
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8.


   
    Magnetic properties of Fe–Bi film structures / G. S. Patrin [et al.] // Euro-asian symposium "Trends in magnetism" (EASTMAG-2019) : Book of abstracts / чл. конс. ком.: S. G. Ovchinnikov, N. V. Volkov [et al.] ; чл. прогр. ком. D. M. Dzebisashvili [et al.]. - 2019. - Vol. 1. - Ст. C.P31. - P. 320. - These studies are carried out with the financial support of RFBR (grant No. 18-02-00161-a) . - ISBN 978-5-9500855-7-4
   Перевод заглавия: Магнитные свойства пленочных структур Fe-Bi

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Держатели документа:
Kirensky Institute of Physics, Federal Research Center KSC SB RAS, Krasnoyarsk, Russia
Siberian Federal University, Krasnoyarsk, Russia

Доп.точки доступа:
Ovchinnikov, S. G. \чл. конс. ком.\; Овчинников, Сергей Геннадьевич; Volkov, N. V. \чл. конс. ком.\; Волков, Никита Валентинович; Dzebisashvili, D. M. \чл. прогр. ком.\; Дзебисашвили, Дмитрий Михайлович; Patrin, G. S.; Патрин, Геннадий Семёнович; Yakovchuk, V. Yu.; Яковчук, Виктор Юрьевич; Yarikov, S. A.; Яриков, Станислав Алексеевич; Shiyan, Ya. G.; Шиян, Ярослав Германович; Furdyk, V. P.; Российская академия наук; Уральское отделение РАН; Институт физики металлов им. М. Н. Михеева Уральского отделения РАН; Уральский федеральный университет им. первого Президента России Б.Н. Ельцина; Российский фонд фундаментальных исследований; Euro-Asian Symposium "Trends in MAGnetism"(7 ; 2019 ; Sept. ; 8-13 ; Ekaterinburg); "Trends in MAGnetism", Euro-Asian Symposium(7 ; 2019 ; Sept. ; 8-13 ; Ekaterinburg)
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}
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9.


   
    The role of the semiconductor layer in the exchange-bias film structure of CoNi / Si / FeNi / Si with a spin spring effect / A. V. Kobyakov [et al.] // J. Phys. Conf. Ser. - 2019. - Vol. 1389, Is. 1. - Ст. 012028, DOI 10.1088/1742-6596/1389/1/012028. - Cited References: 13. - These studies are conducted with financial support from the Russian Foundation for Basic Research (grant No.18-02-00161-a). . - ISSN 1742-6588. - ISSN 1742-6596
   Перевод заглавия: Роль полупроводникового слоя в структуре пленок обменного смещения CoNi / Si / FeNi / Si с эффектом спиновой пружины
Аннотация: CoNi / Si / FeNi / Si structures were synthesized by ion-plasma sputtering. A negative hysteresis loop bias was detected at the thickness of the silicon layer was less than 2 nm and the temperature was less than 100 K. A positive hysteresis loop bias was detected at the thickness of the silicon layer was more than 2 nm and the temperature greater than 100K.

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Держатели документа:
Siberian Federal University, prospect Svobodny, 79, Krasnoyarsk, 660041, Russia
L.V. Kirensky Institute of Physics of Siberian Branch of Russian Academy of Sciences, Krasnoyarsk, 660036, Russia

Доп.точки доступа:
Kobyakov, A. V.; Кобяков, Александр Васильевич; Turpanov, I. A.; Турпанов, Игорь Александрович; Patrin, G. S.; Патрин, Геннадий Семёнович; Yushkov, V. I.; Юшков, Василий Иванович; Yarikov, S. A.; Яриков, Станислав Алексеевич; Volochaev, M. N.; Волочаев, Михаил Николаевич; Zhivaya, Ya. A.; Euro-Asian Symposium "Trends in MAGnetism"(7 ; 2019 ; Sept. ; 8-13 ; Ekaterinburg)
}
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10.


