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Вид документа : Статья из журнала
Шифр издания :
Автор(ы) : Shevtsov D. V., Lyashchenko S. A., Varnakov S. N.
Заглавие : An ultrahigh-vacuum multifunctional apparatus for synthesis and in situ investigation of low-dimensional structures by spectral magnetoellipsometry in the temperature range of 85–900 K
Место публикации : Instrum. Exp. Tech. - 2017. - Vol. 60, Is. 5. - P.759-763. - ISSN 00204412 (ISSN), DOI 10.1134/S0020441217050086
Примечания : Cited References: 19. - This study was supported by a Grant of the President of the Russian Federation for Support of Leading Schools (project no. NSh-7559.2016.2), by the Russian Foundation for Basic Research, the Government of Krasnoyarsk krai, and the Krasnoyarsk krai foundation for support of scientific and research and technical activity as a part of the scientific project no. 16-42-243058.
Ключевые слова (''Своб.индексиров.''): semiconducting silicon--temperature distribution--ultrahigh vacuum--ellipsometric measurements--in-situ investigations--low dimensional structure--metallic nanostructure--multifunctional apparatus--optical and magneto-optical properties--temperature dependence--temperature range--optical properties
Аннотация: This paper presents the results of modernizing an ultrahigh-vacuum multifunctional apparatus that allows one to obtain semiconductor or metallic nanostructures in a single technological cycle and to investigate their optical and magneto-optical properties in a temperature range of 85–900 K. The capabilities of the developed system were demonstrated based on the example of studying the temperature dependence of the bulk Si permittivity via spectral ellipsometric measurements. © 2017, Pleiades Publishing, Inc.
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Вид документа : Статья из журнала
Шифр издания :
Автор(ы) : Andryushchenko T. A., Lyashchenko S. A., Varnakov S. N., Lukyanenko A. V., Nemtsev I. V., Yakovlev I. A., Shevtsov D. V., Maximova O. A., Ovchinnikov S. G.
Заглавие : Auger electron spectroscopy of thin Cr2GeC films
Колич.характеристики :7 с
Место публикации : Phys. Met. Metallogr. - 2023. - Vol. 124, Is. 14. - P.1776-1782. - ISSN 0031918X (ISSN), DOI 10.1134/S0031918X2360135X. - ISSN 15556190 (eISSN)
Примечания : Cited References: 33. - The research was supported by the Russian Science Foundation (grant no. 21-12-00226, http://rscf.ru/project/21-12-00226/)
Аннотация: Auger electron spectroscopy was used to determine the phase composition of Cr2GeC MAX phase thin films. A distinctive feature of the formation of carbon-containing MAX phases is the shape of carbon Auger peaks, which is characteristic of metal carbides spectra. Features of the Auger spectra in the presence of secondary phases of chromium germanides are found. Their presence can manifest itself in an increase in the energy of the germanium peaks, which is caused by a chemical shift during the formation of the Cr–Ge bond. Moreover, we have detected the accumulation of electronic charge, which can be explained by the features of the surface morphology.
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Вид документа : Статья из сборника (выпуск монографической серии)
Шифр издания :
Автор(ы) : Maximova O. A., Kosyrev N. N., Varnakov S. N., Lyashchenko S. A., Tarasov I. A., Yakovlev I. A., Maximova O. M., Shevtsov D. V., Ovchinnikov S. G.
Заглавие : Development of in situ magneto-ellipsometry for studying correlation between the optical and magneto-optical properties of ferromagnetic thin films
Коллективы : Joint European Magnetic Symposia , Russian Foundation for Basic Research [16-32-00209 mol_a, 14-02-01211, 16-42-24083]; Complex program of SB RAS [II.2P, 0358-2015-0004]; Ministry of Education and Science of the RF [16.663.2014kappa]; Grant of the President of the Russian Federation [7559.2016.2]
Место публикации : J. Phys.: Conf. Ser. - 2017. - Vol. 903. - Ст.012060. - , DOI 10.1088/1742-6596/903/1/012060
Примечания : Cited References:7. - The work was supported partly by the Russian Foundation for Basic Research Grant No. 16-32-00209 mol_a, Grant No. 14-02-01211, Grant No. 16-42-24083; the Complex program of SB RAS No II.2P, project 0358-2015-0004; the Ministry of Education and Science of the RF (State task No. 16.663.2014 kappa); Grant of the President of the Russian Federation (Scientific School No. 7559.2016.2).
Аннотация: In this work we present the way of nanostructured films study by means of magneto-ellipsometry. The method of interpretation of in situ magneto-optical ellipsometry spectra from the in situ molecular beam epitaxy setup with an integrated magneto-ellipsometric real time synthesis control is described. The method has been successfully tested on Fe/SiO2/Si nanostructures within the model of a homogeneous semi-infinite medium. As a result, the dielectric tensor components for Fe layer were calculated using a developed approach.
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Вид документа : Статья из сборника (однотомник)
Шифр издания :
Автор(ы) : Maximova O. A., Lyashchenko S. A., Shevtsov D. V., Yakovlev I. A., Ovchinnikov S. G.
Заглавие : Development of techniques for processing data from magneto-ellipsometry measurements
Коллективы : Asian School-Conference on Physics and Technology of Nanostructured Materials, Азиатская школа-конференция по физике и технологии наноструктурированных материалов, Институт автоматики и процессов управления ДВО РАН, Дальневосточный федеральный университет
Место публикации : Fourth Asian school-conference on physics and technology of nanostructured materials (ASCO-NANOMAT 2018): proceedings/ progr. com. S. G. Ovchinnikov [et al.]. - 2018. - Ст.IV.25.05p. - P.180. - ISBN 978-5-7444-4368-9
Аннотация: The approach to data processing for layered thin films with a ferromagnet layer is proposed for studying optical and magneto- optical properties. The scope and applicability of models which describe reflective layered structures are studied in order to recommend the best model choice for each case. A significant effect of penetration depth on this choice was observed.
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Вид документа : Статья из журнала
Шифр издания :
Автор(ы) : Maximova O. A., Lyashchenko S. A., Vysotin M. A., Tarasov I. A., Yakovlev I. A., Shevtsov D. V., Fedorov A. S., Varnakov S. N., Ovchinnikov S. G.
Заглавие : Experimental and Theoretical In Situ Spectral Magneto-Ellipsometry Study of Layered Ferromagnetic Structures
Место публикации : JETP Letters. - 2019. - Vol. 110, Is. 3. - P.166-172. - ISSN 00213640 (ISSN), DOI 10.1134/S0021364019150098
Примечания : Cited References: 28. - This work was supported by the Ministry of Education and Science of the Russian Federation and the Siberian Branch, Russian Academy of Sciences (project nos. 0356-2018-0061 and II.8.70).
Аннотация: A method for processing of in situ spectral magneto-ellipsometry data has been developed to analyze planar ferromagnetic nanostructures. A multilayer model containing a ferromagnetic layer with two interfaces, a nonferromagnetic buffer layer, and a nonferromagnetic substrate has been tested within a new approach to the interpretation of magnetic-field-modulated spectral ellipsometric measurements involving the magnetooptical Kerr effect in the transverse configuration. In particular, the effect of the thickness of the ferromagnetic layer on the results of magneto-ellipsometric measurements has been analyzed. The measurements have been performed with polycrystalline Fe films with different thicknesses on a nonferromagnetic SiO2/Si(100) surface. The diagonal and off-diagonal components of the complex dielectric tensor in the spectral range of 1.38–3.45 eV have been determined by processing spectral magneto-ellipsometric data. The results have been compared to the available data obtained by other authors and to the calculation of the dielectric tensor of Fe within the density functional theory.
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Вид документа : Статья из сборника (однотомник)
Шифр издания :
Автор(ы) : Maximova O. A., Lyashchenko S. A., Visotin M. A., Tarasov I. A., Yakovlev I. A., Shevtsov D. V., Fedorov A. S., Varnakov S. N., Ovchinnikov S. G.