   
    Transport and magnetic phenomena in ZnO-С thin-film heterostructures / M. N. Volochaev, A. B. Granovsky, O. V. Zhilova [et al.] // Superlattices Microstruct. - 2020. - Vol. 140. - Ст. 106449, DOI 10.1016/j.spmi.2020.106449. - Cited References: 36. - The work was supported by the Ministry of Education and Science of Russia (project No. 3.1867.2017/4.6 ) and the RFBR (project No. 19-07-00471). The work was partially funded by the Academy of Finland . - ISSN 0749-6036
Кл.слова (ненормированные):
Zinc oxide -- Amorphous carbon -- Multi-layered structures -- Composites -- Hopping conductivity -- Weak localization -- Magnetoresistance
Аннотация: ZnO- and C-based heterostructures were fabricated by the layer-by-layer deposition technique using the ion-beam sputtering process. Structure, electrical and magnetic properties of fabricated heterostructures are discussed. The two-phase (ZnO and C) films are evolved into a multilayer structure, consisting of amorphous carbon and crystalline ZnO layers when the bilayer thickness increases. When carbon is added to ZnO, its electrical resistivity reduces. The conduction mechanism changes from the variable-range hopping in a narrow energy band to the nearest neighbors hopping in ZnO–C films with a thickness of h ˂ 150 nm. The temperature dependence of conductivity changes from the Arrhenius-like to logarithmic law, indicating that the strong charge localization turns into a weak one when the film thickness is about 150 nm. The negative magnetoresistance of up to 1% was detected at 77 K. The film ferromagnetism at the temperature of 10 K was not found.

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Держатели документа:
Kirensky Institute of Physics, Krasnoyarsk660036, Russian Federation
Lomonosov Moscow State University, Moscow119991, Russian Federation
Voronezh State Technical University, Voronezh394026, Russian Federation
National Research Centre ‘‘Kurchatov Institute”, Moscow123182, Russian Federation
Voronezh State University, Voronezh394003, Russian Federation
Lappeenranta-Lahti University of Technology, Lappeenranta FI53851, Finland

Доп.точки доступа:
Volochaev, M. N.; Волочаев, Михаил Николаевич; Granovsky, A. B.; Zhilova, O. V.; Kalinin, Y. E.; Ryl'kov, V. V.; Sumets, M. P.; Makagonov, V. A.; Pankov, S. Y.; Sitnikov, A. V.; Fadeev, E.; Lahderanta, E.; Foshin, V.
}
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11.


   
    Ferromagnetic and spin-wave resonance in the [CoFe/Cu]N superlattice thin (30-nm) film / I. G. Vazhenina, R. S. Iskhakov, M. V. Rautskii [et al.] // Phys. Solid State. - 2020. - Vol. 62, Is. 1. - P. 153-159, DOI 10.1134/S1063783420010357. - Cited References: 44. - This study was supported by the Russian Foundation for Basic Research, Government of the Krasnoyarsk Krai, and Krasnoyarsk Territorial Foundation for Support of Scientific and R&D Activities, project no. 18-42-243005 “Synthesis and Study of the Magnetic Properties of Gradient Materials with Different Types of a Specified Magnetic Parameter” and project “Spin” no. AAAA-A18-118020290104-2 . - ISSN 1063-7834
Кл.слова (ненормированные):
ferromagnetic and spin-wave resonance -- surface anisotropy constant -- exchange coupling constant -- superlattice
Аннотация: Angular dependences of the microwave absorption spectra of a (CoFe/Cu)N multilayer film have been studied by the ferromagnetic and spin-wave resonance techniques. The critical angle θc indicating the ranges of excitation of uniform and nonuniform spin modes, type of the boundary conditions, and surface anisotropy and exchange coupling constants have been established. It is shown that the accuracy of identification of individual modes in the spectra plays a key role in the analysis of the detected curves.

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Публикация на русском языке Ферромагнитный и спин-волновой резонанс в тонкой пленке (30 nm) сверхрешетки [CoFe/Cu]N [Текст] / И. Г. Важенина, Р. С. Исхаков, М. В. Рауцкий [и др.] // Физ. тверд. тела. - 2020. - Т. 62 Вып. 1. - С. 110-116

Держатели документа:
Kirensky Institute of Physics, Krasnoyarsk Scientific Center, Siberian Branch, Russian Academy of Sciences, Krasnoyarsk, 660036, Russian Federation
Mikheev Institute of Metal Physics, Ural Branch, Russian Academy of Sciences, Yekaterinburg, 620108, Russian Federation

Доп.точки доступа:
Vazhenina, I. G.; Важенина, Ирина Георгиевна; Iskhakov, R. S.; Исхаков, Рауф Садыкович; Rautskii, M. V.; Рауцкий, Михаил Владимирович; Milyaev, M. A.; Naumova, L. I.
}
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12.