Заглавие : Fe/SiO2/Si thin films study by means of in situ magneto-ellipsometry and DFT
Коллективы : Российская академия наук, Уральское отделение РАН, Институт физики металлов им. М. Н. Михеева Уральского отделения РАН, Уральский федеральный университет им. первого Президента России Б.Н. Ельцина, Российский фонд фундаментальных исследований, Euro-Asian Symposium "Trends in MAGnetism", "Trends in MAGnetism", Euro-Asian Symposium
Место публикации : Euro-asian symposium "Trends in magnetism" (EASTMAG-2019): Book of abstracts/ чл. конс. ком.: S. G. Ovchinnikov, N. V. Volkov [et al.] ; чл. прогр. ком. D. M. Dzebisashvili [et al.]. - 2019. - Vol. 1. - Ст.E.P1. - P.421-422. - ISBN 978-5-9500855-7-4 (Шифр В33/E12-125657784)
Примечания : Cited References: 4. - Support by the Ministry of Education and Science of the Russian Federation and by Siberian Branch of the Russian Academy of Sciences (Project II.8.70, 0356-2018-0057) is acknowledged. Participation in the event VII Euro-Asian Symposium “Trends in Magnetism” (EASTMAG-2019) was funded by Krasnoyarsk Regional Fund of Science
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Вид документа : Статья из сборника (однотомник)
Шифр издания :
Автор(ы) : Lyashchenko S. A., Andryushchenko T. A., Yakovlev I. A., Lukyanenko A. V., Shevtsov D. V., Varnakov S. N., Ovchinnikov S. G.
Заглавие : Features of (Cr1-xMnx)2GeC thin film magnetron deposition
Коллективы : International Baltic Conference on Magnetism, Балтийский федеральный университет им. И. Канта
Место публикации : V International Baltic Conference on Magnetism. IBCM: Book of abstracts. - 2023. - P.49
Примечания : Cited References: 3. - РНФ № 21-12-00226
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Вид документа : Статья из сборника (однотомник)
Шифр издания :
Автор(ы) : Lyashchenko S. A., Yakovlev I. A., Tarasov A. S., Shevtsov D. V., Varnakov S. N., Ovchinnikov S. G., Farle M.
Заглавие : Features of MagMAX thin film deposition techniques
Коллективы : International workshop on functional MAX-materials, Kirensky Institute of Physics, Siberian Federal Univercity
Место публикации : International workshop on the properties of functional MAX-materials (2nd FunMax): book of abstracts/ org. com. M. Farle [et al.]. - 2021. - P.14
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Вид документа : Статья из журнала
Шифр издания :
Автор(ы) : Tarasov A. S., Lyashchenko S. A., Rautskii M. V., Lukyanenko A. V., Andryushchenko T. A., Solovyov, Leonid A., Yakovlev I. A., Maximova O. A., Shevtsov D. V., Bondarev M. A., Bondarev I. A., Ovchinnikov S. G., Varnakov S. N.
Заглавие : Growth process, structure and electronic properties of Cr2GeC and Cr2-xMnxGeC thin films prepared by magnetron sputtering
Колич.характеристики :12 с
Место публикации : Processes. - 2023. - Vol. 11, Is. 8. - Ст.2236. - ISSN 22279717 (eISSN), DOI 10.3390/pr11082236
Примечания : Cited References: 43. - This study was supported by the Russian Science Foundation, project no. 21-12-00226The authors thank the laboratory of the Magnetic MAX Materials created under the Megagrant project (agreement no. 075-15-2019-1886) for providing experimental equipment and the Collective Use Center at the Krasnoyarsk Scientific Center (Siberian Division, Russian Academy of Sciences) for assistance
Аннотация: The growth and phase formation features, along with the influence of structure and morphology on the electronic, optical, and transport properties of Cr2GeC and Cr2-xMnxGeC MAX phase thin films synthesized by magnetron sputtering technique, were studied. It was found that the Cr:Ge:C atomic ratios most likely play the main role in the formation of a thin film of the MAX phase. A slight excess of carbon and manganese doping significantly improved the phase composition of the films. Cr2GeC films with a thicknesses exceeding 40 nm consisted of crystallites with well-developed facets, exhibiting metallic optical and transport properties. The hopping conduction observed in the Cr2-xMnxGeC film could be attributed to the columnar form of crystallites. Calculations based on a two-band model indicated high carrier concentrations N, P and mobility μ in the best-synthesized Cr2GeC film, suggesting transport properties close to single crystal material. The findings of this study can be utilized to enhance the growth technology of MAX phase thin films.
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10.

Вид документа : Статья из журнала
Шифр издания :
Автор(ы) : Lyashchenko S. A., Tarasov I. A., Varnakov S. N., Shevtsov D. V., Shvets V. A., Zabluda V. N., Ovchinnikov S. G., Kosyrev N. N., Bondarenko G. V., Rykhlitskii S. V.
Заглавие : In situ investigations of magneto-optical properties of thin Fe layers
Место публикации : Tech. Phys. - 2013. - Vol. 58, Is. 10. - P.1529-1532. - ISSN 1063-7842, DOI 10.1134/S1063784213100162
Аннотация: A thin polycrystalline Fe film on a single-crystal Si substrate with natural SiO2 oxide is obtained by thermal evaporation in ultrahigh vacuum. The magneto-optical properties of the resultant structure are investigated in situ by the methods of spectral ellipsometry. The values of the coercive force for the Fe film are obtained, and the magnetization reversal loop and the energy dependence of the equatorial Kerr effect are constructed. The effectiveness of magnetoellipsometry for in situ analysis of the geometrical and magnetooptical properties of thin ferromagnetic layers is demonstrated. В© 2013 Pleiades Publishing, Ltd.
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11.

Вид документа : Статья из журнала
Шифр издания :
Автор(ы) : Maximova O. A., Kosyrev N. N., Varnakov S. N., Lyashchenko S. A., Yakovlev I. A., Tarasov I. A., Shevtsov D. V., Maximova O. M., Ovchinnikov S. G.
Заглавие : In situ magneto-optical ellipsometry data analysis for films growth control
Коллективы : Euro-Asian Symposium "Trends in MAGnetism", "Trends in MAGnetism", Euro-Asian Symposium, Институт физики им. Л.В. Киренского Сибирского отделения РАН , Russian Foundation for Basic Research; Government of Krasnoyarsk Territory, Krasnoyarsk Region Science and Technology [16-42-243058, 16-42-243060]; Russian Foundation for Basic Research [16-32-00209 mol_a, 14-02-01211]; SB RAS II.2P [0358-2015-0004]; Ministry of Education and Science of RF [16.663.2014]; Grant Scientific School [7559.2016.2]
Место публикации : J. Magn. Magn. Mater.: Elsevier Science, 2017. - Vol. 440: EURO-Asian Symposium on Trends in Magnetism (EASTMAG) (AUG 15-19, 2016, Siberian Fed Univ, Krasnoyarsk, RUSSIA). - P.196-198. - ISSN 0304-8853, DOI 10.1016/j.jmmm.2016.12.050. - ISSN 1873-4766(eISSN)
Примечания : Cited References:10. - The reported study was funded by Russian Foundation for Basic Research, Government of Krasnoyarsk Territory, Krasnoyarsk Region Science and Technology Support Fund to the research project Nos. 16-42-243058 and 16-42-243060. The work was supported partly by the Russian Foundation for Basic Research, Grant nos. 16-32-00209 mol_a and 14-02-01211; the Complex program of SB RAS II.2P, project 0358-2015-0004; the Ministry of Education and Science of the RF (State task no. 16.663.2014); Grant Scientific School 7559.2016.2.
Ключевые слова (''Своб.индексиров.''): magneto-optical kerr effect--ellipsometry--in situ measurements
Аннотация: In this work we present the way of ferromagnetic films study by means of magneto-ellipsometry. The method of interpretation of in situ magneto-optical ellipsometry spectra for real time growth control is described. The method has been successfully tested on Si/SiO2/Fe films within the model of a homogeneous semi-infinite medium. As a result, the dielectric tensor components for Fe layer were calculated using a developed approach.