    Altunin, R. R.
    Structural phase transformations during a solid-state reaction in a bilayer Al/Fe thin-film nanosystem / R. R. Altunin, E. T. Moiseenko, S. M. Zharkov // Phys. Solid State. - 2020. - Vol. 62, Is. 1. - P. 200-205, DOI 10.1134/S1063783420010059. - Cited References: 36. - This study was supported by the Russian Foundation for Basic Research, project no. 18-03-01173a . - ISSN 1063-7834
Кл.слова (ненормированные):
thin films -- Al/Fe -- solid-state reaction -- phase formation -- electron diffraction
Аннотация: The processes of phase formation during a solid-state reaction between Fe and Al nanolayers have been investigated by the in situ electron diffraction method. It is established that the solid-state reaction at the interface between iron and aluminum nanolayers begins at ≈100°C with the formation of a disordered Al solid solution in α-Fe. It is shown that intermetallic phases (FeAl6 and/or Fe2Al5, FeAl, and Fe3Al) are successively formed upon further heating.

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Публикация на русском языке Алтунин Р. Р. Структурные фазовые превращения при твердофазной реакции в двухслойной тонкопленочной наносистеме Al/Fe [Текст] / Р. Р. Алтунин, Е. Т. Моисеенко, С. М. Жарков // Физ. тверд. тела. - 2020. - Т. 62 Вып. 1. - С. 158-163

Держатели документа:
Siberian Federal University, Krasnoyarsk, 660041, Russian Federation
Kirensky Institute of Physics, Federal Research Center Krasnoyarsk Science Center, Siberian Branch, Russian Academy of Sciences, Krasnoyarsk, 660036, Russian Federation

Доп.точки доступа:
Moiseenko, E. T.; Zharkov, S. M.; Жарков, Сергей Михайлович
}
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13.


   
    Solid-state synthesis, rotatable magnetic anisotropy and characterization of Co1-xPtx phases in 50Pt/50fccCo(001) and 32Pt/68fccCo(001) thin films / V. G. Myagkov, L. E. Bykova, V. S. Zhigalov [et al.] // J. Alloys Compd. - 2021. - Vol. 861. - Ст. 157938, DOI 10.1016/j.jallcom.2020.157938. - Cited References: 80. - This study was supported by the Russian Foundation for Basic Research , Government of Krasnoyarsk Territory, Krasnoyarsk Regional Fund of Science for the research projects no. 19-43-240003. The authors thank I.V. Nemtsev for assisting with the measurements of the samples’ composition. The work is partially based upon the experiments performed at Krasnoyarsk Regional Center of Research Equipment of Federal Research Center «Krasnoyarsk Science Center SB RAS» . - ISSN 0925-8388
   Перевод заглавия: Твердотельный синтез, вращающаяся магнитная анизотропия и характеристика фаз Co1-xPtx в 50Pt/50fccCo(001) и 32Pt/68fccCo(001) тонких плёнок
Кл.слова (ненормированные):
L10-CoPt -- Hard magnetic -- Thin-film solid-state reactions -- Rotatable magnetic anisotropy -- Magnetic-field-induced twining -- Thin-film solid-state reactions
Аннотация: We reported the phase formation sequences in 50Pt/50fcc-Co(001) and 32Pt/68fcc-Co(001) thin films after annealing up to 850 °C. In both cases, the ordered L10 phase formed first on the Pt/Co interface at ∼400 °C and as the annealing temperature increased the L10 phase transformed into the chemically disordered fcc A1 phase in 50Pt/50fcc-Co(001) at 750 °C and in 32Pt/68fcc-Co(001) films at 550 °C. Based on the analysis of solid-state reactions in thin films, a phase transition at ∼ 400 °C is predicted in Co-Pt systems with a 32–72% Pt composition. Torque measurements of the 50Pt/50fcc-Co(001) samples showed that the rotatable magnetic anisotropy coexisted with the three variants of L10 in a temperature range of 400–750 °C. An analysis of the torque curves revealed that the L10 films consist of a soft magnetic layer epitaxially intergrown to the substrate MgO(001) and a top layer having rotatable magnetic anisotropy. It showed that the magnetically hard properties of L10 films are associated with a rotatable magnetic anisotropy layer. A model of rotatable magnetic anisotropy is reasoned, which is founded on some identical mechanisms of rotatable magnetic anisotropy and magnetic-field-induced strains, explaining the ferromagnetic shape-memory effect in Heusler alloys. Our results suggested that the rotatable magnetic anisotropy phenomena may have an important role in the origin of perpendicular anisotropy in hard magnetic L10 structures.