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12.

Вид документа : Статья из журнала
Шифр издания :
Автор(ы) : Maximova O. A., Kosyrev N. N., Yakovlev I. A., Shevtsov D. V., Lyashchenko S. A., Varnakov S. N., Ovchinnikov S. G.
Заглавие : Magneto-ellipsometry as a powerful technique for investigating magneto-optical structures properties
Коллективы : Euro-Asian Symposium "Trends in MAGnetism", "Trends in MAGnetism", Euro-Asian Symposium, Институт физики им. Л.В. Киренского Сибирского отделения РАН , Russian Foundation for Basic Research, Government of Krasnoyarsk Territory, Krasnoyarsk Region Science and Technology Support Fund [1642-243058]; Russian Foundation for Basic Research [16-32-00209mol_a, 14-02-01211]; Ministry of Education and Science of the RF [16.663.2014K, 7559.2016.2]; Complex program of SB RAS [II.2P, 03582015-0004]
Место публикации : J. Magn. Magn. Mater.: Elsevier Science, 2017. - Vol. 440. - P.153-156. - ISSN 0304-8853, DOI 10.1016/j.jmmm.2016.12.073. - ISSN 1873-4766(eISSN)
Примечания : Cited References:20. - The reported study was funded by Russian Foundation for Basic Research, Government of Krasnoyarsk Territory, Krasnoyarsk Region Science and Technology Support Fund to the research project No 1642-243058. The work was supported by the Russian Foundation for Basic Research, Grant No. 16-32-00209mol_a, Grant No. 14-02-01211, The Complex program of SB RAS No II.2P, project 03582015-0004, the Ministry of Education and Science of the RF (State task No. 16.663.2014K), grant Scientific School 7559.2016.2.
Ключевые слова (''Своб.индексиров.''): magneto-optical kerr effect--ellipsometry--in situ measurements
Аннотация: In this work we report on new magneto-ellipsometry set-up that allows to grow thin films and nanostructures by ultrahigh vacuum thermal evaporation as well as to conduct in situ measurements during the growth in order to analyze and control nanostructures properties. Ellipsometry and transverse magneto-optical Kerr effect measurements can be performed in situ inside this set-up. A uniform magnetic field of high intensity (more than 1 kOe) can be applied to samples inside the vacuum chamber. Also, we report on the developed method of data interpretation that is the base of the set-up software. Thus, we present a powerful tool for nanostructures synthesis and characterization.
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13.

Вид документа : Статья из сборника (однотомник)
Шифр издания :
Автор(ы) : Maximova O. A., Kosyrev N. N., Yakovlev I. A., Shevtsov D. V.
Заглавие : Magneto-ellipsometry as a powerful technique for investigating magneto-optical structures properties
Коллективы : Euro-Asian Symposium "Trends in MAGnetism", "Trends in MAGnetism", Euro-Asian Symposium, Институт физики им. Л.В. Киренского Сибирского отделения РАН
Место публикации : VI Euro-Asian Symposium "Trends in MAGnetism" (EASTMAG-2016): abstracts/ ed.: O. A. Maksimova, R. D. Ivantsov. - Krasnoyarsk: KIP RAS SB, 2016. - Ст.P6.12. - P.320. - ISBN 978-5-904603-06-9 (Шифр -478014040)
Примечания : References: 5. - The work was supported by The Complex program of SB RAS № II.2P, project 0358-2015-0004
Ключевые слова (''Своб.индексиров.''): magneto-optics--ellisometry--magneto-optical kerr effect
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14.

Вид документа : Статья из сборника (однотомник)
Шифр издания :
Автор(ы) : Maximova O. A., Lyashchenko S. A., Yakovlev I. A., Shevtsov D. V., Varnakov S. N., Ovchinnikov S. G.
Заглавие : Magneto-ellipsometry for controlling properties of perspective magnetic materials
Коллективы : International Baltic Conference on Magnetism: nanoboimedicine and smart materials, Балтийский федеральный университет им. И. Канта
Место публикации : 3th International Baltic Conference on Magnetism (IBCM 2019): Book of abstracts. - 2019. - P.130
Примечания : Cited References: 7. - This work is supported by the Ministry of Education and Science of the Russian Federation and by Siberian Branch of the Russian Academy of Sciences (Project II.8.70) and Fundamental research program of the Presidium of the RAS no. 32 «Nanostructures: physics, chemistry, biology, basics of technologies
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15.

Вид документа : Статья из сборника (однотомник)
Шифр издания :
Автор(ы) : Maximova O. A., Lyashchenko S. A., Varnakov S. N., Yakovlev I. A., Shevtsov D. V., Andryushchenko T. A., Ovchinnikov S. G.
Заглавие : Magneto-optical Ellipsometry of Thin Films with Optical Uniaxial Anisotropy
Коллективы : "Functional materials", International conference, Крымский федеральный университет имени В.И. Вернадского
Место публикации : Ovchinnikov S. G. International conference "Functional materials": book of abstracts/ ed. V. N. Berzhansky ; org. com. S. G. Ovchinnikov [et al.]. - Simferopol, 2023. - Ст.AP2-8P/4. - P.122
Примечания : Cited References: 2. - РФФИ No. 21-12-00226
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16.

Вид документа : Статья из журнала
Шифр издания :
Автор(ы) : Maximova O. A., Lyashchenko S. A., Varnakov S. N., Ovchinnikov S. G., Yakovlev I. A., Shevtsov D. V., Andryushchenko T. A.
Заглавие : Magneto-optical ellipsometry of thin films with optical uniaxial anisotropy
Колич.характеристики :8 с
Место публикации : Phys. Met. Metallogr. - 2023. - Vol. 124, Is. 14. - P.1654-1661. - ISSN 0031918X (ISSN), DOI 10.1134/S0031918X23601385. - ISSN 15556190 (eISSN)
Примечания : Cited References: 31. - The research was performed at the Magnetic MAX Materials Laboratory of the Kirensky Institute of Physics SB RAS (created under Megagrant project (agreement no. 075-15-2019-1886) with the financial support of the Russian Science Foundation no. 21-12-00226, http://rscf.ru/project/21-12-00226/
Аннотация: In this paper, we solve the inverse problem of magneto-optical ellipsometry for thin ferromagnetic films with optical uniaxial anisotropy. We work within the framework of the approach we developed earlier analyzing magnetoellipsometric data without using fourth-order M-matrices. We work with ellipsometric relations, in which we take into account the magneto-optical contribution as perturbations, and ellipsometric measurements are carried out on a setup with a simple dipole scheme based on the transverse magneto-optical Kerr effect. We add the magneto-optical response to the expressions known in the literature for the reflection coefficients of anisotropic thin films, which are related to the parameters measured by magneto-optical ellipsometry. As a result, by analyzing the obtained expressions for the reflection coefficients, we obtain information on the total permittivity tensor of a thin film.
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17.

Вид документа : Статья из сборника (однотомник)
Шифр издания :
Автор(ы) : Maximova O. A., Lyashchenko S. A., Yakovlev I. A., Shevtsov D. V., Andryushchenko T. A., Varnakov S. N., Ovchinnikov S. G.
Заглавие : Magneto-optical ellipsometry of thin max films with optical uniaxial anisotropy
Коллективы : Samarkand International Symposium on Magnetism, Samarkand State University
Место публикации : Book of abstacts of Samarkand International Symposium on Magnetism (SISM-2023)/ int. adv. com. S. G. Ovchinnikov [et al.]. - 2023. - Ст.3PO-L5-11. - P.173. - ISBN 978-5-00202-320-2
Примечания : Cited References: 1. - РНФ № 21-12-00226
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18.

Вид документа : Статья из сборника (однотомник)
Шифр издания :
Автор(ы) : Lyashchenko S. A., Maximova O. A., Shevtsov D. V., Yakovlev I. A., Tarasov I. A., Varnakov S. N., Ovchinnikov S. G.