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Держатели документа:
Kirensky Institute of Physics, Federal Research Center KSC SB RAS, Krasnoyarsk, Russian Federation
Institute of Chemistry and Chemical Technology, Federal Research Center KSC SB RAS, Krasnoyarsk, Russian Federation

Доп.точки доступа:
Myagkov, V. G.; Мягков, Виктор Григорьевич; Bykova, L. E.; Быкова, Людмила Евгеньевна; Zhigalov, V. S.; Жигалов, Виктор Степанович; Matsynin, A. A.; Мацынин, Алексей Александрович; Velikanov, D. A.; Великанов, Дмитрий Анатольевич; Bondarenko, G. N.
}
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14.


   
    Second harmonic generation in thin permalloy film / P. N. Solovev, A. O. Afonin, B. A. Belyaev [et al.] // J. Phys. D. - 2021. - Vol. 54, Is. 42. - Ст. 425002, DOI 10.1088/1361-6463/ac1762. - Cited References: 43. - This work was supported by the Russian Science Foundation under Grant No. 19-72-10047. The equipment of the Krasnoyarsk Regional Center of Research Equipment of Federal Research Center 'Krasnoyarsk Science Center SB RAS' was used during the measurement . - ISSN 0022-3727. - ISSN 1361-6463
РУБ Physics, Applied
Рубрики:
FERROMAGNETIC-RESONANCE
   MAGNETIZATION DYNAMICS

   HARMONIC-GENERATION

   FERRITES

Кл.слова (ненормированные):
ferromagnetic resonance -- frequency doubling -- nonlinear dynamics -- thin magnetic film -- second harmonic
Аннотация: Second harmonic generation versus strength and direction of the applied static magnetic field was measured for a thin permalloy (Ni80Fe20) film in a microstrip line at a driving frequency of 1 GHz and maximum input power of ~110 mW. The measurements revealed two peaks in the double frequency signal—in the low static field (~10 Oe) and the high one (~45 Oe). To explain these findings, a macrospin model of a thin magnetic film with in-plane uniaxial magnetic anisotropy was considered. A perturbation expansion of the Landau–Lifshitz–Gilbert equation provided an explanation of the experimental data. The analysis of the model revealed that the low-field peak was caused by the longitudinal second-order magnetization component and the high-field peak by the transversal one. It was also shown that the uniaxial magnetic anisotropy of the film and the dependence of the magnetic damping parameter on the applied field play an important role in the process of the second harmonic generation. The results obtained give insights into some peculiarities of the nonlinear magnetization dynamics that are important in the development of magnetic film-based devices in the field of microwave signal processing and manipulation.

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Держатели документа:
Fed Res Ctr KSC SB RAS, Kirensky Inst Phys, 50-38 Akademgorodok, Krasnoyarsk 660036, Russia.
Siberian Fed Univ, 79 Svobodny Pr, Krasnoyarsk 660041, Russia.

Доп.точки доступа:
Solovev, P. N.; Соловьев, Платон Николаевич; Afonin, A. O.; Афонин, Алексей Олегович; Belyaev, B. A.; Беляев, Борис Афанасьевич; Boev, N. M.; Боев, Никита Михайлович; Govorun, I. V.; Говорун, Илья Валерьевич; Izotov, A. V.; Изотов, Андрей Викторович; Ugryumov, A. V.; Угрюмов, Андрей Витальевич; Leksikov, An. A.; Лексиков, Андрей Александрович; Russian Science FoundationRussian Science Foundation (RSF) [19-72-10047]
}
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15.


   
    Solid-state synthesis, dewetting, and magnetic and structural characterization of interfacial FexSn1−x layers in Sn/Fe(001) thin films / V. G. Myagkov, V. S. Zhigalov, L. E. Bykova [et al.] // J. Mater. Res. - 2021. - Vol. 36, Is. 15. - P. 3121-3133, DOI 10.1557/s43578-021-00312-4. - Cited References: 43. - This work was supported by the Russian Foundation for Basic Research together with the Government of the Krasnoyarsk Territory, the Krasnoyarsk Regional Fund of Science (Grant #19-43-240003). The work is partially based upon the experiments performed on Krasnoyarsk Regional Center of Research Equipment of Federal Research Center «Krasnoyarsk Science Center SB RAS» . - ISSN 0884-2914
   Перевод заглавия: Твердотельный синтез, смачивание, магнитные и структурные характеристики межфазных слоев FexSn1−x в тонких пленках Sn/Fe(001)
Кл.слова (ненормированные):
Alloy -- Thin film -- Annealing -- Surface reaction -- Phase equilibria -- Magnetic properties
Аннотация: The phase formation sequences in 9Sn/91Fe(001) and 25Sn/75Fe(001) bilayers during thin-film solid-state reactions up to 800°C were investigated using X-ray diffraction, the torque method, and scanning electron microscopy. In both samples, FeSn2, FeSn, α-Fe1−xSnx, Fe5Sn3, α-Fe, and β-Sn were sequentially formed at the initiation temperatures Tini ~ 150°C, ~ 300°C, ~ 550°C, ~ 600°C, and ~ 700°C, respectively. Low-temperature transformations were predicted at temperatures TK1 ~ 150°C and TK2 ~ 300°C, which are absent in the phase equilibrium diagram of the Fe–Sn system. Solid-state dewetting of the 9Sn/91Fe(001) and 25Sn/75Fe(001) bilayers started at temperatures above 550°C. Overall, this work sheds new light on general chemical mechanisms governing the synthesis of intermetallic phases in Sn/Fe(001) thin films, the phase transformations, and the evolution of the dewetting process of FexSn1−x films.

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Держатели документа:
Kirensky Institute of Physics, Federal Research Center KSC SB RAS, Akademgorodok 50/38, Krasnoyarsk, 660036, Russian Federation
Institute of Chemistry and Chemical Technology, Federal Research Center KSC SB RAS, 50/24 Akademgorodok, Krasnoyarsk, 660036, Russian Federation
Federal Research Center Krasnoyarsk Science Center, Siberian Branch of the Russian Academy of Sciences, Akademgorodok 50, Krasnoyarsk, 660036, Russian Federation

Доп.точки доступа:
Myagkov, V. G.; Мягков, Виктор Григорьевич; Zhigalov, V. S.; Жигалов, Виктор Степанович; Bykova, L. E.; Быкова, Людмила Евгеньевна; Solovyov, L. A.; Matsynin, A. A.; Мацынин, Алексей Александрович; Balashov, Yu. Yu.; Балашов, Юрий Юрьевич; Nemtsev, I. V.; Немцев, Иван Васильевич; Shabanov, A. V.; Шабанов, Александр Васильевич; Bondarenko, G. N.
}
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16.


   
    Structural, optical, and electronic properties of Cu-doped TiNxOy grown by ammonothermal atomic layer deposition / F. A. Baron, Y. L. Mikhlin, M. S. Molokeev [et al.] // ACS Appl. Mater. Interfaces. - 2021. - Vol. 13, Is. 27. - P. 32531-32541, DOI 10.1021/acsami.1c08036. - Cited References: 69. - This research was funded by the RFBR, Krasnoyarsk Territory and Krasnoyarsk Regional Fund of Science (project code 20-42-240013) and by the grant of the Government of the Russian Federation for Creation of World Tier Laboratories (contract no. 075-15-2019-1886) . - ISSN 1944-8244. - ISSN 1944-8252
РУБ Nanoscience & Nanotechnology + Materials Science, Multidisciplinary
Рубрики:
OXYNITRIDE THIN-FILMS
   TITANIUM-NITRIDE