Заглавие : Measurements of the optical and magneto-optical properties of Fe-Si layer structures at different temperatures
Коллективы : Asian School-Conference on Physics and Technology of Nanostructured Materials, Азиатская школа-конференция по физике и технологии наноструктурированных материалов, Институт автоматики и процессов управления ДВО РАН, Дальневосточный федеральный университет
Место публикации : Fourth Asian school-conference on physics and technology of nanostructured materials (ASCO-NANOMAT 2018): proceedings/ progr. com. S. G. Ovchinnikov [et al.]. - 2018. - Ст.III.24.05p. - P.139. - ISBN 978-5-7444-4368-9
Аннотация: The temperature boundaries of phase stability, stability of surface morphology and optical properties of synthesized iron silicides are determined. In the spectral range 1.5ч3.5 eV, the temperature dependences of the optical and magneto-optical properties of Fe, Fe3Si, β-FeSi2 and Fe5Si3 were measured. A significant effect of Fe and Si impurity atoms on the temperature dependences of the optical properties of iron silicides was observed.
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19.

Вид документа : Статья из журнала
Шифр издания :
Автор(ы) : Lyashchenko S. A., Maximova O. A., Shevtsov D. V., Varnakov S. N., Tarasov I. A., Wiedwald U., Rosen J., Ovchinnikov S. G., Farle M.
Заглавие : Optical and magneto-optical properties of epitaxial Mn2GaC MAX phase thin film
Место публикации : J. Magn. Magn. Mater. - 2021. - Vol. 528. - Ст.167803. - ISSN 03048853 (ISSN), DOI 10.1016/j.jmmm.2021.167803
Примечания : Cited References: 39. - The research was supported by the government of the Russian Federation (agreement No. 075-15-2019-1886) and the Deutsche Forschungsgemeinschaft (DFG, German Research Foundation) – Project-ID 405553726 – TRR 270. We thank Andrejs Petruhins for preparation of the samples. J. R. acknowledges funding from the Swedish Research Council (VR), project 642-2013-8020
Аннотация: We report measurements of the dielectric permittivity, optical conductivity and magnetic circular dichroism (MCD) of the epitaxial Mn2GaC MAX-phase thin film in an external magnetic field of up to 200 mT, at temperatures of 296 and 140 K and 1.4 to 3.5 eV. The optical conductivity and MCD spectra show absorption peaks which are consistent with the interband electronic transitions for different positions of Mn, Ga, and C ions as confirmed by theoretical calculations of the spin-dependent density of electronic states. The well-known structural phase transition at 214 K is also seen in the changes of optical, magneto-optical and surface magnetic properties of Mn2GaC in our experiment.
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20.

Вид документа : Статья из сборника (однотомник)
Шифр издания :
Автор(ы) : Lyashchenko S. A., Maximova O. A., Ovchinnikov S. G., Varnakov S. N., Andryushchenko T. A., Shevtsov D. V., Wiedwald U., Farle M.
Заглавие : Optical and magnetooptical spectroscopy of Mn-Cr based MAX-phases
Коллективы : Российская академия наук, Физико-технический институт им. Е.К. Завойского ФИЦ Казанского научного центра РАН, Казанский (Приволжский) федеральный университет, Euro-Asian Symposium "Trends in MAGnetism", "Trends in MAGnetism", Euro-Asian Symposium
Место публикации : VIII Euro-Asian symposium "Trends in magnetism" (EASTMAG-2022): Book of abstracts/ program com. S. G. Ovchinnikov [et al.]. - 2022. - Vol. 2, Sect. O: MAX materials. - Ст.O.P2. - P.484. - ISBN 978-5-94469-051-7
Примечания : Cited References: 4. - The synthesis of (Cr0.5Mn0.5)2GaC samples was supported by the government of the Russian Federation (agreement #075-15-2019-1886). This research was supported by the Russian Science Foundation (grant #21-12-00226, http://rscf.ru/project/21-12-00226/)
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