   CONFORMAL TIN

Кл.слова (ненормированные):
atomic layer deposition -- titanium oxynitride -- copper doping -- surface segregation -- thin film
Аннотация: Copper-doped titanium oxynitride (TiNxOy) thin films were grown by atomic layer deposition (ALD) using the TiCl4 precursor, NH3, and O2 at 420 °C. Forming gas was used to reduce the background oxygen concentration and to transfer the copper atoms in an ALD chamber prior to the growth initiation of Cu-doped TiNxOy. Such forming gas-mediated Cu-doping of TiNxOy films had a pronounced effect on their resistivity, which dropped from 484 ± 8 to 202 ± 4 μΩ cm, and also on the resistance temperature coefficient (TCR), which decreased from 1000 to 150 ppm °C–1. We explored physical mechanisms causing this reduction by performing comparative analysis of atomic force microscopy, X-ray photoemission spectroscopy, X-ray diffraction, optical spectra, low-temperature transport, and Hall measurement data for the samples grown with and without forming gas doping. The difference in the oxygen concentration between the films did not exceed 6%. Copper segregated to the TiNxOy surface where its concentration reached 0.72%, but its penetration depth was less than 10 nm. Pronounced effects of the copper doping by forming gas included the TiNxOy film crystallite average size decrease from 57–59 to 32–34 nm, considerably finer surface granularity, electron concentration increase from 2.2(3) × 1022 to 3.5(1) × 1022 cm–3, and the electron mobility improvement from 0.56(4) to 0.92(2) cm2 V–1 s–1. The DC resistivity versus temperature R(T) measurements from 4.2 to 300 K showed a Cu-induced phase transition from a disordered to semimetallic state. The resistivity of Cu-doped TiNxOy films decreased with the temperature increase at low temperatures and reached the minimum near T = 50 K revealing signatures of the quantum interference effects similar to 2D Cu thin films, and then, semimetallic behavior was observed at higher temperatures. In TiNxOy films grown without forming gas, the resistivity decreased with the temperature increase as R(T) = – 1.88T0.6 + 604 μΩ cm with no semimetallic behavior observed. The medium range resistivity and low TCR of Cu-doped TiNxOy make this material an attractive choice for improved matching resistors in RF analog circuits and Si complementary metal–oxide–semiconductor integrated circuits.

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Держатели документа:
KSC SB RAS, Inst Chem & Chem Technol, Fed Res Ctr, Krasnoyarsk 660036, Russia.
KSC SB RAS, Kirensky Inst Phys, Fed Res Ctr, Krasnoyarsk 660036, Russia.
Siberian Fed Univ, Krasnoyarsk 660041, Russia.
Reshetnev Siberian State Univ Sci & Technol, Krasnoyarsk 660037, Russia.

Доп.точки доступа:
Baron, F. A.; Барон, Филипп Алексеевич; Mikhlin, Yurii L.; Molokeev, M. S.; Молокеев, Максим Сергеевич; Rautskiy, M. V.; Рауцкий, Михаил Владимирович; Tarasov, I. A.; Тарасов, Иван Анатольевич; Volochaev, M. N.; Волочаев, Михаил Николаевич; Shanidze, L. V.; Шанидзе, Лев Викторович; Lukyanenko, A. V.; Лукьяненко, Анна Витальевна; Smolyarova, T. E.; Смолярова, Татьяна Евгеньевна; Konovalov, Stepan O.; Zelenov, Fyodor, V; Tarasov, A. S.; Тарасов, Антон Сергеевич; Volkov, N. V.; Волков, Никита Валентинович; RFBR, Krasnoyarsk Territory and Krasnoyarsk Regional Fund of Science [20-42-240013]; Government of the Russian Federation for Creation of World Tier Laboratories [075-15-2019-1886]
}
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17.


    Solovev, P. N.
    Numerical study of structural and magnetic properties of thin films obliquely deposited on rippled substrates / P. N. Solovev, A. V. Izotov, B. A. Belyaev // J. Phys.: Condens. Matter. - 2021. - Vol. 33, Is. 49. - Ст. 495802, DOI 10.1088/1361-648X/ac26fc. - Cited References: 35. - The reported study was funded by RFBR, the Government of Krasnoyarsk Territory, Krasnoyarsk Regional Fund and JSC 'NPP Radiosviaz', Project Number 20-42-242901 . - ISSN 0953-8984. - ISSN 1361-648X
РУБ Physics, Condensed Matter
Рубрики:
SIMULATION
   ANISOTROPY

   GROWTH

Кл.слова (ненормированные):
oblique deposition -- micromagnetic simulation -- thin film growth simulation -- rippled substrate -- magnetic anisotropy -- magnetization reversal
Аннотация: Structural modulation in thin films plays a substantial role in the formation of their magnetic properties. By producing topographic patterns in thin films, it is possible to engineer their magnetic response. Here, we report on the numerical study of the relationship between structural and static magnetic properties of thin films obliquely deposited on substrates with the sinusoidal surface. 3D Monte Carlo film growth simulations show that, under certain deposition conditions, an inhomogeneous columnar morphology can form in the films caused by the shadowing effect and the rippled substrate. Calculations of the demagnetizing tensors for these films demonstrate that their columnar structure is the source of the shape-induced uniaxial magnetic anisotropy that varies nonmonotonically with the deposition angle. Micromagnetic simulations of the generated films confirm the uniaxial character of the shape-induced anisotropy, and also show that magnetization reversal occurs via an incoherent rotation of magnetic moments.

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Держатели документа:
Fed Res Ctr KSC SB RAS, Kirensky Inst Phys, 50-38 Akademgorodok, Krasnoyarsk 660036, Russia.
Siberian Fed Univ, 79 Svobodny Pr, Krasnoyarsk 660041, Russia.

Доп.точки доступа:
Izotov, A. V.; Изотов, Андрей Викторович; Belyaev, B. A.; Беляев, Борис Афанасьевич; Соловьев, Платон Николаевич; RFBRRussian Foundation for Basic Research (RFBR); Government of Krasnoyarsk Territory; Krasnoyarsk Regional Fund; JSC 'NPP Radiosviaz' [20-42-242901]
}
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18.


   
    Features of MagMAX thin film deposition techniques / S. A. Lyashchenko, I. A. Yakovlev, A. S. Tarasov [et al.] // International workshop on the properties of functional MAX-materials (2nd FunMax) : book of abstracts / org. com. M. Farle [et al.]. - 2021. - P. 14

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Доп.точки доступа:
Farle, M. \org. com.\; Ovchinnikov, S. G. \org. com.\; Овчинников, Сергей Геннадьевич; Tarasov, A. S. \org. com.\; Тарасов, Антон Сергеевич; Smolyarova, T. E. \org. com.\; Смолярова, Татьяна Евгеньевна; Lyashchenko, S. A.; Лященко, Сергей Александрович; Yakovlev, I. A.; Яковлев, Иван Александрович; Tarasov, A. S.; Shevtsov, D. V.; Шевцов, Дмитрий Валентинович; Varnakov, S. N.; Варнаков, Сергей Николаевич; Ovchinnikov, S. G.; Farle, M.; Фарле, Михаель; International workshop on functional MAX-materials(2 ; 2021 ; Sept. 14-17 ; Krasnoyarsk (on-line)); Kirensky Institute of Physics; Siberian Federal Univercity
}
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19.


   
    Cu-doped TiNxOy thin film resistors DC/RF performance and reliability / L. V. Shanidze, A. S. Tarasov, M. V. Rautskiy [et al.] // Appl. Sci. - 2021. - Vol. 11, Is. 16. - Ст. 7498, DOI 10.3390/app11167498. - Cited References: 13. - This research was funded by RFBR, Krasnoyarsk Territory and Krasnoyarsk Regional Fund of Science, project code 20-42-240013 and by Grant of the Government of the Russian Federation for Creation ofWorld Tier Laboratories (contract No. 075-15-2019-1886) . - ISSN 2076-3417
   Перевод заглавия: Производительность и надежность тонкопленочных резисторов TiNxOy, легированных медью
РУБ Chemistry, Multidisciplinary + Engineering, Multidisciplinary + Materials Science, Multidisciplinary + Physics, Applied
Рубрики:
GROWTH
Кл.слова (ненормированные):
high-frequency passive components -- high power density -- thin film -- copper doped titanium oxynitride -- non-linear -- resistors -- heterogeneous integration
Аннотация: We fabricated Cu-doped TiNxOy thin film resistors by using atomic layer deposition, optical lithography, dry etching, Ti/Cu/Ti/Au e-beam evaporation and lift-off processes. The results of the measurements of the resistance temperature dependence, non-linearity, S-parameters at 0.01–26 GHz and details of the breakdown mechanism under high-voltage stress are reported. The devices’ sheet resistance is 220 ± 8 Ω/□ (480 ± 20 µΩ*cm); intrinsic resistance temperature coefficient (TCR) is ~400 ppm/°C in the T-range of 10–300 K; and S-parameters versus frequency are flat up to 2 GHz with maximum variation of 10% at 26 GHz. The resistors can sustain power and current densities up to ~5 kW*cm−2 and ~2 MA*cm−2, above which they switch to high-resistance state with the sheet resistance equal to ~200 kΩ/□ (~0.4 Ω*cm) caused by nitrogen and copper desorption from TiNxOy film. The Cu/Ti/TiNxOy contact is prone to ageing due to gradual titanium oxidation while the TiNxOy resistor body is stable. The resistors have strong potential for applications in high-frequency integrated and hybrid circuits that require small-footprint, medium-range resistors of 0.05–10 kΩ, with small TCR and high-power handling capability.

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Держатели документа:
Fed Res Ctr KSC SB RAS, Kirensky Inst Phys, Krasnoyarsk 660036, Russia.
Siberian Fed Univ, Dept Radio Elect, Krasnoyarsk 660041, Russia.
Reshetnev Siberian State Univ Sci & Technol, Inst Space Technol, Krasnoyarsk 660037, Russia.

Доп.точки доступа:
Shanidze, L. V.; Шанидзе, Лев Викторович; Tarasov, A. S.; Тарасов, Антон Сергеевич; Rautskiy, M. V.; Рауцкий, Михаил Владимирович; Zelenov, F. V.; Konovalov, S. O.; Nemtsev, I. V.; Немцев, Иван Васильевич; Voloshin, A. S.; Волошин, Александр Сергеевич; Tarasov, I. A.; Тарасов, Иван Анатольевич; Baron, F. A.; Барон, Филипп Алексеевич; Volkov, N. V.; Волков, Никита Валентинович; RFBR, Krasnoyarsk Territory and Krasnoyarsk Regional Fund of Science [20-42-240013]; Government of the Russian Federation for Creation ofWorld Tier Laboratories [075-15-2019-1886]
}
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20.


   
    Theoretical study of the frequency multiplier based on irregular quarter-wavelength microstrip resonator with thin magnetic film / B. A. Belyaev, A. V. Izotov, A. A. Leksikov [et al.] // Russ. Phys. J. - 2021. - Vol. 63, Is. 9. - P. 1447-1460, DOI 10.1007/s11182-021-02191-y. - Cited References: 21 . - ISSN 1064-8887
Кл.слова (ненормированные):
microstrip resonator -- thin magnetic film -- frequency multiplication -- nonlinear magnetization oscillations
Аннотация: The characteristics of a frequency doubler on a resonant microstrip structure with a thin magnetic film were studied theoretically. The electrodynamic calculation of the structure was performed within the quasi-static approximation. Nonlinear response of film magnetization was calculated taking into account the second-order terms in the Landau-Lifshitz equation. The frequency response of the microstrip resonator was calculated. It was shown that due to the use of the resonant circuit, high efficiency of the input signal energy conversion into the output signal at a doubled frequency was achieved. The optimal values of the magnitude and direction of an external static magnetic field, which ensure the maximum output power at a doubled frequency, were determined.

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Публикация на русском языке Теоретическое исследование умножителя частоты на основе нерегулярного четвертьволнового микрополоскового резонатора с тонкой магнитной пленкой [Текст] / Б. А. Беляев, А. В. Изотов, А. А. Лексиков [и др.] // Изв. вузов. Физика. - 2020. - Т. 63 № 9. - С. 3-14

Держатели документа:
Kirensky Institute of Physics of the Siberian Branch of the Russian Academy of Sciences – Division of Federal Research Center “Krasnoyarsk Scientific Center of the Siberian Branch of the Russian Academy of Sciences”, Krasnoyarsk, Russian Federation
Siberian Federal University, Krasnoyarsk, Russian Federation

Доп.точки доступа:
Belyaev, B. A.; Беляев, Борис Афанасьевич; Izotov, A. V.; Изотов, Андрей Викторович; Leksikov, An. A.; Лексиков, Андрей Александрович; Solovev, P. N.; Соловьев, Платон Николаевич; Tyurnev, V. V.; Тюрнев, Владимир Вениаминович
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